Agilent Technologies 8935 Series Manual do Utilizador Página 127
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Chapter 6 127
Advanced Operations
Status Reporting
Status Register Structure Overview
The structure of the register groups used in the Test Set is based upon
the status data structures outlined in the IEEE 488 and SCPI 1994.0
Standards. There are two types of status data structures used in the
Test Set: status registers and status queues. The general models,
components, and operation of each type of status data structure are
explained in the following sections.
Figure 6-3 Status Data Structure - Register Model
- - -Test Set States Continuously Monitored - - -
15 14 201
15 14 201
15 14 201
&
Logical
OR
Summary Message
Bit
Event Enable
Register
(Selects which Events
can set the Summary
Message Bit)
Event Register
(Latched Conditions)
Positive Transition
Filter
Negative Transition
Filter
(Positive and Negative
Transition Filters select
which transitions of
Condition Bits will set
corresponding Event Bits.
Condition Register
&
&
&
&
ch4drw3.ds4
- Programmer’s Guide 1
- Contents 3
- Trademark Acknowledgements 10
- Which Document is Required? 10
- Regulatory Information 11
- Instrument 13
- WARNING - RUBIDIUM REFERENCE 16
- ASSEMBLY (E6381A) 16
- Commercial Products 17
- ASSISTANCE 18
- Regional Sales Offices 19
- Using HP-IB 21
- Overview of the Test Set 22
- Manual Control Mode 23
- 24 Chapter 1 24
- Using HP-IB 24
- Chapter 1 25 25
- 26 Chapter 1 26
- Chapter 1 27 27
- 28 Chapter 1 28
- Chapter 1 29 29
- Getting Started 30
- Chapter 1 31 31
- 32 Chapter 1 32
- Chapter 1 33 33
- 34 Chapter 1 34
- Control Annunciators 36
- Chapter 1 37 37
- Controller 38
- Basic Programming Examples 39
- 40 Chapter 1 40
- Remote Operation 42
- Remote Capabilities 43
- Addressing 44
- Capabilities 45
- Remote/Local Modes 48
- Local To Remote Transitions 49
- Remote To Local Transitions 49
- Local Lockout 50
- Clear Lockout/Set Local 50
- Methods For Reading 51
- Measurement Results 51
- Background 52
- Chapter 2 53 53
- 54 Chapter 2 54
- Example 2-2 Time-out Example 55
- Table 2-1 56
- RMB ‘MAV’ Example Program 58
- Example 2-3 MAV Example 59
- Example Program 60
- HP-IB Command Guidelines 63
- 64 Chapter 3 64
- Guidelines for Operation 65
- 74 Chapter 3 74
- 76 Chapter 3 76
- 78 Chapter 3 78
- Example 3-29 Example 79
- 80 Chapter 3 80
- Chapter 3 81 81
- Using the STATe Command 82
- ENTER 714;State_on_off 83
- Sample HP-IB Program 84
- Chapter 3 85 85
- 86 Chapter 3 86
- IEEE 488.2 Common Commands 88
- *RST (Reset) 91
- *TST? (Self-Test Query) 92
- *OPC (Operation Complete) 93
- 94 Chapter 4 94
- 180 SUBEND 94
- Register 95
- Example 4-6 Example 95
- 96 Chapter 4 96
- Chapter 4 97 97
- *WAI (Wait To Complete) 98
- *CLS (Clear Status) 99
- *STB? (Status Byte Query) 100
- *TRG (Trigger) 100
- *PCB (Pass Control Back) 100
- *SAV (Save Instrument State) 101
- Common Command Descriptions 102
- 102 Chapter 4 102
- IEEE Common Commands 102
- Triggering Measurements 103
- 104 Chapter 5 104
- Trigger Modes 106
- Chapter 5 107 107
- Default Trigger Mode 108
- Trigger Commands 109
- Measurement Pacing 111
- 112 Chapter 5 112
- Advanced Operations 113
- Optimizing Measurement Speed 114
- Chapter 6 115 115
- :RFAN:ATT:MODE ’HOLD’ 115
- :AFAN:RANG ’HOLD’ 115
- 116 Chapter 6 116
- :AFAN:GTIM <value> MS 116
- :RFAN:GTIM <value> MS 116
- Program 117
- Status Reporting 121
- 122 Chapter 6 122
- Status Byte Register 123
- Chapter 6 125 125
- 126 Chapter 6 126
- Chapter 6 127 127
- 128 Chapter 6 128
- Chapter 6 129 129
- 130 Chapter 6 130
- Chapter 6 131 131
- 132 Chapter 6 132
- Chapter 6 133 133
- Register bit assignments 134
- Assignments 134
- Chapter 6 137 137
- Output Queue Group 143
- 144 Chapter 6 144
- Enter 714;Output_data 144
- Error Message Queue Group 145
- Chapter 6 147 147
- Bit Assignments 148
- Assignment 164
- HP-IB Service Requests 167
- Chapter 6 169 169
- 172 Chapter 6 172
- SRQ Interrupt 173
- 174 Chapter 6 174
- Chapter 6 175 175
- 176 Chapter 6 176
- Instrument Initialization 177
- Methods of Initialization 178
- Power-On Reset 179
- 180 Chapter 6 180
- Front-panel PRESET Key 181
- Off Print Title field 182
- Chapter 6 183 183
- 184 Chapter 6 184
- Chapter 6 185 185
- Passing Control 186
- Chapter 6 187 187
- 188 Chapter 6 188
- Chapter 6 189 189
- 190 Chapter 6 190
- Pass Control Examples 191
- 192 Chapter 6 192
- PASS CONTROL 714 192
- Example 6-111 Example 193
- Example 6-112 Example 194
- Chapter 6 195 195
- 196 Chapter 6 196
- Memory Cards/Mass Storage 197
- 198 Chapter 7 198
- Default File System 199
- Mass Storage Device Overview 200
- Front Panel 201
- Card Slot 201
- Microprocessor 201
- Built-in IBASIC Controller 206
- Save/Recall Registers 206
- Tests Subsystem 207
- Mass Storage Access 208
- Chapter 7 209 209
- File Naming Recommendations 210
- Test Set File Types 211
- Initializing Media 211
- Using the ROM 212
- Using PC Cards 213
- 214 Chapter 7 214
- Chapter 7 215 215
- The Memory Card Battery 216
- 218 Chapter 7 218
- Copying an Entire Volume 219
- 220 Chapter 7 220
- Using RAM 221
- Initializing RAM 222
- IBASIC Controller 223
- Introduction 224
- The IBASIC Controller Screen 225
- 226 Chapter 8 226
- Chapter 8 227 227
- Program Development 228
- Method 1 229
- Method 3 229
- Serial Ports 230
- 232 Chapter 8 232
- Receive and Transmit Pacing 233
- PC Configuration 234
- Chapter 8 235 235
- Terminal Configuration 240
- Method 2 242
- Connect to HP-IB connector 243
- 244 Chapter 8 244
- Windows NT Operating System 245
- 248 Chapter 8 248
- Example 8-7 Example 249
- 250 Chapter 8 250
- Chapter 8 251 251
- 252 Chapter 8 252
- Processor on a PC 255
- (Least Preferred) 255
- 256 Chapter 8 256
- Chapter 8 257 257
- 258 Chapter 8 258
- Example 8-8 Example 259
- HyperTerminal 260
- Communications Software 261
- 262 Chapter 8 262
- Chapter 8 263 263
- Serial Ports 9 and 10 264
- Chapter 8 265 265
- Serial Port 10 Information 266
- PROGram Subsystem 267
- Test Set PROGram Subsystem 268
- Chapter 8 269 269
- PROGram Subsystem Commands 270
- 274 Chapter 8 274
- PROGram[:SELected]:DELete:ALL 274
- 284 Chapter 8 284
- Using the EXECute Command 287
- 290 Chapter 8 290
- The TESTS Subsystem 292
- Chapter 8 293 293
- TESTS Subsystem Screens 294
- Chapter 8 295 295
- 296 Chapter 8 296
- Error Messages 297
- IBASIC Error Messages 299
- HP-IB Error Messages 299
- Text Only Error Messages 300
- The Message Display 301
- Chapter 9 303 303
- HP-IB Errors 304
- Text Only HP-IB Errors 305
- 306 Chapter 9 306
- 324 Chapter 9 324
- Index 325 325
- 326 Index 326
- Index 327 327
- 328 Index 328
- Index 329 329
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