Agilent Technologies 3070 Manual do Utilizador Página 7

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Specifications
Agilent Medalist i3070 Series 5
Multiplexed
Agilent Medalist i3070 Series 5
Un-multiplexed
Software products
Test development software bundle
(stand alone)
Includes: Express fixturing Multiple board versions
Drive thru Dual-well sharing
Flash programming
Flash ISP PLD ISP
Advanced probe spacing VTEP v2.0 Powered
VTEP
iVTEP
NPM
Cover-Extend Technology
TestJet InterconnectPlus
Boundary Scan Advanced Boundary Scan 1149.6
Polarity check Throughput multiplier
Silicon nails Panel test
Flash70
InterconnectPlus Boundary Scan Advanced Boundary Scan tool suite
Drive-Thru for VTEP v2.0 Test development software for Vectorless Test Extended Performance (VTEP) tool
TestSight Developer CAD translation software for ICT test and fixture development
Flash ISP In-system programming for flash memory devices
ISP suite Combined flash and PLD in-system programming software suite
Silicon nails Test development tools for limited access test coverage
Cover-Extend A hybrid of Boundary Scan and VTEP testing for added test coverage on limited test
access boards
Connect Check Analog testing in a limited access
environment
N/A
Analog capabilities
Shorts and Opens 2 Ω – 1000 Ω ± (0.25% + 2.2 Ω)
Resistors 0.1 Ω to 10 MΩ ± (0.25% to 5% + plus system residual ≤ 3.5 W)
Capacitors 10 pf to 10 mf ± (2% to 6% + *)
* Plus system residual: ± 1 pF with capacitor compensation,
0 to +40 pF typical without capacitor compensation
Inductors 5 μH to 100 H ± (2% to 5%) + plus system residual: 1 μH
Potentiometer Same method as resistors
Diode ± 0 – 19 V ± (1.0% of reading + 4 mV) + plus system residual: ≤ 3.5 mV/mA
Zener ± 0 – 18 V ± (1.0% of reading + 4 mV) + plus system residual: ≤ 3.5 mV/mA8
± 19 – 60 V ± (1.0% of reading + 4 mV) + plus system residual: ≤ 3.5 mV/mA8
Transistor Same method as Diode + DC Beta (10-1000 ± (15.0%))
Depletion FET 5 Ω – 500 Ω ± 1.0% + plus system residual ≤ 3.5 W
Fuse, switch, jumper 0.1 Ω – 500 Ω ± 1.0% + plus system residual ≤ 3.5 W
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