
5
Specifications
Agilent Medalist i3070 Series 5
Multiplexed
Agilent Medalist i3070 Series 5
Un-multiplexed
Maximum channels 1152 5184
Maximum nodes 5184 5184
Pin card HybridPlus double density Un-multiplexed hybrid 144 channel
Driver/receiver mux ratio 9:2 multiplexing 1:1 tester-per-pin
Vector application rate 6.25 MPs, 12.5 MPs, 20 MPs 6.25 MPs
Logic level –3.5 V to 5 V
(per digital channel pin programmable)
0 to 4.75 V
(per-pin programmable)
Logic threshold Dual threshold Single threshold
Slew rate 25 V/µsec to 275 V/µsec
(per digital channel pin programmable)
300 V/µsec
(optimized fixed rise/fall time)
Digital driver/Receiver offset –30 n to +100 n
(per digital channel pin programmable)
Not applicable
Operating system Windows
®
7 Professional
Test generation toolset Board Consultant
Fixture Consultant
Test Consultant
Time-to-money test development
Board/Fixture graphics display Browser
Board Consultant
Fixture consultant
Browser
Circuit analysis Automatic (IPG) with Monte Carlo simulation
Agilent Medalist i3070 Application
Software
Windows graphical user interface (supports localization)
Probe pin locator Interactive probe/pin locator with guided probed
Runtime yield display Real time FPY (First Pass Yield) display at runtime
Probe/fixture maintenance tools Worst probe reporting (reports real time fixture probe number that fails frequently)
Yield enhancement tool IYET (Intelligent Yield Enhancement Tool)
Analog unpowered debug interface Graphical user interface in spread sheet format (supports localization)
Digital/Analog powered debug interface PushButton Debug
AutoDebug AutoDebug on analog unpowered tests, TestJet, VTEP v2.0 (VTEP, iVTEP and NPM) and
Cover-Extend Technology
Modular construction for
flexibility/scalability
(1 to 4) Standard
Dual-well construction for maximum
throughput
Standard
Throughput multiplier Standard
Failure message printer Standard (strip printer)
Vacuum solenoids Built-in standard
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