4
Latest Features on the Series 5 ICT System
Software Enhancement
The Series 5 also includes software
and enhancements listed below, and
retains all the user-friendly features
of the original i3070 system, such as:
• DC test method for large capacitor
testing
When testing large capacitors, it
is possible to specify the current
instead of using the standard
100mV across the capacitor.
• Ease of use
Point-and-click interfaces remove
the user’s need to type in com-
mands during the operation of the
tester
• Board Locator
The Board Locator allows the user
to search for any component on
the board under test as well as
probes and testhead resources.
• AutoOptimizer
Agilent Medalist i3070 tests can
be optimized with the click of a
button, reducing test time by 10 to
50 percent per test.
• AutoDebug
With the click of a button, the sys-
tem can perform a complete analog
test debug in a matter of hours.
AutoDebug fine-tunes tests so
boards pass reliably in production.
Please refer to the Agilent Medalist
i3070 In-Circuit Test System data
sheet 5989-6292EN for detailed
information on the original features
which users can continue to enjoy on
the Series 5.
Figure 3. The Series 5 retains all the easy-to-use interfaces that many users are now
accustomed to on the Medalist i3070 system
Publication title Pub number
Agilent Medalist i3070 ICT Data Sheet
5989-6292EN
Agilent Utility Card Specifications
5990-4411EN
Medalist i3070 In Circuit Test – Utilizing the most
comprehensive Limited Access Solution on In Circuit
Test – A Case Study
5990-3741EN
Agilent Medalist VTEP v2.0 Powered! With Cover-Extend Technology Flyer
5989-8429EN
Overcoming Limited Access with Cover-Extend Technology at In-Circuit
Test Case Study
5990-4218EN
IEEE 1149.6 Standard Boundary Scan Testing on Agilent Medalist i3070 In
Circuit Systems White Paper
5990-3232EN
Agilent Medalist Bead Probe Technology Product Overview
5989-5802EN
Comparing Contact Performance on PCBA using Conventional Testpads and
Bead Probes White Paper
5989-9918EN
Using Bead Probes to Increase Test Access Case Study
5989-8420EN
Related literature can be located on Agilent’s Medalist In-Circuit Test Solutions web site at: www.
agilent.com/find/ict under the “Library” tab.
Related Agilent Literature
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