Agilent Technologies 3070 Manual do Utilizador descarregar pdf (Página 2)

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Latest Features on the Series 5 ICT System

New Analog Measurement Card

The new Analog Stimulus and

Response Unit (ASRU) includes

1. BT-Basic DLL Integration

This feature allows users to call

any external DLL function by pass-

ing the parameters and receiving

the results within the BT-Basic

environment. Examples of DLL

functions include flash program-

ming, updating of databases and

functional tests.

2. Agilent Medalist i3070 LED Test*

Medalist i3070 LED Test is an

industry-first digital LED test,

integrated into ICT, to inspect the

color and intensity of LEDs in the

visible light spectrum (400-660

nm). It provides fast, reliable, and

accurate inspection of LEDs for

color (wavelength) and luminosity

(intensity).

3. Two channels of high current capa-

bilities of up to 10 A per channel

The DUT power supply channels

3 and 4 on the ASRU card have

their current capabilities increased

from 4 A to 10 A per channel. This

allows the channels to carry 10A

currents into the board for high

current application testing, such as

power supplies.

4. Power Monitoring Circuit

The Power Monitoring Circuit

(PMC) is a new safety feature.

It not only provides real time

monitoring but also helps users to

distinguish between a power sup-

ply failure or a digital test failure

in the event of a failed digital test.

This feature also tries to prevent

the back-drive current that can

cause damage to ICs.

5. Fixture power supply

This powering capability is

intended for fixture electronics and

other external powering purposes.

It is controlled by the user with

BT-BASIC commands for enabling

and disabling.

Figure 1. The new analog stimulus and response unit card in the Medalist i3070 Series 5

offers users many new features and faster analog tests

6. 60 V zener testing capabilities

In today’s boards, because of

their higher voltage power supply

requirements, larger zener diodes

are required. With the new ASRU

card, a maximum of 60 V zeners

can be tested instead of up to 18 V.

7. Digitized Measurement Circuit

(DMC) with new frequency options

The purpose of this circuit is to

speed up the analog testing by

using multiple ports on a microcon-

troller to digitize, at one time, the

multiple readings taken during a

test. The microcontroller ports can

be assigned to the stimulus and

response busses as well as the

sense busses, so that all four read-

ings on a 4-wire measurement can

be taken at one time. This Digitized

Measurement Circuit comes with

two new frequency options: fr100k

and fr200k. These frequencies are

added to the AC testing methods

for passive components like

capacitors and inductors for better

isolation of smaller components

during test.

This new measurement circuit is

different and separate from the

analog measurement circuit using

Measurement Op-Amplifier (MOA).

Tests generated for the MOA will

have to be re-debugged if tested

with the DMC because the internal

circuit characteristics are different

from the MOA. The stability and

reliability of the measurement

after the test has been debugged

remains the same as when mea-

sured with the MOA circuit.

* (Appropriate hardware is needed)

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