Agilent Technologies 8753ES Guia do Utilizador Página 1

User’s GuideAgilent Technologies8753ET and 8753ESNetwork AnalyzersPart Number 08753-90472Printed in USAJune 2002Supersedes February 2001© Copyright 19

Contents-x ContentsIncrease the Test Port Input Power . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5-14Reduce

1-86 Making MeasurementsUsing Ripple Limits to Test a DeviceFigure 1-67 Connections for an Example Ripple Test Measurement2. Press and choose the

1-87Making MeasurementsUsing Ripple Limits to Test a DeviceFigure 1-68 Filter Pass Band Before Ripple TestSetting Up Limits for Ripple Testing This s

1-88 Making MeasurementsUsing Ripple Limits to Test a Device1. To access the ripple test menu, press: 2. To access the ripple test edit menu, press

1-89Making MeasurementsUsing Ripple Limits to Test a Device3. Make the changes to the selected band by pressing:a. and the new value to change the lo

1-90 Making MeasurementsUsing Ripple Limits to Test a DeviceDeleting Existing Frequency BandsFrequency band limits may be deleted for testing the rip

1-91Making MeasurementsUsing Ripple Limits to Test a DeviceFigure 1-69 Filter Passband with Ripple Test ActivatedAs the analyzer measures the ripple,

1-92 Making MeasurementsUsing Ripple Limits to Test a Deviceripple value above the lower ripple limit. The ripple that exceeds the maximum ripple val

1-93Making MeasurementsUsing Ripple Limits to Test a DeviceWhen the Absolute and Margin choices are selected, the frequency band and measurement value

1-94 Making MeasurementsUsing Ripple Limits to Test a DeviceViewing the Ripple Value in Margin FormatWhen is selected, the margin by which the ripp

1-95Making MeasurementsUsing Bandwidth Limits to Test a Bandpass FilterUsing Bandwidth Limits to Test a Bandpass FilterThe bandwidth testing mode can

Contents Contents-xiMinimizing Error When Using Adapters . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .6-47Making No

1-96 Making MeasurementsUsing Bandwidth Limits to Test a Bandpass FilterFigure 1-74 Connections for a Bandpass Filter Example Measurement2. Press

1-97Making MeasurementsUsing Bandwidth Limits to Test a Bandpass Filter3. Substitute a thru for the device and perform a response calibration by press

1-98 Making MeasurementsUsing Bandwidth Limits to Test a Bandpass FilterThe test displays a message in the upper left corner of the graticule showing

1-99Making MeasurementsUsing Bandwidth Limits to Test a Bandpass FilterFigure 1-77 Bandwidth Markers Placed 40 dB Below the Bandpass PeakDisplaying t

1-100 Making MeasurementsUsing Bandwidth Limits to Test a Bandpass FilterFigure 1-78 Filter Pass Band with Bandwidth Value Displayed

1-101Making MeasurementsUsing Test SequencingUsing Test SequencingTest sequencing allows you to automate repetitive tasks. As you make a measurement,

1-102 Making MeasurementsUsing Test SequencingFigure 1-79 Test Sequencing Help Instructions 2. To select a sequence position in which to store your

1-103Making MeasurementsUsing Test SequencingThe previous keystrokes will create a displayed list as shown:Start of SequenceRECALL PRST STATETrans: FW

1-104 Making MeasurementsUsing Test Sequencing• If you wish to scroll through the sequence without executing each line as you do so, you can press th

1-105Making MeasurementsUsing Test SequencingStart of SequenceRECALL PRST STATETrans: FWD S21 (B/R)LOG MAGCENTER 134 M/uSPAN 50 M/uSCALE/DIVAUTO

Contents-xii ContentsCW Time Sweep (Seconds) . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7-20S

1-106 Making MeasurementsUsing Test Sequencing• If you do not have an attached DIN keyboard, press and turn the front panel knob to point to the ch

1-107Making MeasurementsUsing Test SequencingCAUTION Do not mistake the line switch for the disk eject button.Loading a Sequence from Disk For this pr

1-108 Making MeasurementsUsing Test SequencingIn-Depth Sequencing Information Features That Operate Differently When Executed in a Sequence The analy

1-109Making MeasurementsUsing Test SequencingSequence Size A sequence may contain up to 2 kbytes of instructions. Typically, this is around 200 sequen

1-110 Making MeasurementsUsing Test SequencingThe GPIO Mode The instrument’s parallel port can be used in two different modes. By pressing and then

1-111Making MeasurementsUsing Test SequencingTTL Input Decision Making Five TTL compatible input lines can be used for decision making in test seque

1-112 Making MeasurementsUsing Test SequencingTest Set Interconnect Control Figure 1-81 Test Set Interconnect Pin Designations Control of the exter

1-113Making MeasurementsUsing Test SequencingTable 1-6 Test Set Interconnect Pin DesignationPin Number Pin DescriptionPin 1 No Connection (NC)Pin 2Sw

1-114 Making MeasurementsUsing Test SequencingTTL Out Menu The softkey provides access to the TTL out menu. This menu allows you to choose betwee

1-115Making MeasurementsUsing Test SequencingLoop counter decision making The analyzer has a numeric register called a loop counter. The value of th

Contents Contents-xiiiGPIB STATUS Indicators . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .7-80

1-116 Making MeasurementsUsing Test Sequencing to Test a DeviceUsing Test Sequencing to Test a DeviceTest sequencing allows you to automate repetitiv

1-117Making MeasurementsUsing Test Sequencing to Test a Device 50 M/uDO SEQUENCESEQUENCE 2SEQUENCE SEQ2Start of SequenceTrans:FWD S21 (B/R)LOG MAGSCA

1-118 Making MeasurementsUsing Test Sequencing to Test a Device This will create a displayed list as shown:SEQUENCE LOOP 2Start of SequenceTrans

1-119Making MeasurementsUsing Test Sequencing to Test a Device This will create the following displayed lists:Start of Sequence LOOP COUN

1-120 Making MeasurementsUsing Test Sequencing to Test a DeviceTo run the sequence, press: Limit Test Example Sequence This measurement example shows

1-121Making MeasurementsUsing Test Sequencing to Test a DeviceONFILENAMEFILE 0SAVE FILE3. To create a sequence that prompts you to tune a device that

1-122 Making MeasurementsSingle Connection Multiple Measurement Configuration (Option 014 Only)Single Connection Multiple Measurement Configuration(O

1-123Making MeasurementsSingle Connection Multiple Measurement Configuration (Option 014 Only)Sequencing Program: The test set I/O may be set using th

1-124 Making MeasurementsSingle Connection Multiple Measurement Configuration (Option 014 Only)GPIB Commands TSTIOFWD7; TSTIOFWD6; TSTIOREV7; TSTIORE

2-12 Making Mixer Measurements

Contents-xiv Contents

2-2 Making Mixer MeasurementsUsing This ChapterUsing This ChapterThis chapter contains the following:• Information on mixer measurement capabilities.

2-3Making Mixer MeasurementsMixer Measurement CapabilitiesMixer Measurement CapabilitiesThe analyzer is capable of measuring the following mixer (freq

2-4 Making Mixer MeasurementsMeasurement ConsiderationsMeasurement Considerations In mixer transmission measurements, you have RF and LO inputs and a

2-5Making Mixer MeasurementsMeasurement ConsiderationsFigure 2-2 Conversion Loss versus Output Frequency without Attenuators at Mixer Ports Figure 2-

2-6 Making Mixer MeasurementsMeasurement ConsiderationsEliminating Unwanted Mixing and Leakage Signals By placing filters between the mixer’s IF port

2-7Making Mixer MeasurementsMeasurement ConsiderationsFigure 2-5 Example of Conversion Loss versus Output Frequency with Correct IF Signal Path Filte

2-8 Making Mixer MeasurementsMeasurement ConsiderationsFigure 2-6 Examples of Up Converters and Down Converters In standard mixer measurements, the

2-9Making Mixer MeasurementsMeasurement ConsiderationsFigure 2-7 Down Converter Port Connections• In an up converter measurement where the softkey

2-10 Making Mixer MeasurementsMeasurement ConsiderationsFrequency Offset Mode Operation This mode of operation allows you to offset the analyzer’s so

2-11Making Mixer MeasurementsMeasurement ConsiderationsThe following steps can be performed to observe this offset in power:1. To set the power range

1-11 Making Measurements

2-12 Making Mixer MeasurementsMeasurement Considerations5. You cannot trust R channel power settings without knowing about the offset involved. Perfo

2-13Making Mixer MeasurementsConversion Loss Using the Frequency Offset ModeConversion Loss Using the Frequency Offset Mode Conversion loss is the mea

2-14 Making Mixer MeasurementsConversion Loss Using the Frequency Offset ModeSetting Measurement Parameters for the Power Meter Calibration1. Connect

2-15Making Mixer MeasurementsConversion Loss Using the Frequency Offset ModePerforming a Power Meter (Source) Calibration Over the RF Range1. Calibrat

2-16 Making Mixer MeasurementsConversion Loss Using the Frequency Offset Mode5. To perform a one sweep power meter calibration over the RF frequency

2-17Making Mixer MeasurementsConversion Loss Using the Frequency Offset ModeSetting the Analyzer to Make an R Channel Measurement1. Connect the equipm

2-18 Making Mixer MeasurementsConversion Loss Using the Frequency Offset Mode4. Turn on frequency offset operation by pressing .Notice in this high-

2-19Making Mixer MeasurementsConversion Loss Using the Frequency Offset Mode5. To view the conversion loss in the best vertical resolution, press .F

2-20 Making Mixer MeasurementsHigh Dynamic Range Swept RF/IF Conversion LossHigh Dynamic Range Swept RF/IF Conversion Loss The frequency offset mode

2-21Making Mixer MeasurementsHigh Dynamic Range Swept RF/IF Conversion LossFigure 2-16 Connections for Power Meter Calibration3. Select the analyzer

1-2 Making MeasurementsUsing This ChapterUsing This ChapterThis chapter contains the following example procedures for making measurements. Mixer and

2-22 Making Mixer MeasurementsHigh Dynamic Range Swept RF/IF Conversion LossNOTE Because power meter calibration requires a longer sweep time, you ma

2-23Making Mixer MeasurementsHigh Dynamic Range Swept RF/IF Conversion LossUsing the Mixer Measurement DiagramWhile the analyzer is still set to the I

2-24 Making Mixer MeasurementsHigh Dynamic Range Swept RF/IF Conversion Loss3. Set the LO source to the desired CW frequency of 1500 MHz and power le

2-25Making Mixer MeasurementsHigh Dynamic Range Swept RF/IF Conversion Loss4. Set the analyzers LO frequency to match the frequency of the LO source

2-26 Making Mixer MeasurementsFixed IF Mixer MeasurementsFixed IF Mixer Measurements A fixed IF can be produced by using both a swept RF and LO that

2-27Making Mixer MeasurementsFixed IF Mixer MeasurementsNOTE You may have to consult the user’s guide of the external source being used to determine h

2-28 Making Mixer MeasurementsFixed IF Mixer MeasurementsPutting the Analyzer into Tuned Receiver Mode Setting Up a Frequency List Sweep of 26 Poin

2-29Making Mixer MeasurementsFixed IF Mixer MeasurementsInitializing a Loop Counter Value to 26 Addressing and Configuring the Two Sources

2-30 Making Mixer MeasurementsFixed IF Mixer MeasurementsTUNED RECEIVEREDIT LISTADDCW FREQ100M/uNUMBER OF POINTS26x1DONEDONELIST FREQBTITLEPOW:LEV 6D

2-31Making Mixer MeasurementsFixed IF Mixer MeasurementsSequence 2 Setup The following sequence makes a series of measurements until all 26 CW measure

1-3Making MeasurementsMore Instrument Functions Not Described in This GuideMore Instrument Functions Not Described in This GuideTo learn about instrum

2-32 Making Mixer MeasurementsFixed IF Mixer MeasurementsPress and the analyzer will display the following sequence commands:SEQUENCE SEQ2Start

2-33Making Mixer MeasurementsFixed IF Mixer MeasurementsWhen the sequences are finished you should have a result as shown in Figure 2-23.Figure 2-23

2-34 Making Mixer MeasurementsPhase or Group Delay MeasurementsPhase or Group Delay Measurements For information on group delay principles, refer to

2-35Making Mixer MeasurementsPhase or Group Delay Measurements1. Set the LO source to the desired CW frequency of 1000 MHz and power level to 13 dBm.2

2-36 Making Mixer MeasurementsPhase or Group Delay MeasurementsFigure 2-24 Connections for a Group Delay Measurement6. To select the converter type

2-37Making Mixer MeasurementsPhase or Group Delay Measurements10.Replace the "calibration" mixer with the device under test. If measuring gr

2-38 Making Mixer MeasurementsAmplitude and Phase TrackingAmplitude and Phase Tracking The match between mixers is defined as the absolute difference

2-39Making Mixer MeasurementsConversion Compression Using the Frequency Offset ModeConversion Compression Using the Frequency Offset Mode Conversion c

2-40 Making Mixer MeasurementsConversion Compression Using the Frequency Offset Mode5. Make the connections, as shown in Figure 2-28.CAUTION To preve

2-41Making Mixer MeasurementsConversion Compression Using the Frequency Offset ModeFigure 2-29 Connections for the Second Portion of Conversion Compr

1-4 Making MeasurementsMaking a Basic MeasurementMaking a Basic MeasurementThere are five basic steps when you are making a measurement.1. Connect th

2-42 Making Mixer MeasurementsConversion Compression Using the Frequency Offset ModeThe measurements setup diagram is shown in Figure 2-30.Figure 2-3

2-43Making Mixer MeasurementsConversion Compression Using the Frequency Offset ModeFigure 2-31 Example Swept Power Conversion Compression Measurement

2-44 Making Mixer MeasurementsIsolation Example MeasurementsIsolation Example Measurements Isolation is the measure of signal leakage in a mixer. Fee

2-45Making Mixer MeasurementsIsolation Example MeasurementsFigure 2-33 Connections for a Response Calibration5. Perform a response calibration by pre

2-46 Making Mixer MeasurementsIsolation Example MeasurementsFigure 2-35 Example Mixer LO to RF Isolation Measurement RF Feedthrough The procedure an

2-47Making Mixer MeasurementsIsolation Example Measurements5. Make the connections as shown in Figure 2-36.Figure 2-36 Connections for a Response Cal

2-48 Making Mixer MeasurementsIsolation Example MeasurementsFigure 2-38 Example Mixer RF Feedthrough Measurement You can measure the IF to RF isolat

2-49Making Mixer MeasurementsIsolation Example MeasurementsSWR / Return Loss Reflection coefficient (Γ) is defined as the ratio between the reflected

2-50 Making Mixer MeasurementsIsolation Example Measurements

3-13 Making Time Domain Measurements

1-5Making MeasurementsMaking a Basic MeasurementSetting the Frequency Range To set the center frequency to 134 MHz, press: To set the span to 30 MHz,

3-2 Making Time Domain MeasurementsUsing This ChapterUsing This ChapterThis chapter contains the following:• An introduction to time domain measureme

3-3Making Time Domain MeasurementsIntroduction to Time Domain MeasurementsIntroduction to Time Domain MeasurementsThe analyzers with Option 010 allow

3-4 Making Time Domain MeasurementsIntroduction to Time Domain MeasurementsFigure 3-1 Device Frequency Domain and Time Domain Reflection Responses Th

3-5Making Time Domain MeasurementsMaking Transmission Response MeasurementsMaking Transmission Response Measurements In this example measurement there

3-6 Making Time Domain MeasurementsMaking Transmission Response Measurements5. To transform the data from the frequency domain to the time domain and

3-7Making Time Domain MeasurementsMaking Transmission Response Measurements11.To activate the gating function to remove any unwanted responses, press:

3-8 Making Time Domain MeasurementsMaking Transmission Response MeasurementsFigure 3-5 Gate Shape • To see the effect of the gating in the frequency

3-9Making Time Domain MeasurementsMaking Reflection Response MeasurementsMaking Reflection Response MeasurementsThe time domain response of a reflecti

3-10 Making Time Domain MeasurementsMaking Reflection Response MeasurementsFigure 3-8 Device Response in the Frequency Domain 5. To transform the dat

3-11Making Time Domain MeasurementsMaking Reflection Response Measurements8. To position the marker on the reflection of interest, press: and turn the

ii NoticeThe information contained in this document is subject to change without notice.Agilent Technologies makes no warranty of any kind with rega

1-6 Making MeasurementsMaking a Basic MeasurementStep 5. Output the measurement results. To create a printed copy of the measurement results, press:

3-12 Making Time Domain MeasurementsTime Domain Bandpass ModeTime Domain Bandpass ModeThis mode is called bandpass because it works with band-limited

3-13Making Time Domain MeasurementsTime Domain Bandpass ModeFigure 3-10 A Reflection Measurement of Two Cables The ripples in reflection coefficient

3-14 Making Time Domain MeasurementsTime Domain Bandpass ModeTransmission Measurements Using Bandpass Mode The bandpass mode can also transform trans

3-15Making Time Domain MeasurementsTime Domain Low Pass ModeTime Domain Low Pass ModeThis mode is used to simulate a traditional time domain reflectom

3-16 Making Time Domain MeasurementsTime Domain Low Pass ModeMinimum Allowable Stop Frequencies The lowest analyzer measurement frequency is 30 kHz (

3-17Making Time Domain MeasurementsTime Domain Low Pass ModeInterpreting the Low Pass Response Vertical Axis The vertical axis depends on the chosen f

3-18 Making Time Domain MeasurementsTime Domain Low Pass ModeFault Location Measurements Using Low Pass As described, the low pass mode can simulate

3-19Making Time Domain MeasurementsTime Domain Low Pass ModeFigure 3-14 Low Pass Step Measurements of Common Cable Faults (Real Format) Transmission

3-20 Making Time Domain MeasurementsTime Domain Low Pass ModeFigure 3-15 Time Domain Low Pass Measurement of an Amplifier Small Signal Transient Res

3-21Making Time Domain MeasurementsTime Domain Low Pass ModeFigure 3-16 Transmission Measurements Using Low Pass Impulse Mode

1-7Making MeasurementsMeasuring Magnitude and Insertion Phase ResponseMeasuring Magnitude and Insertion Phase Response This measurement example shows

3-22 Making Time Domain MeasurementsTransforming CW Time Measurements into the Frequency DomainTransforming CW Time Measurements into the Frequency D

3-23Making Time Domain MeasurementsTransforming CW Time Measurements into the Frequency DomainInterpreting the Forward Transform Horizontal Axis In a

3-24 Making Time Domain MeasurementsTransforming CW Time Measurements into the Frequency DomainFigure 3-19 Separating the Amplitude and Phase Compon

3-25Making Time Domain MeasurementsTransforming CW Time Measurements into the Frequency DomainFigure 3-20 Range of a Forward Transform Measurement To

3-26 Making Time Domain MeasurementsMaskingMasking Masking occurs when a discontinuity (fault) closest to the reference plane affects the response of

3-27Making Time Domain MeasurementsWindowingWindowing The analyzer provides a windowing feature that makes time domain measurements more useful for is

3-28 Making Time Domain MeasurementsWindowingChoose one of the three window shapes listed or use the knob to select any windowing pulse width (or ris

3-29Making Time Domain MeasurementsWindowingFigure 3-23 The Effects of Windowing on the Time Domain Responses of a Short Circuit (Real Format)

3-30 Making Time Domain MeasurementsRangeRange In the time domain, range is defined as the length in time that a measurement can be made without enco

3-31Making Time Domain MeasurementsRangeIn this example, the range is 100 ns, or 30 meters electrical length. To prevent the time domain responses fro

1-8 Making MeasurementsMeasuring Magnitude and Insertion Phase ResponseIf the channels are coupled (the default condition), this calibration is valid

3-32 Making Time Domain MeasurementsResolutionResolution Two different resolution terms are used in the time domain:• response resolution• range reso

3-33Making Time Domain MeasurementsResolutionFor example, a cable with a teflon dielectric (0.7 relative velocity factor), measured under the conditio

3-34 Making Time Domain MeasurementsResolutionRange Resolution Time domain range resolution is defined as the ability to locate a single response in

3-35Making Time Domain MeasurementsGatingGating Gating provides the flexibility of selectively removing time domain responses. The remaining time doma

3-36 Making Time Domain MeasurementsGatingFigure 3-27 Gate Shape Selecting Gate Shape The four gate shapes available are listed in Table 3-4. Each ga

4-14 Printing, Plotting, and SavingMeasurement Results

4-2 Printing, Plotting, and Saving Measurement ResultsUsing This ChapterUsing This ChapterThis chapter contains instructions for the following tasks:

4-3Printing, Plotting, and Saving Measurement ResultsPrinting or Plotting Your Measurement ResultsPrinting or Plotting Your Measurement Results You ca

4-4 Printing, Plotting, and Saving Measurement ResultsConfiguring a Print FunctionConfiguring a Print Function All copy configuration settings are st

4-5Printing, Plotting, and Saving Measurement ResultsConfiguring a Print Function3. Select one of the following printer interfaces:• Choose if your

1-9Making MeasurementsMeasuring Magnitude and Insertion Phase ResponseFigure 1-4 Example Insertion Phase Response Measurement The phase response show

4-6 Printing, Plotting, and Saving Measurement ResultsDefining a Print FunctionDefining a Print Function NOTE The print definition is set to default

4-7Printing, Plotting, and Saving Measurement ResultsPrinting One Measurement Per PageTo Reset the Printing Parameters to Default Values 1. Press .

4-8 Printing, Plotting, and Saving Measurement ResultsPrinting Multiple Measurements Per PagePrinting Multiple Measurements Per Page 1. Configure and

4-9Printing, Plotting, and Saving Measurement ResultsConfiguring a Plot FunctionConfiguring a Plot Function All copy configuration settings are stored

4-10 Printing, Plotting, and Saving Measurement ResultsConfiguring a Plot Function• Choose if your printer has a parallel (Centronics) interface, a

4-11Printing, Plotting, and Saving Measurement ResultsConfiguring a Plot Function• Choose if your plotter has a parallel (Centronics) interface, and

4-12 Printing, Plotting, and Saving Measurement ResultsConfiguring a Plot Function• Choose if you will plot to a disk drive that is external to the

4-13Printing, Plotting, and Saving Measurement ResultsDefining a Plot FunctionDefining a Plot Function 1. Press .Choosing Display Elements • Choose w

4-14 Printing, Plotting, and Saving Measurement ResultsDefining a Plot FunctionNOTE The peripheral ignores when you are plotting to a quadrant.Sele

4-15Printing, Plotting, and Saving Measurement ResultsDefining a Plot FunctionSelecting Line Types • Press and select each plot element line type th

1-10 Making MeasurementsUsing Display FunctionsUsing Display FunctionsThis section provides the necessary information for using the display functions

4-16 Printing, Plotting, and Saving Measurement ResultsDefining a Plot FunctionFigure 4-7 Locations of P1 and P2 in Mode Choosing Plot Speed • Pre

4-17Printing, Plotting, and Saving Measurement ResultsPlotting One Measurement Per Page Using a Pen PlotterPlotting One Measurement Per Page Using a P

4-18 Printing, Plotting, and Saving Measurement ResultsPlotting Multiple Measurements Per Page Using a Pen PlotterPlotting Multiple Measurements Per

4-19Printing, Plotting, and Saving Measurement ResultsPlotting Multiple Measurements Per Page Using a Pen PlotterIf You Are Plotting to an HPGL Compat

4-20 Printing, Plotting, and Saving Measurement ResultsTo View Plot Files on a PCTo View Plot Files on a PC Plot files can be viewed and manipulated

4-21Printing, Plotting, and Saving Measurement ResultsTo View Plot Files on a PCUsing Ami Pro To view plot files in Ami Pro, perform the following ste

4-22 Printing, Plotting, and Saving Measurement ResultsOutputting Plot Files from a PC to a PlotterConverting HPGL Files for Use with Other PC Applic

4-23Printing, Plotting, and Saving Measurement ResultsOutputting Plot Files from a PC to an HPGL Compatible PrinterOutputting Plot Files from a PC to

4-24 Printing, Plotting, and Saving Measurement ResultsOutputting Single Page Plots Using a PrinterStep 2. Store the exit HPGL mode and form feed seq

4-25Printing, Plotting, and Saving Measurement ResultsOutputting Multiple Plots to a Single Page Using a PrinterOutputting Multiple Plots to a Single

1-11Making MeasurementsUsing Display FunctionsTitling the Active Channel Display 1. Press to access the title menu.2. Press and enter the titl

4-26 Printing, Plotting, and Saving Measurement ResultsPlotting Multiple Measurements Per Page from DiskPlotting Multiple Measurements Per Page from

4-27Printing, Plotting, and Saving Measurement ResultsPlotting Multiple Measurements Per Page from DiskTo Plot Multiple Measurements on a Full Page Yo

4-28 Printing, Plotting, and Saving Measurement ResultsPlotting Multiple Measurements Per Page from DiskFigure 4-10 shows plots for both the frequenc

4-29Printing, Plotting, and Saving Measurement ResultsPlotting Multiple Measurements Per Page from Disk4. Press . The analyzer assigns the first avai

4-30 Printing, Plotting, and Saving Measurement ResultsTitling the Displayed MeasurementTitling the Displayed Measurement1. Press to access the

4-31Printing, Plotting, and Saving Measurement ResultsConfiguring the Analyzer to Produce a Time StampConfiguring the Analyzer to Produce a Time Stamp

4-32 Printing, Plotting, and Saving Measurement ResultsPrinting or Plotting the List Values or Operating ParametersPrinting or Plotting the List Valu

4-33Printing, Plotting, and Saving Measurement ResultsSolving Problems with Printing or PlottingSolving Problems with Printing or Plotting If you enco

4-34 Printing, Plotting, and Saving Measurement ResultsSaving and Recalling Instrument StatesSaving and Recalling Instrument States Places Where You

4-35Printing, Plotting, and Saving Measurement ResultsSaving and Recalling Instrument StatesWhat You Can Save to a Floppy Disk You can save an instrum

1-12 Making MeasurementsUsing Display FunctionsViewing Both Primary Measurement Channels In some cases, you may want to view more than one measured p

4-36 Printing, Plotting, and Saving Measurement ResultsSaving an Instrument StateSaving an Instrument State 1. Press and select one of the storag

4-37Printing, Plotting, and Saving Measurement ResultsSaving Measurement ResultsSaving Measurement Results Instrument states combined with measurement

4-38 Printing, Plotting, and Saving Measurement ResultsSaving Measurement ResultsFigure 4-13 Data Processing Flow Diagram NOTE If the analyzer has a

4-39Printing, Plotting, and Saving Measurement ResultsSaving Measurement ResultsIf you select , , or , the data is stored to disk in IEEE-64 bit re

4-40 Printing, Plotting, and Saving Measurement ResultsSaving Measurement ResultsIf , or , or is selected, a CITIfile is saved for each displayed

4-41Printing, Plotting, and Saving Measurement ResultsSaving Measurement ResultsThe "format" choice is selected by the current selection und

4-42 Printing, Plotting, and Saving Measurement ResultsSaving Measurement ResultsSaving in Textual (CSV) FormTextual measurement results can be saved

4-43Printing, Plotting, and Saving Measurement ResultsSaving Measurement ResultsHow the Analyzer Names These Files SequentiallyWhen text files are sav

4-44 Printing, Plotting, and Saving Measurement ResultsSaving Measurement ResultsSaving in Graphical (JPEG) FormGraphical measurement results can be

4-45Printing, Plotting, and Saving Measurement ResultsSaving Measurement Results• FileXX.i is a binary file, which contains the generic portion of th

1-13Making MeasurementsUsing Display FunctionsFigure 1-8 Example Dual Channel with Split Display On 3. To return to a single-graticule display, press

4-46 Printing, Plotting, and Saving Measurement ResultsSaving Measurement ResultsFiles with .s1 and .s2 File ExtensionsThere are two type of files wi

4-47Printing, Plotting, and Saving Measurement ResultsSaving Measurement ResultsViewing Files Within the AnalyzerAll these files are rolled up into a

4-48 Printing, Plotting, and Saving Measurement ResultsSaving Measurement ResultsData ArraysPress . Data created the first time in this manner will

4-49Printing, Plotting, and Saving Measurement ResultsRe-Saving an Instrument StateRe-Saving an Instrument State If you re-save a file, the analyzer o

4-50 Printing, Plotting, and Saving Measurement ResultsRenaming a FileRenaming a File 1. Press .2. Choose from the following storage devices:❏❏❏ (I

4-51Printing, Plotting, and Saving Measurement ResultsFormatting a DiskFormatting a Disk 1. Press .2. Choose the type of format you want:❏❏3. Press

4-52 Printing, Plotting, and Saving Measurement ResultsFormatting a Disk

5-15 Optimizing Measurement Results

5-2 Optimizing Measurement ResultsUsing This ChapterUsing This ChapterThis chapter describes techniques and analyzer functions that help you achieve

5-3Optimizing Measurement ResultsTaking Care of Microwave ConnectorsTaking Care of Microwave ConnectorsProper connector care and connection techniques

1-14 Making MeasurementsUsing Display FunctionsDual Channel Mode with Decoupled Channel Power By decoupling the channel power or port power and using

5-4 Optimizing Measurement ResultsIncreasing Measurement AccuracyIncreasing Measurement Accuracy The following all contribute to loss of accuracy in

5-5Optimizing Measurement ResultsIncreasing Measurement AccuracyTemperature Drift Electrical characteristics will change with temperature due to the t

5-6 Optimizing Measurement ResultsIncreasing Measurement AccuracyYou can activate a port extension by pressing . Then enter the delay to the re

5-7Optimizing Measurement ResultsMaking Accurate Measurements of Electrically Long DevicesMaking Accurate Measurements of Electrically Long Devices A

5-8 Optimizing Measurement ResultsMaking Accurate Measurements of Electrically Long DevicesDecreasing the Sweep Rate The sweep rate can be decreased

5-9Optimizing Measurement ResultsIncreasing Sweep SpeedIncreasing Sweep SpeedYou can increase the analyzer sweep speed by avoiding the use of some fea

5-10 Optimizing Measurement ResultsIncreasing Sweep SpeedSweep Speed-Related Errors IF delay occurs during swept measurements when the signal from th

5-11Optimizing Measurement ResultsIncreasing Sweep SpeedTo Set the Auto Sweep Time Mode Auto sweep time mode is the default mode (the preset mode). Th

5-12 Optimizing Measurement ResultsIncreasing Sweep SpeedTo View a Single Measurement Channel Viewing a single channel will increase the measurement

5-13Optimizing Measurement ResultsIncreasing Sweep Speed• Continuous: In this mode the analyzer will switch between the test ports on every sweep. Alt

1-15Making MeasurementsUsing Display FunctionsFigure 1-9 Three-Channel Display4. Press Chan 4 (or press , set to ON).This enables channel 4 and th

5-14 Optimizing Measurement ResultsIncreasing Dynamic RangeIncreasing Dynamic Range Dynamic range is the difference between the analyzer’s maximum al

5-15Optimizing Measurement ResultsReducing NoiseReducing Noise You can use two analyzer functions to help reduce the effect of noise on the data trace

5-16 Optimizing Measurement ResultsReducing NoiseTo Use Direct Sampler Access Configurations (Option 014 Only)Direct sampler access to both the A and

5-17Optimizing Measurement ResultsReducing NoiseNoise Floor Plot Figure 5-2 shows the noise floor with the B sampler and PORT 2 SWITCH/ COUPLER port j

5-18 Optimizing Measurement ResultsReducing Receiver CrosstalkReducing Receiver Crosstalk To reduce receiver crosstalk you can do the following:• Per

6-16 Calibrating for IncreasedMeasurement Accuracy

6-2Calibrating for Increased Measurement AccuracyHow to Use This ChapterHow to Use This ChapterThis chapter is divided into the following subjects:• &

6-3Calibrating for Increased Measurement AccuracyIntroductionIntroductionThe accuracy of network analysis is greatly influenced by factors external to

6-4Calibrating for Increased Measurement AccuracyCalibration ConsiderationsCalibration Considerations Measurement Parameters Calibration procedures ar

6-5Calibrating for Increased Measurement AccuracyCalibration Considerations• 90 to 100 dB: Isolation calibration is recommended with test port power g

iiiSafety Notes The following safety notes are used throughout this manual. Familiarize yourself with each of the notes and its meaning before opera

1-16 Making MeasurementsUsing Display FunctionsFigure 1-10 Four-Channel Display5. Press .Observe that the amber LED adjacent to the key is lit and

6-6Calibrating for Increased Measurement AccuracyCalibration ConsiderationsFrequency Response of Calibration Standards In order for the response of a

6-7Calibrating for Increased Measurement AccuracyCalibration ConsiderationsFringe Capacitance All open circuit terminations exhibit a phase shift over

6-8Calibrating for Increased Measurement AccuracyCalibration ConsiderationsFigure 6-1 Typical Responses of Calibration Standards after Calibration In

6-9Calibrating for Increased Measurement AccuracyCalibration ConsiderationsNOTE The preset state of the instrument can be configured so that interpola

6-10Calibrating for Increased Measurement AccuracyProcedures for Error Correcting Your MeasurementsProcedures for Error Correcting Your Measurements T

6-11Calibrating for Increased Measurement AccuracyProcedures for Error Correcting Your MeasurementsNOTE Response calibration is not as accurate as oth

6-12Calibrating for Increased Measurement AccuracyFrequency Response Error CorrectionsFrequency Response Error Corrections You can remove the frequenc

6-13Calibrating for Increased Measurement AccuracyFrequency Response Error CorrectionsFigure 6-2 Standard Connections for a Response Error Correction

6-14Calibrating for Increased Measurement AccuracyFrequency Response Error CorrectionsResponse Error Correction for Transmission Measurements 1. Press

6-15Calibrating for Increased Measurement AccuracyFrequency Response Error CorrectionsNOTE Do not use an open or short standard for a transmission res

1-17Making MeasurementsUsing Display Functions9. To independently control the channel markers:Press ; set to UNCOUPLED.Rotate the front panel con

6-16Calibrating for Increased Measurement AccuracyFrequency Response Error CorrectionsFigure 6-4 Standard Connections for a Receiver Calibration3. To

6-17Calibrating for Increased Measurement AccuracyFrequency Response and Isolation Error CorrectionsFrequency Response and Isolation Error Corrections

6-18Calibrating for Increased Measurement AccuracyFrequency Response and Isolation Error Corrections7. Make a "thru" connection between the

6-19Calibrating for Increased Measurement AccuracyFrequency Response and Isolation Error Corrections12.Return the averaging to the original state of t

6-20Calibrating for Increased Measurement AccuracyFrequency Response and Isolation Error CorrectionsIf your type of calibration kit is not listed in t

6-21Calibrating for Increased Measurement AccuracyFrequency Response and Isolation Error Corrections10.To measure the standard for the isolation porti

6-22Calibrating for Increased Measurement AccuracyEnhanced Frequency Response Error CorrectionEnhanced Frequency Response Error Correction The enhance

6-23Calibrating for Increased Measurement AccuracyEnhanced Frequency Response Error Correction6. To select the correction type, press and select t

6-24Calibrating for Increased Measurement AccuracyEnhanced Frequency Response Error Correction12.To measure the standard, when the displayed trace has

6-25Calibrating for Increased Measurement AccuracyEnhanced Frequency Response Error Correctionb. Activate at least four times more averages than desir

1-18 Making MeasurementsUsing Display Functions4 Param Displays Softkey The menu does two things:• provides a quick way to set up a four-parameter

6-26Calibrating for Increased Measurement AccuracyOne-Port Reflection Error CorrectionOne-Port Reflection Error Correction • removes directivity error

6-27Calibrating for Increased Measurement AccuracyOne-Port Reflection Error CorrectionNOTE Include any adapters that you will have in the device measu

6-28Calibrating for Increased Measurement AccuracyOne-Port Reflection Error Correction13.To compute the error coefficients, press: .The analyzer disp

6-29Calibrating for Increased Measurement AccuracyFull Two-Port Error Correction (ES Analyzers Only)Full Two-Port Error Correction (ES Analyzers Only)

6-30Calibrating for Increased Measurement AccuracyFull Two-Port Error Correction (ES Analyzers Only)Figure 6-9 Standard Connections for Full Two-Port

6-31Calibrating for Increased Measurement AccuracyFull Two-Port Error Correction (ES Analyzers Only)14.Make a "thru" connection between the

6-32Calibrating for Increased Measurement AccuracyFull Two-Port Error Correction (ES Analyzers Only)17.To compute the error coefficients, press:The an

6-33Calibrating for Increased Measurement AccuracyPower Meter Measurement CalibrationPower Meter Measurement Calibration A GPIB-compatible power meter

6-34Calibrating for Increased Measurement AccuracyPower Meter Measurement CalibrationInterpolation in Power Meter Calibration If the frequency is chan

6-35Calibrating for Increased Measurement AccuracyPower Meter Measurement Calibration3. Press and then press either the or key, depending on whi

1-19Making MeasurementsUsing Display FunctionsUsing Memory Traces and Memory Math Functions The analyzer has four available memory traces, one per cha

6-36Calibrating for Increased Measurement AccuracyPower Meter Measurement CalibrationNOTE Remember to subtract the through arm loss from the coupler a

6-37Calibrating for Increased Measurement AccuracyPower Meter Measurement Calibration4. Set the power meter's address (“XX” represents the addres

6-38Calibrating for Increased Measurement AccuracyPower Meter Measurement CalibrationUsing Continuous Correction Mode You can set the analyzer to upda

6-39Calibrating for Increased Measurement AccuracyPower Meter Measurement CalibrationTo Calibrate the Analyzer Receiver to Measure Absolute Power You

6-40Calibrating for Increased Measurement AccuracyCalibrating for Noninsertable DevicesCalibrating for Noninsertable Devices A test device that cannot

6-41Calibrating for Increased Measurement AccuracyCalibrating for Noninsertable DevicesAdapter Removal Calibration (ES Analyzers Only)Adapter removal

6-42Calibrating for Increased Measurement AccuracyCalibrating for Noninsertable DevicesPerform the 2-Port Error Corrections 1. Check the firmware to s

6-43Calibrating for Increased Measurement AccuracyCalibrating for Noninsertable Devices3. Connect adapter A3 (same sex and connector type as the DUT)

6-44Calibrating for Increased Measurement AccuracyCalibrating for Noninsertable Devices7. Press .8. Turn the knob to select the file that contain

6-45Calibrating for Increased Measurement AccuracyCalibrating for Noninsertable DevicesVerify the Results Since the effect of the adapter has been rem

1-20 Making MeasurementsUsing Display FunctionsTo View the Measurement Data and Memory Trace The analyzer default setting shows you the current measu

6-46Calibrating for Increased Measurement AccuracyCalibrating for Noninsertable DevicesModify the Cal Kit Thru Definition With this method, it is only

6-47Calibrating for Increased Measurement AccuracyMinimizing Error When Using AdaptersMinimizing Error When Using AdaptersTo minimize the error introd

6-48Calibrating for Increased Measurement AccuracyMaking Non-Coaxial MeasurementsMaking Non-Coaxial MeasurementsNon-coaxial, on-wafer measurements pre

6-49Calibrating for Increased Measurement AccuracyMaking Non-Coaxial MeasurementsIf You Want to Design Your Own Fixture Ideally, a fixture should prov

6-50Calibrating for Increased Measurement AccuracyCalibrating for Non-Coaxial Devices (ES Analyzers Only)Calibrating for Non-Coaxial Devices (ES Analy

6-51Calibrating for Increased Measurement AccuracyCalibrating for Non-Coaxial Devices (ES Analyzers Only)Assign the Standards to the Various TRL Class

6-52Calibrating for Increased Measurement AccuracyCalibrating for Non-Coaxial Devices (ES Analyzers Only)Perform the TRL Calibration1. Press

6-53Calibrating for Increased Measurement AccuracyCalibrating for Non-Coaxial Devices (ES Analyzers Only)NOTE You can save or store the measurement co

6-54Calibrating for Increased Measurement AccuracyLRM Error CorrectionLRM Error Correction Create a User-Defined LRM Calibration KitIn order to use th

6-55Calibrating for Increased Measurement AccuracyLRM Error CorrectionAssign the Standards to the Various LRM Classes8. To assign the calibration stan

1-21Making MeasurementsUsing Display FunctionsBlanking the Display Pressing switches off the analyzer display while leaving the instrument in it

6-56Calibrating for Increased Measurement AccuracyLRM Error CorrectionPerform the LRM Calibration1. You must have a LRM calibration kit defined and sa

6-57Calibrating for Increased Measurement AccuracyLRM Error CorrectionNOTE You should perform the isolation measurement when the highest dynamic range

6-58Calibrating for Increased Measurement AccuracyCalibrating Using Electronic Calibration (ECal)Calibrating Using Electronic Calibration (ECal)This s

6-59Calibrating for Increased Measurement AccuracyCalibrating Using Electronic Calibration (ECal)Connect the ECal Equipment1. Connect the power supply

6-60Calibrating for Increased Measurement AccuracyCalibrating Using Electronic Calibration (ECal)5. If you need to calibrate with a second ECal module

6-61Calibrating for Increased Measurement AccuracyCalibrating Using Electronic Calibration (ECal)When the crosstalk is near (or in) the noise floor, o

6-62Calibrating for Increased Measurement AccuracyCalibrating Using Electronic Calibration (ECal)Perform the Calibration1. Press .When ECal is first

6-63Calibrating for Increased Measurement AccuracyCalibrating Using Electronic Calibration (ECal)Figure 6-22 Manual Thru Setup5. After you connect the

6-64Calibrating for Increased Measurement AccuracyCalibrating Using Electronic Calibration (ECal)7. After you connect the second ECal module, press

6-65Calibrating for Increased Measurement AccuracyCalibrating Using Electronic Calibration (ECal)Perform the Confidence CheckThe confidence check is a

1-22 Making MeasurementsUsing Display FunctionsAdjusting the Colors of the Display Setting Display Intensity To adjust the intensity of the display,

6-66Calibrating for Increased Measurement AccuracyCalibrating Using Electronic Calibration (ECal)Pressing the softkey toggles between the five trace

6-67Calibrating for Increased Measurement AccuracyCalibrating Using Electronic Calibration (ECal)Investigating the Calibration Results Using the ECal

6-68Calibrating for Increased Measurement AccuracyCalibrating Using Electronic Calibration (ECal)NOTE When returning to the Confidence Check menu from

6-69Calibrating for Increased Measurement AccuracyAdapter Removal Using ECal (ES Analyzers Only)Adapter Removal Using ECal (ES Analyzers Only)A devic

6-70Calibrating for Increased Measurement AccuracyAdapter Removal Using ECal (ES Analyzers Only)Figure 6-26 Adapters NeededThe following requirements

6-71Calibrating for Increased Measurement AccuracyAdapter Removal Using ECal (ES Analyzers Only)Perform the 2-Port Error Corrections 1. Connect adapte

6-72Calibrating for Increased Measurement AccuracyAdapter Removal Using ECal (ES Analyzers Only)Figure 6-28 Two-Port Cal Set 27. Connect the ECal mod

6-73Calibrating for Increased Measurement AccuracyAdapter Removal Using ECal (ES Analyzers Only)Determine the Electrical Delay This procedure determin

6-74Calibrating for Increased Measurement AccuracyAdapter Removal Using ECal (ES Analyzers Only)Remove the AdapterWhen the two sets of error correctio

6-75Calibrating for Increased Measurement AccuracyAdapter Removal Using ECal (ES Analyzers Only)10.Connect the DUT to the network analyzer as shown in

1-23Making MeasurementsUsing Display FunctionsNOTE Maximum viewing with the LCD display is achieved when primary colors or a combination of them are s

6-76Calibrating for Increased Measurement AccuracyAdapter Removal Using ECal (ES Analyzers Only)

7-17 Operating Concepts

7-2 Operating ConceptsUsing This ChapterUsing This ChapterThis chapter provides conceptual information on how specific functions of the network analy

7-3Operating ConceptsSystem OperationSystem Operation Network analyzers measure the reflection and transmission characteristics of devices and network

7-4 Operating ConceptsSystem OperationThe Built-In Synthesized Source The analyzer’s built-in synthesized source produces a swept RF signal or CW (co

7-5Operating ConceptsSystem OperationThe Microprocessor A microprocessor takes the raw data and performs all the required error correction, trace math

7-6 Operating ConceptsProcessing Processing The analyzer’s receiver converts the R, A, and B input signals into useful measurement information. This

7-7Operating ConceptsProcessingWhile only a single flow path is shown, two identical paths are available, corresponding to channel 1 and channel 2. Ea

7-8 Operating ConceptsProcessingPre-Raw Data Arrays These data arrays store the results of all the preceding data processing operations. (Up to this

7-9Operating ConceptsProcessingTransform (Option 010 Only) This transform converts frequency domain information into the time domain when it is activa

1-24 Making MeasurementsUsing MarkersUsing Markers The key displays a movable active marker on the screen and provides access to a series of menus

7-10 Operating ConceptsOutput PowerOutput PowerUnderstanding the Power Ranges The built-in synthesized source contains a programmable step attenuator

7-11Operating ConceptsOutput PowerNOTE After measurement calibration, you can change the power within a range and still maintain nearly full accuracy.

7-12 Operating ConceptsSweep TimeSweep Time The softkey selects sweep time as the active entry and shows whether the automatic or manual mode is ac

7-13Operating ConceptsSweep TimeIn addition to the these parameters, the actual cycle time of the analyzer is also dependent on the following measurem

7-14 Operating ConceptsSource Attenuator Switch ProtectionSource Attenuator Switch Protection The programmable step attenuator of the source can be s

7-15Operating ConceptsChannel Stimulus CouplingChannel Stimulus Coupling toggles the channel coupling of stimulus values. With (the preset condition

7-16 Operating ConceptsSweep TypesSweep Types The following sweep types will function with the interpolated error-correction feature (described in “I

7-17Operating ConceptsSweep TypesNOTE Earlier 8753 models allowed a maximum of 1632 points, but this value was reduced to 1601 to add the 4 channels i

7-18 Operating ConceptsSweep TypesThe frequency subsweeps, or segments, can be defined in any of the following terms:• start/stop/number of points• s

7-19Operating ConceptsSweep TypesThe frequency subsweeps, or segments, can be defined in any of the following terms:• start/stop/number of points/powe

1-25Making MeasurementsUsing MarkersNOTE Using will also affect marker search and positioning functions when the value entered in a search or positi

7-20 Operating ConceptsSweep TypesNarrow IF bandwidths require more data samples per point and thus slow down the measurement time. Selectable IF ban

7-21Operating ConceptsS-ParametersS-Parameters The key accesses the S-parameter menu which contains softkeys that can be used to select the paramete

7-22 Operating ConceptsS-ParametersFigure 7-3 S-Parameters of a Two-Port DeviceS-parameters are exactly equivalent to these more common description

7-23Operating ConceptsS-ParametersThe S-Parameter MenuThe S-parameter menu allows you to define the input ports and test set direction for S-parameter

7-24 Operating ConceptsS-ParametersFigure 7-4 Reflection Impedance and Admittance ConversionsIn a transmission measurement, the data can be converte

7-25Operating ConceptsAnalyzer Display FormatsAnalyzer Display FormatsThe key accesses the format menu. This menu allows you to select the appropria

7-26 Operating ConceptsAnalyzer Display FormatsPhase Format The softkey displays a Cartesian format of the phase portion of the data, measured in d

7-27Operating ConceptsAnalyzer Display FormatsGroup Delay Format The softkey selects the group delay format, with marker values given in seconds. Th

7-28 Operating ConceptsAnalyzer Display FormatsSmith Chart Format The softkey displays a Smith chart format. Refer to Figure 7-9. This is used in r

7-29Operating ConceptsAnalyzer Display FormatsPolar Format The softkey displays a polar format as shown in Figure 7-10. Each point on the polar form

iv Documentation MapThe Installation and Quick Start Guide provides procedures for installing, configuring, and verifying the operation of the analy

1-26 Making MeasurementsUsing MarkersFigure 1-13 Active and Inactive Markers Example • To switch off all of the markers, press .To Move Marker Info

7-30 Operating ConceptsAnalyzer Display FormatsLinear Magnitude Format The softkey displays the linear magnitude format as shown in Figure 7-11. Th

7-31Operating ConceptsAnalyzer Display FormatsSWR Format The softkey reformats a reflection measurement into its equivalent SWR (standing wave ratio

7-32 Operating ConceptsAnalyzer Display FormatsImaginary Format The softkey displays only the imaginary (reactive) portion of the measured data on

7-33Operating ConceptsAnalyzer Display FormatsFigure 7-15 Higher Order Phase Shift The analyzer computes group delay from the phase slope. Phase data

7-34 Operating ConceptsAnalyzer Display FormatsFigure 7-17 Variations in Frequency Aperture In determining the group delay aperture, there is a trad

7-35Operating ConceptsElectrical DelayElectrical Delay The softkey adjusts the electrical delay to balance the phase of the test device. This softke

7-36 Operating ConceptsNoise Reduction TechniquesNoise Reduction TechniquesThe key is used to access three different noise reduction techniques: sw

7-37Operating ConceptsNoise Reduction TechniquesSmoothing Smoothing (similar to video filtering) averages the formatted active channel data over a por

7-38 Operating ConceptsNoise Reduction TechniquesFigure 7-20 IF Bandwidth Reduction NOTE Hints Another capability that can be used for effective noi

7-39Operating ConceptsMeasurement CalibrationMeasurement Calibration Measurement calibration is an accuracy enhancement procedure that effectively rem

1-27Making MeasurementsUsing MarkersFigure 1-14 Marker Information Moved into the Softkey Menu Area4. Restore the softkey menu and move the marker in

7-40 Operating ConceptsMeasurement CalibrationWhat Causes Measurement Errors? Network analysis measurement errors can be separated into systematic, r

7-41Operating ConceptsMeasurement Calibrationdirectivity is the vector sum of all leakage signals appearing at the analyzer receiver input. The error

7-42 Operating ConceptsMeasurement CalibrationFigure 7-23 Load Match The error contributed by load match is dependent on the relationship between the

7-43Operating ConceptsMeasurement CalibrationCharacterizing Microwave Systematic Errors One-Port Error Model In a measurement of the reflection coeffi

7-44 Operating ConceptsMeasurement CalibrationFigure 7-26 Effective Directivity EDF Since the measurement system test port is never exactly the chara

7-45Operating ConceptsMeasurement CalibrationFigure 7-28 Reflection Tracking ERF These three errors are mathematically related to the actual data, S1

7-46 Operating ConceptsMeasurement CalibrationFigure 7-29 "Perfect Load" Termination Since the measured value for directivity is the vecto

7-47Operating ConceptsMeasurement CalibrationNext, a short circuit termination whose response is known to a very high degree is used to establish anot

7-48 Operating ConceptsMeasurement CalibrationDevice Measurement Now the unknown is measured to obtain a value for the measured response, S11M, at ea

7-49Operating ConceptsMeasurement CalibrationFigure 7-34 Major Sources of Error The transmission coefficient is measured by taking the ratio of the i

1-28 Making MeasurementsUsing MarkersFigure 1-15 Marker Information on the GraticulesYou can also restore the softkey menu by pressing a hardkey whi

7-50 Operating ConceptsMeasurement CalibrationFigure 7-36 Load Match ELF The measured value, S21M, consists of signal components that vary as a func

7-51Operating ConceptsMeasurement CalibrationIn this case, omitting isolation is better than measuring the isolation standards without increasing the

7-52 Operating ConceptsMeasurement CalibrationFigure 7-38 Full Two-Port Error Model A full two-port error model equations for all four S-parameters

7-53Operating ConceptsMeasurement CalibrationFigure 7-39 Full Two-Port Error Model Equations How Effective Is Accuracy Enhancement? In addition to th

7-54 Operating ConceptsMeasurement CalibrationFigure 7-40a shows a measurement in log magnitude format with a response calibration only. Figure 7-40b

7-55Operating ConceptsMeasurement CalibrationThe response of a device in a log magnitude format is shown in Figure 7-42. Figure 7-42a shows the respon

7-56 Operating ConceptsCalibration RoutinesCalibration RoutinesThere are twelve different error terms for a two-port measurement that can be correcte

7-57Operating ConceptsCalibration RoutinesEnhanced Reflection CalibrationThe enhanced reflection calibration is activated by selecting under the me

7-58 Operating ConceptsModifying Calibration KitsModifying Calibration Kits Modifying calibration kits is necessary only if unusual standards (such a

7-59Operating ConceptsModifying Calibration KitsProcedure The following steps are used to modify or define a user kit:1. Select the predefined kit to

1-29Making MeasurementsUsing MarkersFigure 1-16 Marker 1 as the Reference Marker Example 4. To change the reference marker to marker 2, press: To Act

7-60 Operating ConceptsModifying Calibration Kits• leads to a menu for constructing a label for the user-modified cal kit. If a label is supplied, i

7-61Operating ConceptsModifying Calibration KitsAfter a standard number is entered, selection of the standard type will present one of five menus for

7-62 Operating ConceptsModifying Calibration Kits• defines the standard type as a transmission line of specified length, for calibrating transmissio

7-63Operating ConceptsModifying Calibration KitsThe following is a description of the softkeys located within the specify offset menu:• allows you to

7-64 Operating ConceptsModifying Calibration KitsA class often consists of a single standard, but may be composed of more than one standard if band-l

7-65Operating ConceptsModifying Calibration KitsNOTE It is often simpler to keep the number of standards per class to the bare minimum needed (often o

7-66 Operating ConceptsModifying Calibration Kits• allows you to enter the standard numbers for a TRL line or match calibration.Label Class Menu The

7-67Operating ConceptsModifying Calibration KitsModifying and Saving a Calibration Kit from the Calibration Kit Selection MenuTo modify a calibration

7-68 Operating ConceptsTRL*/LRM* Calibration (ES Models Only)TRL*/LRM* Calibration (ES Models Only) The network analyzer has the capability of making

7-69Operating ConceptsTRL*/LRM* Calibration (ES Models Only)TRL Terminology Notice that the letters TRL, LRL, LRM, etc. are often interchanged, depend

1-30 Making MeasurementsUsing MarkersFigure 1-17 Example of a Fixed Reference Marker Using MKR ZERO Using the Key to Activate a Fixed Reference Ma

7-70 Operating ConceptsTRL*/LRM* Calibration (ES Models Only)The first step in the TRL* 2-port calibration process is the same as the transmission st

7-71Operating ConceptsTRL*/LRM* Calibration (ES Models Only)Figure 7-44 8-term TRL (or TRL*) Error Model and Generalized Coefficients Source match an

7-72 Operating ConceptsTRL*/LRM* Calibration (ES Models Only)Improving Raw Source Match and Load Match for TRL*/LRM* Calibration A technique that can

7-73Operating ConceptsTRL*/LRM* Calibration (ES Models Only)Transmission magnitude uncertainty = EX + ETS21 + ESS11S21 + ELS22S21where:ED = effective

7-74 Operating ConceptsTRL*/LRM* Calibration (ES Models Only)• If the reflect is used to set the reference plane, the phase response must be well-kno

7-75Operating ConceptsTRL*/LRM* Calibration (ES Models Only)±N × 180 degrees where N is an integer.) If two lines are used (LRL), the difference in el

7-76 Operating ConceptsTRL*/LRM* Calibration (ES Models Only)For microstrip and other fabricated standards, the velocity factor is significant. In th

7-77Operating ConceptsTRL*/LRM* Calibration (ES Models Only)TRL Options The softkey accesses the TRL/LRM options menu. There are two selections unde

7-78 Operating ConceptsTRL*/LRM* Calibration (ES Models Only)NOTE Dispersion EffectsDispersion occurs when a transmission medium exhibits a variable

7-79Operating ConceptsGPIB OperationGPIB Operation This section contains information on the following topics:• local key• GPIB controller modes• instr

1-31Making MeasurementsUsing MarkersFigure 1-18 Example of a Fixed Reference Marker Using (∆)REF=(∆)FIXED MKR To Couple and Uncouple Display Markers

7-80 Operating ConceptsGPIB OperationGPIB STATUS Indicators When the analyzer is connected to other instruments over GPIB, the GPIB STATUS indicators

7-81Operating ConceptsGPIB OperationThis menu lets you set the GPIB address of the analyzer, and enter the addresses of peripheral devices so that the

7-82 Operating ConceptsLimit Line OperationLimit Line OperationThis menu can be accessed by pressing within the system menu.You can have limit li

7-83Operating ConceptsLimit Line OperationIf limit lines are on, they are plotted with the data on a plot. If limit testing is on, the PASS or FAIL me

7-84 Operating ConceptsKnowing the Instrument ModesKnowing the Instrument Modes There are five major instrument modes of the analyzer:• network analy

7-85Operating ConceptsKnowing the Instrument ModesFigure 7-46 Typical Setup for External Source ModeExternal Source Mode In-Depth Description You may

7-86 Operating ConceptsKnowing the Instrument Modes• The frequency of the incoming signal should be within −0.5 to +5.0 MHz of the selected frequency

7-87Operating ConceptsKnowing the Instrument ModesTypical test setup 1. Activate the tuned receiver mode by pressing .2. To perform a CW measureme

7-88 Operating ConceptsKnowing the Instrument ModesHarmonic Operation (Option 002 Only) The analyzer’s harmonic menu can be accessed by pressing .

7-89Operating ConceptsKnowing the Instrument ModesCoupling Power Between Channels 1 and 2 is intended to be used with the softkey. You can use the

1-32 Making MeasurementsUsing MarkersFigure 1-19 Example of Coupled and Uncoupled Markers To Use Polar Format Markers The analyzer can display the m

7-90 Operating ConceptsDifferences between 8753 Network AnalyzersDifferences between 8753 Network AnalyzersTable 7-5 Comparing the 8753A/B/C/DFeatur

7-91Operating ConceptsDifferences between 8753 Network AnalyzersTable 7-6 Comparing the 8753D/E/ES Feature 8753D8753E 8753ESFully integrated measureme

7-92 Operating ConceptsDifferences between 8753 Network AnalyzersInterfaces: RS-232, parallel, and DIN keyboard Yes Yes YesUser-defined preset Yes Ye

7-93Operating ConceptsDifferences between 8753 Network AnalyzersColor display Yes Yes YesFlat panel LCD No Yes YesVGA output No Yes NoDelete display (

7-94 Operating ConceptsDifferences between 8753 Network Analyzers

8-18 Safety and Regulatory Information

8-2 Safety and Regulatory InformationGeneral InformationGeneral InformationMaintenanceClean the cabinet, using a dry or damp cloth only.WARNING To pr

8-3Safety and Regulatory InformationGeneral InformationTable 8-1 Contacting AgilentOnline assistance: www.agilent.com/find/assistUnited States(tel) 1

8-4 Safety and Regulatory InformationSafety SymbolsSafety Symbols The following safety symbols are used throughout this manual. Familiarize yourself

8-5Safety and Regulatory InformationSafety ConsiderationsSafety Considerations NOTE This instrument has been designed and tested in accordance with IE

1-33Making MeasurementsUsing MarkersFigure 1-20 Example of a Log Marker in Polar Format

8-6 Safety and Regulatory InformationSafety ConsiderationsServicing WARNING No operator serviceable parts inside. Refer servicing to qualified person

8-7Safety and Regulatory InformationSafety ConsiderationsGeneral WARNING To prevent electrical shock, disconnect the analyzer from mains before cleani

8-8 Safety and Regulatory InformationSafety ConsiderationsCompliance with German FTZ Emissions Requirements This network analyzer complies with Germa

8-9Safety and Regulatory InformationDeclaration of ConformityDeclaration of Conformity

8-10 Safety and Regulatory InformationDeclaration of Conformity

IndexIndex-1Numerics2-port error corrections, performing, 6-42, 6-714 Param Displays softkey, 1-18Aaborting a print or plot process, 4-31absoluterippl

Index-2 IndexTRL*/LRM* two-port calibration, 7-57calibration standards, 6-5calibration techniquesimproper, 5-4calibration, measurement, 7-39calibrati

IndexIndex-3device measurements, 6-4device under testmeasuring, 1-5device under test, connecting, 1-4device, bilateral, 6-22, 6-25device, noninsertabl

Index-4 Indexrenaming, 4-50sequential CSV naming of, 4-43to delete all, 4-49filter, characteristics, 1-72finite impulse width (or rise time), 3-27fix

IndexIndex-5high dynamic range swept RF/IF conversion lossmeasurement parameters for IF range, 2-20power meter calibration over IF range, 2-20power me

1-34 Making MeasurementsUsing MarkersTo Use Smith Chart Markers For greater accuracy when using markers in the Smith chart format, activate the discr

Index-6 Indexintroduction to time domain measurements, 3-3isolation, 7-42, 7-70averaging, 6-60calibrating using ECal, 6-60calibration, omitting, 6-4e

IndexIndex-7how RF and IF are defined, 2-7internal and external R channel inputs, 2-10LO frequency accuracy and stability, 2-10minimizing source and l

Index-8 Indexaveraging, 7-36IF bandwidth reduction, 7-37smoothing, 7-37non-coaxialmaking measurements, 6-48non-coaxial devices, calibrating for, 6-50

IndexIndex-9loss of power meter calibration data, 6-33using continuous correction mode, 6-38using sample-and-sweep correction mode, 6-36power ranges,

Index-10 Indexreverse isolation, 1-64reviewing the limit line segments, 1-82RF feedthrough, 2-46RF frequency range, 2-22using the calculation, 2-22us

IndexIndex-11S-parameters, 7-21S-parameter menu, 7-23understanding, 7-21S-parameters menuinput ports menu, 7-24specific amplitude, 1-40bandwidth, sear

Index-12 Indextransmission measurements in time domain low pass, 3-19time domain low pass step mode, 3-4time domain measurements, introduction, 3-3fo

IndexIndex-13what you can save to the analyzer’s internal memory, 4-34widening the system bandwidth, 5-11windowing, 3-27finite impulse width (or rise

1-35Making MeasurementsUsing MarkersFigure 1-21 Example of Impedance Smith Chart Markers To Set Measurement Parameters Using Markers The analyzer all

Contents Contents-v1. Making MeasurementsUsing This Chapter . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

1-36 Making MeasurementsUsing MarkersSetting the Stop Frequency 1. Press and turn the front panel knob, or enter a value from the front panel keypa

1-37Making MeasurementsUsing MarkersFigure 1-24 Example of Setting the Center Frequency Using a Marker Setting the Frequency Span You can set the spa

1-38 Making MeasurementsUsing MarkersFigure 1-25 Example of Setting the Frequency Span Using Marker Setting the Display Reference Value 1. Press a

1-39Making MeasurementsUsing MarkersSetting the Electrical Delay This feature adds phase delay to a variation in phase versus frequency, therefore it

1-40 Making MeasurementsUsing MarkersTo Search for a Specific Amplitude These functions place the marker at an amplitude-related point on the trace.

1-41Making MeasurementsUsing MarkersFigure 1-29 Example of Searching for the Minimum Amplitude Using a Marker Searching for a Target Amplitude 1. Pre

1-42 Making MeasurementsUsing MarkersSearching for a Bandwidth The analyzer can automatically calculate and display the bandwidth (BW:), center frequ

1-43Making MeasurementsUsing MarkersTo Calculate the Statistics of the Measurement Data This function calculates the mean, standard deviation, and pea

1-44 Making MeasurementsMeasuring Electrical Length and Phase DistortionMeasuring Electrical Length and Phase Distortion Electrical LengthThe analyze

1-45Making MeasurementsMeasuring Electrical Length and Phase DistortionYou may also want to select settings for the number of data points, averaging,

Contents-vi ContentsUsing Limit Lines to Test a Device. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1-76S

1-46 Making MeasurementsMeasuring Electrical Length and Phase DistortionThe measurement value that the analyzer displays represents the electrical le

1-47Making MeasurementsMeasuring Electrical Length and Phase DistortionDeviation From Linear Phase By adding electrical length to “flatten out” the ph

1-48 Making MeasurementsMeasuring Electrical Length and Phase DistortionThe default aperture is the total frequency span divided by the number of poi

1-49Making MeasurementsMeasuring Electrical Length and Phase DistortionFigure 1-38 Group Delay Example Measurement with Smoothing 5. To increase the

1-50 Making MeasurementsCharacterizing a Duplexer (ES Analyzers Only)Characterizing a Duplexer (ES Analyzers Only)This measurement example demonstrat

1-51Making MeasurementsCharacterizing a Duplexer (ES Analyzers Only)Figure 1-40 Duplexer Connections 3. Set up channel 1 for the Tx-Ant stimulus param

1-52 Making MeasurementsCharacterizing a Duplexer (ES Analyzers Only)11.Set up control of the test adapter so that channels 2 and 4 are Rx:• For K36

1-53Making MeasurementsCharacterizing a Duplexer (ES Analyzers Only)Normally, a 2-port calibration requires a forward and reverse sweep to complete be

1-54 Making MeasurementsMeasuring AmplifiersMeasuring AmplifiersThe analyzer allows you to measure the transmission and reflection characteristics of

1-55Making MeasurementsMeasuring AmplifiersMeasuring Harmonics (Option 002)The analyzer has the capability of measuring swept second and third harmoni

Contents Contents-viiConversion Loss Using the Frequency Offset Mode . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .2-13Setting Measur

1-56 Making MeasurementsMeasuring AmplifiersMaking Harmonic MeasurementsPerform the following steps to display the absolute power of the fundamental

1-57Making MeasurementsMeasuring AmplifiersTo show the second harmonic’s power level relative to the fundamental power in dBc, press and select

1-58 Making MeasurementsMeasuring AmplifiersFigure 1-47 Gain Compression and 2nd Harmonic Output Level Understanding Harmonic OperationSingle-Channe

1-59Making MeasurementsMeasuring AmplifiersCoupling Power Between Channels 1 and 2 is intended to be used with the softkey. You can use the D2/D

1-60 Making MeasurementsMeasuring AmplifiersMeasuring Gain Compression Gain compression occurs when the input power of an amplifier is increased to a

1-61Making MeasurementsMeasuring Amplifiers4. To produce a normalized trace that represents gain compression, perform either step 5 or step 6. (Step 5

1-62 Making MeasurementsMeasuring AmplifiersFigure 1-49 Gain Compression Using Linear Sweep and 12.If was selected, recouple the channel stimulus

1-63Making MeasurementsMeasuring AmplifiersNOTE A receiver calibration will improve the accuracy of this measurement. Refer to Chapter 6 , “Calibratin

1-64 Making MeasurementsMeasuring AmplifiersMeasuring Gain and Reverse Isolation Simultaneously(ES Analyzers Only)Since an amplifier will have high g

1-65Making MeasurementsMeasuring AmplifiersFigure 1-51 Gain and Reverse Isolation

Contents-viii Contents4. Printing, Plotting, and Saving Measurement ResultsUsing This Chapter. . . . . . . . . . . . . . . . . . . . . . . . . . . .

1-66 Making MeasurementsMeasuring AmplifiersMaking High Power Measurements with Option 014(ES Analyzers Only)Analyzers equipped with Option 014 can b

1-67Making MeasurementsMeasuring AmplifiersHigh Power Configuration OneFigure 1-53 shows a one-path 2-port forward direction high power measurement. I

1-68 Making MeasurementsMeasuring AmplifiersControl of the external switch can be done through the test set interface on the rear panel. Pin 8 on the

1-69Making MeasurementsMeasuring AmplifiersHigh Power Configuration TwoFigure 1-54 shows a full 2-port forward direction high power measurement. In th

1-70 Making MeasurementsMeasuring AmplifiersHigh Power Configuration ThreeFigure 1-55 shows the external high power configuration. With this setup yo

1-71Making MeasurementsUsing the Swept List Mode to Test a DeviceUsing the Swept List Mode to Test a DeviceWhen using a list frequency sweep, the anal

1-72 Making MeasurementsUsing the Swept List Mode to Test a Device2. Set the following measurement parameters: or on ET models: Observe the Ch

1-73Making MeasurementsUsing the Swept List Mode to Test a DeviceSet Up the Lower Stopband Parameters 3. To set up the segment for the lower stopband,

1-74 Making MeasurementsUsing the Swept List Mode to Test a Device8. To maximize the dynamic range in the stopband (increasing the incident power and

1-75Making MeasurementsUsing the Swept List Mode to Test a DeviceFigure 1-59 Filter Measurements Using Linear Sweep and Swept List Mode (Power: 0 dBm

Contents Contents-ixWhat You Can Save to the Analyzer’s Internal Memory . . . . . . . . . . . . . . . . . . . . . . . . . .4-34What You Can Save to a

1-76 Making MeasurementsUsing Limit Lines to Test a DeviceUsing Limit Lines to Test a DeviceLimit testing is a measurement technique that compares me

1-77Making MeasurementsUsing Limit Lines to Test a Device3. Substitute a thru for the device and perform a response calibration by pressing: 4. Reco

1-78 Making MeasurementsUsing Limit Lines to Test a Device5. To terminate the flat line segment by establishing a single point limit, press: Fi

1-79Making MeasurementsUsing Limit Lines to Test a Device• To create a limit line that tests the high side of the bandpass filter, press: F

1-80 Making MeasurementsUsing Limit Lines to Test a Device1. To access the limits menu and activate the limit lines, press: 2. To establish th

1-81Making MeasurementsUsing Limit Lines to Test a DeviceCreating Single Point Limits In this example procedure, the following limits are set:• from −

1-82 Making MeasurementsUsing Limit Lines to Test a DeviceEditing Limit Segments This example shows you how to edit the upper limit of a limit line.1

1-83Making MeasurementsUsing Limit Lines to Test a DeviceNOTE Selecting the beep fail indicator is optional and will add approximately 50 ms of swee

1-84 Making MeasurementsUsing Limit Lines to Test a Device• To return to 0 Hz offset, press: • To offset all of the segments in the limit table by a

1-85Making MeasurementsUsing Ripple Limits to Test a DeviceUsing Ripple Limits to Test a DeviceSetting Up the List of Ripple Limits to TestTwo tasks a