Agilent Technologies Agilent E5250A Manual do Utilizador descarregar pdf (Página 10)

I/CV 2.1 Lite

Overview

Agilent I/CV 2.1 Lite provides

automated test solutions for semi-

conductor characterization. It sup-

ports the Agilent 4155C and 4156C,

the Agilent E5270 Series, the

Agilent E5250A Low Leakage

Switch, the Keithley 707 Switch-

ing Matrix, the Agilent 4284A and

4294A LCR meters, and many pop-

ular semiautomatic wafer probers.

I/CV 2.1 Lite also provides wizard-

based test development, test ex-

ecution, and sequencing along with

data logging and post- analysis

tools on Microsoft® Windows.®

Software Functions

Interactive Measurements

I/CV 2.1 Lite includes Agilent ICS

as the default measurement tool.

ICS provides point-and-click

measurements, intuitive matrix

control, and graphical analysis

capabilities for semiconductor

parametric measurements.

Created setups can be used as

measurement algorithms in the

script editor.

Script Editor

The script editor provides a

wizard-based interface for build-

ing test scripts used in the execu-

tion of automated tests. It allows

access to libraries of built- in

software components that sup-

port functions for creating test

plans. Components include:

• Automated sub-die prober

movement

• Switch connection execution

• Test algorithm execution

• Pass/Fail determination and

processing

• Conditional branching: IF,

ELSE

• Looping: FOR, WHILE

• User variable creation

• User prompts

• Message displays

• Test script commenting

Wafer Prober Navigation

I/CV 2.1 Lite provides support

for popular semiautomatic prob-

ers as well as several automatic

probers. Probe plans can be

defined that include sub-die

movement for performing auto-

mated test of multiple modules

or individual devices across a

wafer. Interactive prober control

can also be implemented for

analytical applications.

Automation Software

10

1 2 ... 5 6 7 8 9 10 11 12

Comentários a estes Manuais

Sem comentários