
Development Flow for the Agilent 3070 Tester Without the PLD ISP Software Page 5
December 2010 Altera Corporation Using the Agilent 3070 Tester for In-System Programming in Altera CPLDs
Step 3: Convert the .svf Files to the .pcf Files
Use the Altera svf2pcf conversion utility to convert the .svf files to .pcf files for use
with the Agilent 3070 tester. The svf2pcf utility creates multiple .pcf files for one
device chain. Running the utility allows you to specify the number of vectors per file.
The amount of memory used by the resulting files varies depending on the data.
The Agilent 3070 digital compiler detects repeating patterns of vectors and optimizes
the directory and sequences the RAM on the tester control card to apply the
maximum number of vectors before re-loading the files. The number of vectors in a
compiled .pcf file ranges from 100,000 to over one million, depending on the size and
density of the targeted devices.
f Download the svf2pcf conversion utility from the Agilent ISP Support page on the
Altera website.
Step 4: Create Executable Tests from the Files
To create digital tests for programming a chain of devices with the Agilent 3070 tester,
follow the steps described in these sections:
a. “Create the Library for the Target Device or Scan Chain” on page 5
b. “Run the Test Consultant” on page 6
c. “Create Digital Tests” on page 6
d. “Create the Wirelist Information for the Tests” on page 6
e. “Modify the Test Plan” on page 6
Create the Library for the Target Device or Scan Chain
The initial program development for the board contains a setup-only node test library
for the ISP boundary-scan chain interface. The test library ensures that the Agilent
3070 tester resources are reserved in the test fixture for programming the target
devices. If only one target device is on the board and it is not part of an isolated
boundary-scan chain, use a pin library; otherwise, use a node library. If you use a pin
library, you must describe every device pin. Do not include test vectors in a test
library.
The following code example shows a setup-only node test library.
!Setup only test for the boundary scan chain
assign TCK to nodes "TCK"! Node name for the TCK pin
assign TMS to nodes "TMS"! Node name for the TMS pin
assign TDI to nodes "TDI"! Node name for the TDI pin
assign TDO to nodes "TDO"! Node name for the TDO pin
inputs TCK, TMS, TDI
outputs TDO
pcf order is TCK, TMS, TDI, TDO! The order is defined by the program
that
! generates the PCF files.
1 Mark the TCK and TMS boundary-scan nodes as CRITICAL in the Board
Consultant. This critical attribute minimizes the wire length of the nodes in
the test fixture.
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