Agilent Technologies HP 8566B Especificações

Consulte online ou descarregue Especificações para Medição, teste e controlo Agilent Technologies HP 8566B. Agilent Technologies HP 8566B Specifications Manual do Utilizador

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About this Manual
We’ve added this manual to the Agilent website in an effort to help you support
your product. This manual is the best copy we could find; it may be incomplete
or contain dated information. If we find a more recent copy in the future, we will
add it to the Agilent website.
Support for Your Product
Agilent no longer sells or supports this product. Our service centers may be able
to perform calibration if no repair parts are needed, but no other support from
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HP References in this Manual
This manual may contain references to HP or Hewlett-Packard. Please note that
Hewlett-Packard's former test and measurement, semiconductor products and
chemical analysis businesses are now part of Agilent Technologies. We have
made no changes to this manual copy. In other documentation, to reduce
potential confusion, the only change to product numbers and names has been in
the company name prefix: where a product number/name was HP XXXX the
current name/number is now Agilent XXXX. For example, model number
HP8648A is now model number Agilent 8648A.
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Resumo do Conteúdo

Página 1

About this Manual We’ve added this manual to the Agilent website in an effort to help you support your product. This manual is the best copy we co

Página 2 - Printed in USA September 1993

4.5.6.Crystal Filter Bypass Network Configuration . . . . .3-219Option 462Introduction . . . . . . . . . . . . . . . . . . . . .3. 6 dB Resolution Ban

Página 3

17. Image, Multiple, and Out of Band Responses Test‘I&ble Z-20. Image and Out-of-Rand ResponseSpectrum Analyze][CENTER FREQUENCY]WW369125791r IISy

Página 4 - Warranty

17. Image, Multiple, and Out of Rand Responses Test9. Repeat steps 4 through 9 for all remaining (CENTER FREQUENCY]and synthesized sweeper settings in

Página 5 - Assistance

18. Gain Compression Test18. GainCompression WstSpecificationcl.0 dB, 100 Hz to 22 GHz with s-5 dBm at the input mixerDescriptionGain compression is m

Página 6 - Considerations

18. Gain Compression TestOUTPUT LEVEL RANGE . . . . . . . . . . . . . . . . . . . . . . . . . . . -20 dBmNoteCare should be taken to disturb the cable

Página 7 - Front-Panel Ke

18. Gain Compression Test16. Set synthesizer to 3000.000 MHz. Connect cable to power sensorand adjust output level of synthesizer for an indication of

Página 8 - Contents

18. Gain Compression Test30. Connect cable to power sensor and adjust output level ofsynthesizer for a power meter indication of -5.00 ho.02 dB.Reconn

Página 9 - 3. Adjustments

19. 1st LO Output Amplitude Test19. 1st LO outputAmplitude TestSpecification> + 5 dBm from 2.3 GHz to 6.1 GHzDescriptionThe power level at the 1ST

Página 10 - Option 857

20. Sweep + TuneOut Accuracy ListSpecification-1 V/GHz X Center Frequency (GHz) f(2% + 10 mV)DescriptionThe spectrum analyzer is set to zero frequency

Página 11 - Contents-4

20. Sweep + Tune Out Accuracy Test‘able 2-22. Sweep + Tune Out AccuracyCENTERFREQUENCY0 Hz-0.0101MHz-0.01112MHz-0.022130MHz-0.143670MHz-0.6931.3GHz- 1

Página 12 - Contents-5

21. Fast SweepTime AccuracyYLkst (<20 ms)Related AdjustmentNoneSpecificationflO% for sweep times 1100 secondsDescriptionThe triangular wave output

Página 13 - Contents-6

Figuresl-l. Service Accessories, HP Part Number 08566-60001. .2-l. Center Frequency Test Setup...2-2. Center Frequency Accuracy Measurement..

Página 14 - Contents-7

21. Fast Sweep Time Accuracy Test (~20 ms)5. Press MARKER [PEAK SEARCH), (MKR], loFF).6. Set [FREQUENCY SPAN] to 0 Hz, (RES] to 3 MHz, [VlDEoj to 3MHz

Página 15 - Contents-8

21. Fast Sweep Time Accuracy Test (~20 ms)‘Jhble 2-23. Fhst Sweep Time Accuracy (~20 ms)SWEEP TIME] Function Generator Frequency Sweep Time Errorwa(di

Página 16 - Contents-9

22. Frequency Reference Error Test22. FrequencyReference ErrorTestRelated Adjustment10 MHz Standard AdjustmentSpecificationAging Rate: <l X 10mg/da

Página 17 - Information

22. Frequency Reference Error TestElECTRONiC COUNTERFREQUENCYSTANDARDSPECTRUM ANALYZERFigure 2-37. Frequency Reference Test SetupEquipmentElectronic

Página 18 - 1-2 General Information

Table 2-24.Performance TkstRecordHewlett-Packard CompanyModel HP 8566BSerial No.IF-Display SectionRF SectionTested byReport No.DatePerformance Tests 2

Página 19 - General Information 1-3

Tkst 1. CenterFrequency ReadoutAccuracySynthesizedSweeperFrequency2GHz2GHz2GHz2GHz3GHz3GHz3GHz3GHz6GHz6GHz6GHz6GHz9GHz9GHz9GHz9GHz9GHz12GHz12GHz12GHz1

Página 20 - 1-4 General Information

Test 2. Frequency Span Accuracy TestTest 2. FrequencySpan Accuracy TestStep 7. Narrow Span AccuracySpectrum AnalyzerTFrequency SynthesizerT[FREQUENCYS

Página 21 - 1 to 100 NITS

Test 3. ResolutionBandwidthAccuracy TestStep 8. Bandwidth Accuracy3 MHz5 MHz1 MHz2 MHz300 kHz500 kHz100 kHz200 kHz30 kHz50 kHz10 kHz20 kHz3 kHz5 kHz1

Página 22 - General information

Test 4. Resolution Bandwidth SelectivityTest 4. ResolutionBandwidthSelectivityStep 9. Resolution Bandwidth SelectivityrSpectrum AnalyzerTESBW)3 MHz1 M

Página 23 - General Information 1-7

lkst 5. ResolutionBandwidthSwitchingUncertaintyStep 5. Bandwidth Switching Uncertainty:RES-1 MHz3 MHz300 kHz100 kHz30 kHz10 kHz3 kHz1 kHz300 Hz100 Hz3

Página 24 - General Information

3-8. Location of AlA Components ...3-9. CRT Cut-Off Voltage3-10. Waveform at AlA3TP5’ : : : : : : : : : : : : 1 : :3-l 1. Discharging the CRT

Página 25

Test 6. Log Scale Switching Uncertainty Testlkst 6. Log ScaleSwitchingUncertainty TestStep 6. Log Scale Switching UncertaintySCALE MKR Amplitude(dB/DI

Página 26 - Performance

‘I&t 7. IF GainUncertaintyStep 12. IF Gain Uncertainty, 10 dB Steps[REFERENCE LEVEL) Frequency (VlDEo] DeviationVWSynthesizer(W(Marker AAmplitudeA

Página 27 - Calibration

Test 7. IF Gain UncertaintyStep 22. IF Gain Uncertainty, 0.1 dB Steps[REFERENCE LEVEL]Wm)0.0-0.1-0.2-0.3-0.4-0.5-0.6-0.7-0.8-0.9-1.0-1.1-1.2-1.3-1.4-1

Página 28 - Performance Tests 2-3

Test 7. IF Gain UncertaintySteps 23 through 28.StepsMinMeasured Max23. Recorded deviations from step 12.Largest Positive 0 to -70 dBmLargest Negative

Página 29 - Specifications

lkst 8. Amplitude Fidelityl&t 8. AmplitudeFidelityStep 6. Log Scale FidelityFrequency1SynthesizerCalibratedAmplitude AmplitudeWWStep+ 100 (ref)0-1

Página 30

Test 9. CalibratorAmplitudeAccuracyStep 2. CAL OUTPUT LevelMinMeasuredMax1 Cal OUTPUT level I- 10.30 dB 1I-9.70 dB I2-100 Performance Tests

Página 31 - 2-6 Performance Tests

Test 10. Frequency Response TestTest10.FrequencyResponse ‘I&tStep12Min Measured MaxDeviation1kHz to100 kHz1.2 dBStep 18SpectrumAnalyzerSTART STOPm

Página 32 - FREQUENCY]

Test 10. Frequency Response Test‘Bble 2-24. Frequency Response (Flatness)12346Frequent ySpectrum AnalyzerCalTrace LimitsRandandFrequent yFlatnessSynt

Página 33 - Center Frequency

Test 11. Sweep Time AccuracyTest 11. SweepTime Accuracy[SWEEP TIME)20ms30ms50ms70ms90ms110ms170ms200ms2sStep 6. Sweep Time Accuracy, Sweep Times 220 m

Página 34

‘I&t 12. NoiseSidebands lkstSteps11. Noise Sideband Level320 Hz offset16. Noise Sideband Level1 kHz offset2 1. Noise Sideband Level10 kHz offset26

Página 35 - 2. Frequency Span Accuracy

3-56. Sweep and DAC Adjustments Setup...3-1143-57. OV to + 1OV Sweep Ramp at A16TP3...3-1153-58. Location of Sweep and DAC Adjustments...

Página 36 - Performance Tests 2-11

Test 13. Line-Related SidebandsTkst 13.Line-RelatedSidebndsSteps9. Line-Related Sidebands Levels for 100 MHz signalLargest level ~360 Hz away from sig

Página 37 - 2-12 Performance Tests

‘I&t 14. AverageNoise LevelStepsIMinMeasuredMax8 and 10. Marker Amplitude Readout100 Hz51 kHz-95 dBm-112 dBmStep 11. Average Noise LevelCENTER FRE

Página 38 - ~FREQUENCY

Test 15. Residual ResponsesII&t 15. ResidualResponse!Steps8. Residual Responses 0 Hz to 1.5 GHZLargest Residual Level11. Residual Responses 1.4 to

Página 39 - 2-14 Performance Tests

‘I&t16. HarmonicAndIntermodulationDistortionSteps8. Second Harmonic Level of 230 MHz15. Second Harmonic Level of 800 MHz25. Second Harmonic Level

Página 40

Test 17. Image, Multiple, and Out-of-Rand ResponsesTest 17. Image,Multiple, andOut-of-BandResponsesStep 8. Image and Out-of-Rand ResponseSpectrum Anal

Página 41

Test 17. Image, Multiple, and Out-of-Rand ResponsesStep 8. Image and Out-of-Rand Response (continued)Spectrum Analyzer[CENTER FREQUENCY]WWSynthesized

Página 42 - Resolution Bandwidth

Test 18. Gain CompressionWst18.GainCompressionStepsMin14.Gain Compressionfor input -10to0 dBm at 2GHz-1.0dB27. Gain Compressionforinput-15to-5 dBm at3

Página 43 - SPAN]Deviation

Test 19. 1st LOOutput AmplitudeStepsMinMeasured Max4. 1st LO OUTPUT Level + 5 dBm2-112 Performance Tests

Página 44 - ,100 MHZ

Test 20. Sweep + Tune Out AccuracyTest 20. Sweep +Tune Out AccuracyStep 3. Sweep + Tune Out AccuracyCENTERFREQUENCY0 Hz1MHz12MHz130MHz670MHz1.3 GHz5.7

Página 45 - 2-20 Performance Tests

‘l&t 21. FastSweep TimeAccuracy (< 20 ms)Step 10. Fhst Sweep Time Accuracy (~20 ms)Function Generator Frequency(W)2.00 f0.025.00 f0.0510.0 fO.1

Página 46

3-106. Sample and Hold Balance Adjustment Waveforms...3-107. Waveform Before Adjustment...3-108. Low-Noise DC Supply...3-109. Cr

Página 47 - 7. IF Gain Uncertainty Test

Test 22. Frequency Reference Error TestTest 22. FrequencyReference ErrorT&tStepsI IMinMeasuredI Max I4.Initial Frequency10. MHz5.Frequency after 2

Página 48 - Performance Tests 2-23

3AdjustmentsIntroductionThe procedures in this section are for the adjustment of theinstrument’s electrical performance characteristics.WarningThe pro

Página 49 - 2-24 Performance Tests

SafetyConsiderationsAlthough this instrument has been designed in accordance withinternational safety standards, this manual contains information,caut

Página 50 - (REFERENCE

Factory-SelectedComponentsFactory-selected components are identified with an asterisk (*) on theschematic diagram. For most components, the range of t

Página 51 - 2-26 Performance Tests

‘Ihble 3-1. Adjustment Cross ReferenceFunction AdiustedLow VoltageHigh VoltageCRT Display (Standard)CRT Display (Digital Storage)IF GainsLog ScalesBan

Página 52

‘Ihble 3-2. Adjustable ComponentsReferenceDesignatorAlA2C308AlA2R308AlA2R319AlA2R409AlA2R426AlA2R427AlA2R437AlA2R440AlA2R512AlA2R513AlA2R515AlA2R517Al

Página 53

‘lhble 3-2. Adjustable Components (continued)tReferenceAdjustmentidjustmenlDesignatolName NumberA3AlR34SWEEP OFFSET25Adjustment FunctionA3A2R12LL THRE

Página 54 - Performance Tests 2-29

‘Ihble 3-2. Adjustable Components (continued)ReferenceDesignatorA4A4C9AdjustmentNameSYMAdjustmentNumber8A4A4C19LC CTR8A4A4C20CTR 8A4A4C39SYM8A4A4C41LC

Página 55

ReferenceDesignatorA4A7C42A4A7R30A4A7R4 1A4A8C13A4A8C29A4A8C32A4A8C42A4A8C44A4A8C46A4A8C66A4A8C67A4A8R6A4A8R7A4A8R35A4ASR40A4A9R60A4A9R6 1A4A9R62A4A9R

Página 56 - POWER METER

lfdble 3-2. Adjustable Components (continued)ReferenceDesignatorAGAlORlA6AlOR9A6AlOR12A6AlOR15A6AlOR18A6AlOR21A6AlOR23A6AlOR25A6AlOR27A6AlOR29A6AlOR31

Página 57

!Ihbles2-l. Performance Test Cross-Reference ...2-2. Center Frequency Readout Accuracy ...2-3. Narrow Span Accuracy...2-4. Wi

Página 58

ReferenceDesignatorA6A12R82A6A12R83A6A12R84A6A12R85A6A12R98A6A12Rll3A7A2C 1A7A2C2A7A2C3A7A2C4A7A4AlAlClA7A4AlAlC5A8R2AlOAlL7AlOAlL8AlOA3LllAlOA3L12AlO

Página 59

‘Ihble 3-2. Adjustable Components (continued)ReferenceAdjustmentAdjustment Adjustment FunctionDesignatorName NumberAl lA5ClIMPEDANCE16Optimizes sample

Página 60 - Performance Tests 2-35

‘Ihble 3-2. Adjustable Components (continued)ReferenceAdjustment AdjustmentAdjustment FunctionDesignatorNameNumberAlA2R31ORTHO3Sets orthogonality of C

Página 61 - 2-36 Performance Tests

‘Ikble 3-3. Fhctory-Selected ComponentsReference Adjustment Range of ValuesFunction of ComponentDesignator Procedure(0 or PF)AlA2R932.87 K to 6.19 KS

Página 62 - Performance Tests 2-37

‘Ihble 3-3. F&tory-Selected Components (continued)Reference Adjustment Range of ValuesFunction of ComponentDesignator Procedure(0 or PF)A4A3R741.7

Página 63 - 4MHzto60MHz

‘Ihble 3-3. Factory-Selected Components (continued)ReferenceDesignatorA4A7R34A4A7R35A4A7R45A4A7R46A4A7R56A4A7R57A4A7R60A4A7R66A4A7R68A4A7R70A4A7R72A4A

Página 64 - Performance Tests 2-39

‘Ihble 3-3. Fhctory-Selected Components (continued)ReferenceDesignatorA4A8R19A4A8R24A4A8R26A4A8R29A4A8R30A4A8R34A4A8R36A4A8R36A4A8R52A4A8R55A4A9R3A4A

Página 65 - 10. Frequency Response Test

‘Ibble 3-3. F&tory-Selected Components (continued)ReferenceDesignatolA6A9AlR5A6A9AlRlfA6A9AlR2;A6AlOR86A6AlOR87A6AlOR88A6AlOR89A6AlOR90A6AlOR91A6A

Página 66 - Figure 2-20

Table 3-3. Fhctory-Selected Components (continued)Reference Adjustment Range of Values Function of ComponentDesignator Procedure(0 or PF)Al lA4R24348

Página 67

able 3-3. Factory-Selected Components (continued)Reference Adjustment Range of ValuesDesignator Procedure(0 or PF)Function of ComponentOption 462A4A7R

Página 68

3-19. Crystal Filter Bypass Network Configuration for A4A7(3MHz) . . . . . . . . . . . . . . . . . . . . .4-l. 6 dB Resolution Bandwidth Accuracy . .

Página 69

‘Ihble 3-4. Standard Value Replacement CapacitorsrCaoacitorssType: TubularRange: 1 to 24 pFI’olerance: 1 to 9.1 pF = f0.25 pF10 to 24 DF = f5%V&he

Página 70

‘Ihble 3-5.Standard Value Replacement 0.125 ResistorsResistorsType: Fixed-FilmRange: 10 to 464K OhmsWattage: 0.125 at 125°CTolerance: f 1 .O%Value (fl

Página 71

‘Ihble 3-5.Standard Value Replacement 0.125 Resistors(continued)ResistorsType: Fixed-FilmRange: 10 to 464K OhmsWattage: 0.125 at 125°ClbleranValue (0)

Página 72

‘able 3-6. Standard Value Replacement 0.5 ResistorsResistorsType: Fixed-FilmRange: 10 to 1.47M OhmsValue (Q:WattTO1EP Part Numberan5-fl.O%Value (fl:El

Página 73 - 246 Performance Tests

‘able 3-6.Standard Value Replacement 0.5 Resistors(continued)ResistorsType: Fixed-FilmRange: 10 to 1.47M OhmsWattage: 0.5 at 125°CValue (ff16.2K17.8K1

Página 74 - (dBc/Hz)

1. Low-Voltage Power Supply Adjustments1. Low-VoltagePower SupplyAdjustmentsReferenceIF-Display Section:AlA f15 V RegulatorAlA + 120 V, +5.2 V Regulat

Página 75

1. Low-Voltage Power Supply AdjustmentsProcedureIF-Display Section1. Position the instrument on its right side with the IF-DisplaySection facing right

Página 76 - 12. Noise Sidebands Test

1. Low-Voltage Power Supply AdjustmentsAlAGDSlAlA6TP3AlAGR9AlA6DS2/AlA7TP2, AlA7DSlAlA8DSl/’ AlA7DS2i AlA7TP3Figure 3-3.IF-Display Section Adjustments

Página 77

1. Low-Voltage Power Supply AdjustmentsRF Section11. With the LINE switch still ON, the RF Section’s +22 V indicatorA8DSl (yellow LED) should be lit.

Página 79

1General InformationIntroductionThis HP 8566B Tests and Adjustments Manual contains two mainsections: Performance Tests and Adjustments Procedures. Th

Página 80 - 13. Line-Related Sidebands

1. Low-Voltage Power Supply Adjustments24. Connect the DVM to A18TP4. The DVM indication should be-10.0 3~0.1 V dc. The -10 V supply is referenced to

Página 81 - 2-56 Performance Tests

2. High-Voltage Adjustment (SN 3001A and Below)2. High-VoltageAdjustment (SN3001A and Below)NoteNoteReferenceThis procedure is for IF-Display Sections

Página 82 - Performance Tests 2-57

2. High-Voltage Adjustment (SN 3001A and Below)DIGITIZINGDSCI LLOSCDPEDIGITAL VDLTMTERHI-VDLTAGESIGNAL ANALYZERFigure 3-5. High Voltage Adjustment Set

Página 83 - Preselected

Warning2. High-Voltage Adjustment (SN 3001A and Below)be performed with the DVM manually set to the 100 V range (*OO.OOOon the HP 3456A display).AlA H

Página 84 - 14. Average Noise Level Test

2. High-Voltage Adjustment (SN 3001A and Below)10. Wait at least one minute for capacitors to discharge to a safelevel.11. Remove the protective cover

Página 85

2. High-Voltage Adjustment (SN 3001A and Below)stabilize and the CRT to normalize. This so$ turn-on will extendCRT life expectancy, particularly if a

Página 86

2. High-Voltage Adjustment (SN 3001A and Below)then set the LINE switch to ON (the INSTR CHECK I LED willlight.)30. Wait approximately 30 seconds for

Página 87 - 15. Residual Responses Test

2. High-Voltage Adjustment (SN 3001A and Below)i ..___ -_.- ..~...~. - ._.. i .._... - .._...--..

Página 88

2. High-Voltage Adjustment (SN 3001A and Below)12 VP+, whichever is greater. See Figure 3-10. (The value of V,,was recorded in step 34.)If the front-p

Página 89

2. High-Voltage Adjustment (SN 3001A and Below)41. The High-Voltage Adjustment is completed. If an AlA2, AlA4,or AlA assembly has been repaired or rep

Página 90

Instruments CoveredThis manual contains procedures for testing and adjusting HPby this Manual8566B spectrum analyzers, including those with Option 400

Página 91

2. High-Voltage Adjustment (SN 3001A and Below)4. Connect a jumper wire (insulated wire and two alligator clips)between the shaft of a small screwdriv

Página 92 - Distortion

2. High-Voltage Adjustment (SN 3004A and Above)2. High-VoltageAdjustment (SN3004A and Above)NoteNoteReferenceDescriptionWarningThis procedure is for I

Página 93 - Intermodulation 26

2. High-Voltage Adjustment (SN 3004A and Above)EquipmentHigh-VoltageAdjustment ProcedureWarningWarningDigital Voltmeter (DVM)...

Página 94 - Performance Tests 2-69

2. High-Voltage Adjustment (SN 3004A and Above)AlA HIGHVOLTAGEREGULATORAlA8DSlAlA7TP3AlA6R103Figure 3-13. Location of High Voltage Adjustments4. Set t

Página 95 - SEARCH]

2. High-Voltage Adjustment (SN 3004A and Above)11. Remove the protective cover from the AlA High-VoltageRegulator Assembly. A label should be visible

Página 96

2. High-Voltage Adjustment (SN 3004A and Above)CRT life expectancy, particularly if a new CRT has just beeninstalled.17. Readjust AlA6R103 HV ADJ for

Página 97 - [PEAK SEARCH)

2. High-Voltage Adjustment (SN 3004A and Above)Discharge ProcedureThe High-Voltage Adjustment procedure does not require the removalfor High Voltage a

Página 98

2. High-Voltage Adjustment (SN 3004A and Above)GroundingWireFigure 3-15. Discharging the CRT Post-Accelerator CableNoteA small bracket and screw secur

Página 99

3. PreliminaryDisplayAdjustments (SN3001A and Below)ReferenceNoteNoteDescriptionCautionEquipmentAlAl KeyboardAlA Z-Axis AmplifierAlA X-Deflection Ampl

Página 100 - Performance Tests 2-75

3. Preliminary Display Adjustments (SN 3001A and Below)ProcedureX and Y Deflection1. Connect a 10: 1 (10 MQ) divider probe to the oscilloscope’s chann

Página 101 - 2-76 Performance Tests

‘lhble l-l. Recommended Test Equipment (1 of 6)InstrumenlSIGNALSOURCESSynthesizedSweeperSynthesizedSignalGeneratorFrequencySynthesizerPulseGeneratorFu

Página 102 - Compression

3. Preliminary Display Adjustments (SN 3001A and Below)AlAAlAAtA/ A3A2Figure 3-17. Location of AlA2, AlA4, AlA5, and A3A2~ooooooooooooooorAlALR22IYTHf

Página 103 - 18. Gain Compression Test

3. Preliminary Display Adjustments (SN 3001A and Below)12. Set the oscilloscope controls as follows:Press(CHAN]:Channel 1...

Página 104

3. Preliminary Display Adjustments (SN 3001A and Below)the combined X deflection voltage applied to the CRT. Use theoscilloscope front-panel knob to a

Página 105

3. Preliminary Display Adjustments (SN 3001A and Below)OVERSHOOTOVERSHOOlFigure 3-2 1.Rise and Fall Times and Overshoot Adjustment Waveform19. Connect

Página 106 - Equipment

3. Preliminary Display Adjustments (SN 3001A and Below)NoteThe pulse/function generator output must be terminated with 50ohms. Use a BNC tee, a 509 te

Página 107

3. Preliminary Display Adjustments (SN 3001A and Below)32. Use the oscilloscope [@iGJ markers to measure the risetime,falltime, and percent overshoot

Página 108 - Performance Tests 2-83

3. PreliminaryDisplayAdjustments (SN3004A and Above)ReferenceNoteNoteDescriptionCautionEquipmentAlAl KeyboardAlA X, Y, Z Axis AmplifierAdjustment Proc

Página 109 - (CENTER FREQUENCY]

3. Preliminary Display Adjustments (SN 3004A and Above)ProcedureX and Y Deflection1. Connect a 10: 1 (10 Ma) divider probe to the oscilloscope’s chann

Página 110 - (~20 ms)

3. Preliminary Display Adjustments (SN 3004A and Above)A3A2A3AlFigure 3-24. Location of AlA and A3A2TP501R127 R120 Cl09 TP105 R227C204R220R217JSGNDc30

Página 111 - 2-86 Performance Tests

3. Preliminary Display Adjustments (SN 3004A and Above)12. Set the oscilloscope controls as follows:Press m):Channel 1 . . . . . . . . . . . . . . . .

Página 112 - Adjustment

Performance Tests andAdjustments ManualHP 8566B Spectrum AnalyzerF!aHEWLETTPACKARDHP Part No. 08566-90168Printed in USA September 1993

Página 113

‘able l-l. Recommended Test Equipment (2 of 6)InstrumentANALYZERSSpectrumAnalyzerActive ProbeProbe PowerSUPPIYHigh FrequencyActive ProbeCOUNTERSFreque

Página 114 - Performance Tests 2-89

3. Preliminary Display Adjustments (SN 3004A and Above)the combined X deflection voltage applied to the CRT. Use theoscilloscope front-panel knob to a

Página 115 - I&%X

19.20.Pulse Response of 21.Control Gate ZAmplifier to BLANKInput 22.23.Disconnect the oscilloscope channel 4 probe from the spectrumanalyzer. Connect

Página 116 - Performance Tests 2-91

3. Preliminary Display Adjustments (SN 3004A and Above)29. Set the oscilloscope controls as follows:Press(ZiZi):Channel 1 . . . . . . . . . . . . . .

Página 117 - 2-92 Performance Tests

4. Final Display Adjustments (SN 3001A and Below)4. Final DisplayAdjustments (SN3001A and Below)ReferenceDescriptionNoteProcedureNoteAlAl KeyboardAl A

Página 118 - FREQUENCY SPAN)

4. Final Display Adjustments (SN 3001A and Below)5. For best overall focusing of the display, adjust the followingpotentiometers in the sequence liste

Página 119

4. Final Display Adjustments (SN 3004A and Above)4. Final DisplayAdjustments (SN3004A and Above)ReferenceDescriptionEquipmentProcedureNoteAlAl Keyboar

Página 120 - Performance Tests 2-95

4. Final Display Adjustments (SN 3004A and Above)R120R220R512 R513R319R426 R437Figure 3-32. Location of Final Display Adjustments on AlA‘Ihble 3-6. In

Página 121 - (REFERENCE LEVEL) Frequency

4. Final Display Adjustments (SN 3004A and Above)NoteNote9.10.11.AlA2R517 ASTIGAlA2R513 3DAlA2R409 FOCUS COMPPress (o--2.5), (REFERENCE LEVEL] and t

Página 122 - [REFERENCE LEVEL]

4. Final Display Adjustments (SN 3004A and Above)17. Adjust AlA2R512 ORTHO and the front-panel ALIGN controlto optimize the orientation and appearance

Página 123 - 2.99 Performance Tests

5. Log Amplifier Adjustments5. Log AmplifierAdjustmentsReferenceRelated PerformanceTestsNoteDescriptionEquipmentIF-Display SectionA4A3 Log Amplifier-F

Página 124 - Performance Tests 2-99

‘Ihble l-l. Recommended Test Equipment (3 of 6)InstrumentMETERSDigitalVoltmeterDC High VoltageProbePower MeterPower SensorPower SensorDigitalPhotomete

Página 125 - Measured

5. Log Amplifier AdjustmentsProcedure1. Position the spectrum analyzer upright as shown in Figure 3-33.Remove the IF-Display section top cover.2. Set

Página 126 - Performance Tests 2-101

5. Log Amplifier AdjustmentsBandpass Filter6. Press LOG CENTER dB/DIv).Center Adjustment7. Set the frequency synthesizer for 7.6000 MHz at +5.0 dBm ou

Página 127 - Performance Tests

5. Log Amplifier Adjustments20. Adjust A4A2R61 ATTEN for DVM indication of + 1.000 fO.OOO1 Vdc. See Figure 3-34 for location of adjustment. If unable

Página 128 - (SWEEP TIME)

6. Video Processor Adjustments6. Video ProcessorAdjustmentsReferenceIF-Display SectionA4Al Video ProcessorRelated PerformanceTestLog Scale Switching U

Página 129 - ~ Min Measured~ Min Measured

6. Video Processor Adjustments6. Set step attenuator to 120 dB. DVM indication should be 0.0000f0.0005 V dc. If DVM indication is out of tolerance, ad

Página 130

6. Video Processor Adjustments22. Decrease reference level to -70 dBm using the step key.23. DVM indication should be +0.200 f0.002 V dc greater than

Página 131 - CENTER FREQUENCY]

7. 3 MHzBandwidth FilterAdjustmentsReferenceIF-Display SectionA4A7 3 MHz Bandwidth FilterRelated PerformanceResolution Bandwidth Switching Uncertainty

Página 132 - Performance Tests

EquipmentProcedureFrequency Zero CheckFilter Center andSymmetryAdjustmentsNote7. 3 MHz Bandwidth Filter Adjustments1O:l Divider Probe, 10 MW7.5 pF (2

Página 133 - Distortion

7. 3 MHz Bandwidth Filter AdjustmentsA4A73 MHz Bandwidth FilterA4A7Figure 3-38.Location of Center, Symmetry, and 10 Hz AmplitudeAdjustments9. Remove c

Página 134 - (CENTER FREQUENCY)

7. 3 MHz Bandwidth Filter AdjustmentsFilter Peak AdjustNoteThe adjustment ranges of A4A7C13 PK, A4A7C22 PK, A4A7C31PK, and A4A7C40 PK are all indirect

Página 135 - [CENTER FREQUENCY)

‘Ihble l-l. Recommended Test Equipment (4 of 6)Instrument1 dB StepAttenuator3 dBAttenuator30 dBAttenuatorI’ERMINATIONSkrminationrerminationFermination

Página 136

7. 3 MHz Bandwidth Filter AdjustmentsA4A73 MHz Bandwidth FilterFigure 3-39. Location of 3 MHz Peak Adjustments26. Move the oscilloscope channel 4 prob

Página 137 - 4. 1st LO OUTPUT Level + 5

7. 3 MHz Bandwidth Filter Adjustments10 Hz Amplitude37. Connect CAL OUTPUT to RF INPUT. Key in (-1, C-1 9,Adjustments@E--ET) 10 Hz.38. Adjust the spec

Página 138

8. 21.4 MHzBandwidth FilterAdjustmentsReferenceRelated PerformanceTestsDescriptionIF-Display SectionA4A4 Bandwidth FilterA4A8 Attenuator-Bandwidth Fil

Página 139 - Function Generator Frequency

EquipmentProcedure1.+ 10 V TemperatureCompensation SupplyCheckA4A4 LC Adjustments5.8. 21.4 MHz Bandwidth Filter AdjustmentsDigital Voltmeter (DVM) . .

Página 140

8. 21.4 MHz Bandwidth Filter Adjustments11.12.13.A4A4 XTAL 14.Adjustments15.16.17.18.19.20.21.Key in [RESBW) 100 kHz, C-SPAN) 200 kHz and MARKER(PEAK

Página 141 - Adjustments

8. 21.4 MHz Bandwidth Filter Adjustmentsfor satisfactory signal symmetry, increase or decrease value ofA4A4C66. Refer to ‘Iable 3-3 for range of value

Página 142 - 3-2 Adjustments

8. 21.4 MHz Bandwidth Filter Adjustments32. Adjust A4A8R35 LC to align markers on display. MARKER A levelshould indicate 1.00 X. See Figure 3-43 for l

Página 143 - Adjustments 3-3

8. 21.4 MHz Bandwidth Filter AdjustmentsA10 dB and A20 dB43. Connect CAL OUTPUT to RF INPUT through 1 dB and 10 dB stepAdjustmentsattenuators. Set ste

Página 144 - 3-4 Adjustments

8. 21.4 MHz Bandwidth Filter Adjustments57.58.59.60.61.62.63.64.65.66.67.68.69.70.71.Adjust A4A4C41 LC DIP for minimum amplitude of signalpeak. See Fi

Página 145 - Adjustments 3-5

9. 3 dB Bandwidth Adjustments9. 3 dB BandwidthAdjustmentsReferenceRelated PerformanceTestDescriptionEquipmentProcedure(For instruments with Option 462

Página 146 - 3-6 Adjustments

‘able l-l. Recommended Test Equipment (5 of 6)InstrumentAC Line-PowerSource(Rx- Option 400)PowerSplitterPlanar-dopedBarrier DiodeDetectorReactive Powe

Página 147 - Adjustments 3-7

9. 3 dB Bandwidth AdjustmentsA4A9IF CONTROLA4A9Figure 3-45. Location of 3 dB Bandwidth Adjustments9. On the spectrum analyzer, key in [FREQUENCY SPAN)

Página 148 - Adjustments

20.On the spectrum analyzer, key in the following settings:(CENTER FREQUENCY)...100 MHzFREQUENCY SPAN);&VT)...

Página 149

9. 3 dB Bandwidth Adjustments31.Adjust A4A9R65 10 kHz for a MARKER A indication of -3.00 dB&0.05 dB.32.On the spectrum analyzer, press QfJ several

Página 150

9. 3 dB Bandwidth AdjustmentsA4A7R100, A4A7R102, and A4A7R104. If it is necessary to increaseone of these 3-dB bandwidths, increase the value of one o

Página 151 - Adjusts 5.8 and 12.5

10. Step Gain and18.4 MHz LocalOscillatorAdjustmentsReferenceRelated PerformanceTestsDescriptionIF-Display SectionA4A7 3 MHz Bandwidth FilterA4A5 Step

Página 152 - 3-12 Adjustments

10. Step Gain and 18.4 MHz Local Oscillator AdjustmentsEquipmentDigital Voltmeter (DVM)...HP 3456APower Meter...

Página 153

10. Step Gain and 18.4 MHz Local Oscillator Adjustments14. Note MARKER amplitude in mV and adjust A4A5R33 CAL to70.7 mV (top CRT graticule line). See

Página 154 - 3-14 Adjustments

10. Step Gain and 18.4 MHz Local Oscillator AdjustmentsA4A5 STEP GAINR32R44 R54SGlOSGZO-1SGZO-2R70 R62A4A5Figure 3-48. Location of 10 dB Gain Step Adj

Página 155 - Adjustments 3-15

10. Step Gain and 18.4 MHz Local Oscillator Adjustments0.1 dB Gain Step34.Adjustment35.36.37.18.4 MHz Local38.Oscillator Adjustment 39.40.Key in LIN,

Página 156 - 3-16 Adjustments

10. Step Gain and 18.4 MHz Local Oscillator AdjustmentsNoteFactory-select component A4A7R60 affects the adjustment ofA4A6AlR29 WIDE GAIN. If the value

Página 157 - Adjustments 3-17

‘Ihble l-l. Recommended Test Equipment (6 of 6)Instrument Critical Specifications forRecommendedPerf.Adj,Equipment SubstitutionModelTestADAPTERSAdapte

Página 158 - 3-18 Adjustments

11. Down/UpConverterAdjustmentsReferenceIF-Display SectionA4A6 Down/Up ConverterRelated PerformanceTestResolution Bandwidth Switching Uncertainty Test

Página 159

11. Down/Up Converter AdjustmentsNoteThe adjustment of A4A6AlR29 WIDE GAIN is affected byfactory-select component A4A7R60, which sets the overall gai

Página 160

11. Down/Up Converter Adjustments21.4 MHz Gain18.4 MHz NullAdjustment9.10.11.12.13.14.15.16.17.18.19.20.21.22.~CENTER FREQUENCY) 21.4 MHz, CFREQUENCY

Página 161 - Adjustments 3-21

11. Down/Up Converter Adjustments23. Connect the tip of the active probe to A4A4TP7, and adjustA4A6AlC31 18.4 MHz NULL for minimum amplitudes of thedi

Página 162 - 3-22 Adjustments

12. 10 MHzStandardAdjustment (SN2637A and Below)ReferenceDescriptionEquipmentFrequency StandardProcedureNoteRF-Section:A22 10 MHz Frequency StandardA2

Página 163 - Adjustments 3-23

12. 10 MHz Standard Adjustment (SN 2637A and Below)message should typically appear on the spectrum analyzer display for10 minutes or less after line p

Página 164

12. 10 MHz Standard Adjustment (SN 2637A and Below)Frequency Counter should now display the difference betweenthe frequency of the INPUT A signal (A22

Página 165 - Reference

12. 10 MEtz Standard Adjustment (SN 2637A and Below)14. Remove the two adjustment cover screws from the A22 10 MHzFrequency Standard. Refer to Figure

Página 166 - Section

12. 10 MHzStandardAdjustment (SN2728A and Above)ReferenceRF-Section:A22 10 MHz Frequency StandardA22Al Frequency Standard RegulatorA22A2 10 MHz Quartz

Página 167 - Figure 3-3

12. 10 MHz Standard Adjustment (SN 2728A and Above)Replacement oscillators are factory-adjusted after a complete warmupand after the specified aging r

Página 168

kernG11223241516 37181926X218 x 218 x 2DescriptionIHP Fart NumberIExtenderBoard:20contacts,2rows of1085680-60028ExtenderBoard:12contacts,2rows of60850

Página 169

12. 10 MHz Standard Adjustment (SN 2728A and Above)4. Disconnect the short jumper cable on the RF Section rear panelfrom the FREQ REFERENCE INT connec

Página 170

10.11.12.13.12. 10 MHz Standard Adjustment (SN 2728A and Above)If the difference between reading #2 and reading #l is greaterthan 1 mHz, the A22 10 MH

Página 171

12. 10 MHZ Standard Adjustment (SN 2728A and Above)L.TOP VIEWFigure 3-55. Location of 10 MHz Standard Adjustments15. On the Frequency Counter, select

Página 172 - 3-32 Adjustments

13. Sweep, DAC, and Main Coil Driver Adjustments13. Sweep, DAC,and Main CoilDriverAdjustmentsReferenceRelated PerformanceTestsDescriptionNoteEquipment

Página 173 - Adjustments 3-33

13. Sweep, DAC, and Main Coil Driver AdjustmentsProcedure1. Position the spectrum analyzer on its right side as shown inFigure 3-56, with bottom cover

Página 174 - 3-34 Adjustments

13. Sweep, DAC, and Main Coil Driver AdjustmentsPress [j)connect dots . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Página 175 - ..6O.OOOOV

13. Sweep, DAC, and Main Coil Driver AdjustmentsAl6A19 SCANDAC GENERATORTOP VIEWA19 (85660-60212)Al6 (85660-60247)Figure 3-58. Location of Sweep and D

Página 176 - Components

13. Sweep, DAC, and Main Coil Driver Adjustmentsh, stopped12.00 V/divoffset: 3.500 v10.00 : I dci w ..-...; ..-... i -..._. . . . . . . ..i ..

Página 177 - Adjustments 3-37

13. Sweep, DAC, and Main Coil Driver AdjustmentsOffset and YTO DAC15. Perform this step only if the Al6 Scan Generator is P/NAdjustments85660-60134 or

Página 178 - Figure 3-10. Waveform at

13. Sweep, DAC, and Main Coil Driver Adjustments17. Perform this step only if the A19 Digital-to-Analog Converteris P/N 85660-60164 or 85660-60038. (H

Página 179

2Performance TkstsIntroductionVerifkation ofSpecificationsThe procedures in this section test the instrument’s electricalperformance using the Specif

Página 180

13. Sweep, DAC, and Main Coil Driver AdjustmentsYTO Main Coil Driver19.Adjustments(Preferred Procedure) 20.21.C.d.e.f.8.h.i..i.k.1.m.n.0.P.Key in @Z?X

Página 181

13. Sweep, DAC, and Main Coil Driver Adjustments22. Key in (2--22), [SHIFT) I-]), SWEEP C-J, m@i%EiF~, CFREQUENCY SPAN) 0 Hz, (CENTER FREQUENCY) 2.3 G

Página 182 - 3-42 Adjustments

13. Sweep, DAC, and Main Coil Driver Adjustments31.32.33.34.35.36.37.38.39.40.41.SPECTRLU ANALYZERFigure 3-63.YTO Main Coil Driver Adjustments Setup

Página 183 - Adjustments 3-43

42.43.44.Adjust A20R25 6.15 GHz to align nearest comb tooth with centerCRT graticule line.Key in (RECALL) 4.Adjust A20R34 2.3 GHz to align nearest com

Página 184 - 3-44 Adjustments

13. Sweep, DAC, and Main Coil Driver Adjustments59.Band Overlap 60.Adjustments61.62.63.64.65.66.67.68.69.70.71.72.Alternately press [PEAK SEARCH) and

Página 185 - Adjustments 3-45

13. Sweep, DAC, and Main Coil Driver Adjustments73. Use signal generator TUNING control to vary signal generatoroutput frequency flO0 MHz (from freque

Página 186 - 3-46 Adjustments

14. 100 MHz VCXOAdjustmentsReferenceRF-Section:A7A2 100 MHz VCXORelated PerformanceNoise Sidebands TestTestsResidual Responses TestDescriptionThe open

Página 187 - Adjustments 3-47

14. 100 MFIz VCXO Adjustmentsshort BNC jumper cable W15 is connected between 52 FREQREFERENCE EXT and 53 FREQ REFERENCE INT.3. Set the dc power supply

Página 188 - Adapters:

14. 100 MHz VCXO AdjustmentsNote\ ICENTER iD8.000 00 MHZSPAN 3.00 kHZRES BW 1 kHZ“BW 3 ktiZSWP 3Em msecFigure 3-66. Typical Tuning Range of A7A2 100 M

Página 189 - Adjustments 3-49

14. 100 MHz VCXO AdjustmentsTRACE A . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . CLEAR-WRITETRACE B . . . . . . . . . . .

Página 190 - ~ooooooooooooooor

‘Ihble 2-1. Performance Test Cross-ReferenceFunction or Characteristic Tested Test Performance TestNo.Center Frequency Readout1Center Frequency Readou

Página 191 - Adjustments 3-51

14. 100 MHz VCXO Adjustmentsoutput signal. Verify that the 100 MHz harmonics do not exceedthe levels listed in ‘Iable 3-8‘Ihble 3-8. Limits for 100 MH

Página 192 - 3-52 Adjustments

ResistorFIP Fart Number6.80683-068512.10757-037917.80757-029423.70698-343 131.60757-018038.30698-343546.4 0698-403751.10757-039461.90757-02761100757-0

Página 193 - Figure 3-2 1

15. M/N LoopAdjustmentsReferenceRF-Section:A7A4 M/N OutputDescriptionThe M/N VCO tuning range end points and output level are set andchecked to ensure

Página 194 - Figure 3-22

15. M/N Loop AdjustmentsA7A4AlZTPZ/A12TP3M/NLOCK INDICATOROUTPUTDISABLEAlAlClTPlFREO ADJTUNEIA7A4AlAlC5POWERA2J3AlA2WlFigure 3-68. Location of PLL Adj

Página 195 - Adjustments 3-55

15. M/N Loop Adjustments14.Adjust the AMPTD CAL control on the second spectrum analyzerfor a -10.00 dBm displayed signal, and then press (SHIFT)(FREQU

Página 196

16. YTO Loop Adjustments16. YTO LoopAdjustmentsReferenceRF-Section:Al lA5 SamplerAllA YTO Loop InterconnectRelated PerformanceTestsAverage Noise Level

Página 197 - more preset probe , select

16. YTO Loop AdjustmentsISPECTRW ANALYZERFigure 3-69. YTO Loop Adjustment SetupAZlTP2AllJlAllJ2AllAlAllJ3WllA12TP2A12TP3AllJ5AllJ4e. .e . -a-,AT2,&apo

Página 198 - 3-58 Adjustments

16. YTO Loop Adjustmentsmounting hole located on the chassis divider next, to the AlOAlPLLl VCO Assembly.Figure 3-71. All YTO Loop Service Position6.

Página 199

16. YTO Loop Adjustments13.14.15.16.17.18.19.20.REFERENCE LEVEL . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +5 dBmLOG SCALE .

Página 200 - 3-60 Adjustments

16. YTO Loop AdjustmentsST‘\RT 2Figure 3-72.Typical YTO Loop Swept Frequency Response at AllAl21. On the second spectrum analyzer, key in [PEAK SEARCH

Página 201 - position

Equipment RequiredEquipment required for the manual performance tests andadjustments is listed in ‘Ikble l-l, Recommended Test Equipment. Anyequipment

Página 202 - 45.00 v

16. YTO Loop AdjustmentsFrequency determined in step 25, and set the power meter CALFACTOR control accordingly. Connect the power sensor to theSMA fem

Página 203

16. YTO Loop Adjustments32. Set the oscilloscope controls as follows:Press (CHAN_):Channel 1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Página 204 - 3-64 Adjustments

16. YTO Loop Adjustmentshp runningj . .._...^_.._..._...~...~... ~__ _.._..._...~-

Página 205 - Adjustments 3-65

16. YTO Loop Adjustments41.All YTO Loop Frequency:MHzOn the synthesized sweeper, press Icw) and key in the M/N LoopFrequency from step 40.42.43.Press

Página 206 - 3-66 Adjustments

16. YTO Loop Adjustments48. On the second spectrum analyzer, key in (ENTER dB/DIv) 2 dB,(j-1 3 MHz, MARKER (jNORMALj, (PEAK SEARCH] to position amarke

Página 207 - Adjustments 3-67

16. YTO Loop AdjustmentsNoteIf the power level of the displayed fundamental below 20 MHz is toolow, decrease the value of factory-select component All

Página 208

17. 20/30 LoopPhase LockAdjustmentsReferenceRF-Section:A10 20/30 SynthesizerAlOAl PLLl VCOAlOA3 PLLl IFAlOA4 PLL3 Up ConverterAlOA5 PLL2 VCOA 1 OA8 P

Página 209 - 5. Log Amplifier Adjustments

17. 20/30 Loop Phase Lock AdjustmentsEquipmentSpectrum Analyzer...HP 8566BHigh-frequency Active Probe...

Página 210

17. 20/30 Loop Phase Lock Adjustments3. Set the frequency synthesizer for a 20 kHz, 0 dBm output.Connect the frequency synthesizer 50-ohm OUTPUT to Al

Página 211

17. 20/30 Loop Phase Lock AdjustmentsAlOAlAlOA3PLLl vcoPLLl IF\ n/TOP VIEWLl3 170MHzNULLL12 160MHzNULLLll 165MHzNULLC26*Al OA3TP3Place ActProbe herL7

Página 212

1. CenterFrequency ReadoutAccuracy ‘l&tRelated Adjustments10 MHz Standard AdjustmentSweep, DAC, and Main Coil Driver AdjustmentsSpecificationsFor

Página 213 - Adjustments 3-73

17. 20/30 Loop Phase Lock Adjustments20. Press CmGHz_ on the second spectrum analyzer. Set the controlsof the second spectrum analyzer as follows:CENT

Página 214 - Offset

29.Set the controls of the second spectrum anaiyzer as follows:CENTER FREQUENCY . . . . . . . . . . . . . . . . . . . . . . . . . 165 MHzFREQUENCY SPA

Página 215 - Adjustments 3-75

17. 20/30 Loop Phase Lock Adjustments42.43.44.45.On the second spectrum analyzer, press (CENTER FREQUENCY) 140MHz MARKER (PEAK SEARCH] to position a m

Página 216 - Related Performance

17. 20/30 Loop Phase Lock AdjustmentsPhase Lock Loop 2wJ4NoteIf PLL2 is phaselocked, proceed to step 12. If PLL2 will not phaselock(PL2 UNLOCK indicat

Página 217 - Bandwidth Filter Adjustments

17. 20/30 Loop Phase Lock AdjustmentsAlOA8 PLLZAlOA5 PLL2 VCODISCRIMINATOR\R2150MHzR4 1OOMHzITOP VIEWAlOA8AlOA5Figure 3-79. Location of PLL2 Adjustmen

Página 218 - 3-78 Adjustments

11.12.13.14.15.16.17.17. 20/30 Loop Phase Lock AdjustmentsSet the RF Section LINE switch to STANDBY. Disconnect thefrequency counter from AlOA5J4 SCAN

Página 219 - (REFERENCE LEVEL] -20

17. 20/30 Loop Phase Lock AdjustmentsPhase Lock Loop 31. Set the RF Section LINE switch to STANDBY. Remove AlOA4(P=92.3.4.PLL3 Up Converter Assembly f

Página 220 - (REFERENCE LEVEL] using step

17. 20130 Loop Phase Lock AdjustmentsNote.Adjustments AlOA4L16 160 MHz PEAK and AlOA4L17 160 MHzPEAK are sealed at the factory and normally do not re

Página 221 - Adjustments 3.91

17. 20/30 Loop Phase Lock Adjustments12. Set the controls of the second spectrum analyzer as follows:CENTER FREQUENCY...

Página 222

17. 20/30 Loop Phase Lock Adjustments19. Set the RF Section LINE switch to STANDBY. Disconnect the DVMfrom AlOA4TP3 and the second spectrum analyzer f

Página 223 - Adjustments 3-93

Notice.The information contained in this document is subject to changewithout notice.Hewlett-Packard makes no warranty of any kind with regard to this

Página 224

DescriptionEquipmentProcedure1. Center Frequency Readout Accuracy TestA synthesized signal source that is phase-locked to a known frequencystandard is

Página 225

18. RF ModulePhase LockAdjustmentsReferenceRF-Section:A6A9 Phase LockDescriptionThe 3.3 GHz Heterodyne Phase Lock Loop sampler circuits and 300MHz Tri

Página 226

18. RF Module Phase Lock AdjustmentsSPECTRUU ANALYZERDIGITIZINGSPECTRM ANALYZERFigure 3-81. RF Module Phase Lock Adjustments SetupA6A5%&3kI ESA6A9

Página 227

18. RF Module Phase Lock Adjustments6. Connect the DVM to A6A9AlE5, and connect the DVM ground tothe metal case/shield of the A6A9 Phase Lock Assembly

Página 228

12.100 MHz Tripler13.Adjustments14.15.16.17.18.19.20.18. RF’ Module Phase Lock AdjustmentsDisconnect cable 85 (gray/green) from A6A9J3 100 MHz INPUT,c

Página 229 - 9. 3 dB Bandwidth Adjustments

18. RF Module Phase Lock AdjustmentsSampler Output2 1. Use a BNC to SMB snap-on test cable to connect the oscilloscopeBalance AdjustmentChannel 1 inpu

Página 230

18. RF’ Module Phase Lock Adjustments25. Adjust A6A9AlR38 BALANCE for a dead time betweenconsecutive voltage ramps of 3.5 f 0.1 msec. Each voltage ra

Página 231

19. CAL OutputAdjustmentReferenceDescriptionEquipmentProcedure, RF-Section:A6A9 Phase LockRelated Performance Test:Calibrator Amplitude Accuracy TestA

Página 232 - Bandwidth Adjustments

19. CAL Output AdjustmentA6ASSEMBL I ESA6A9AlRllCOVER CAL ADJc29RllTRIPLER MATCH CAL OUTPUTRlOA6A9AlFigure 3-85. Location of CAL OUTPUT AdjustmentNote

Página 233

19. CAL Output AdjustmentCENTER 550 MHZSPAN 1 an GHZRES BW 3 MHZ“BW 3 MHZSWP 25.a msecFigure 3-86. CAL OUTPUT Harmonics10. On the second spectrum anal

Página 234 - Performance

20. Last Converter Adjustments20. Last ConverterAdjustmentsReferenceDescriptionEquipmentProcedureRF-Section:A6A3 Last ConverterA 321.4 MHz signal from

Página 235 - Adjustments 3-95

1. Center Frequency Readout Accuracy TestFigure 2-2. Center Frequency Accuracy MeasurementNoteThe spectrum analyzer CENTER FREQUENCY readout may fallo

Página 236 - 3-96 Adjustments

20. Last Converter AdjustmentsSPECTRW ANALYZERFigure 3-87. Last Converter Adjustments Setup4. Remove the RF Section right side cover (now on the left)

Página 237 - Gain Step Adjustments

20. Last Converter AdjustmentsNoteA6A3AlC2310.7 MHz NOTCHFILTER ADJUSTI LA6A3ilC12 A6A3A.lClOA6A3ilC8RIGHTASSE&L I ESA6A3SIDELASTCOVERCOVER CONVER

Página 238 - 3-99 Adjustments

20. Last Converter Adjustments15. Move the probe to the access hole above A6A3AlC8 (therightmost access hole). Adjust A6A3AlC9 (second access holefro

Página 239 - Adjustments 3-99

20. Last Converter AdjustmentsGenerator Assembly, and the A6A12 YTX Driver Assembly in theRF Section. Replace the cover on the A6 RF Module.29. Reconn

Página 240 - Converter

2 1. FrequencyResponseAdjustmentsReferenceRelated PerformanceTestDescriptionRF Section:A6A3 Last ConverterA6AlO Miscellaneous Bias/Relay DriverA6All S

Página 241

2 1. Frequency Response Adjustmentsinput mixer. In Band F (the external mixing bands), the output of anexternal harmonic mixer is connected to the fro

Página 242

2 1. Frequency Response AdjustmentsNoteProcedurePreliminaryAdjustmentsAdapters:Type N (f) to BNC (m) . . . . .Type N (f) to APC 3.5 (f) . .APC 3.5 (f)

Página 243 - Adjustments 3-103

2 1. Frequency Response AdjustmentsA12TP2,TP3LOCK INDICATORDISABLE/R84 GAINR48AlR51R2R69R54R7282ClC2DlR75R60A6All\R78 E2Rl IORQ VER12 VDR15 VCR18 VBR2

Página 244

2 1. Frequency Response Adjustmentsverify that the power meter indication is -10.00 dBm fO.10dB. If the 100 MHz CAL OUTPUT power level is not within t

Página 245

2 1. Frequency Response AdjustmentsNotef9 Vdc Reference Supplies adjustment A6A12R113 -9 V affectsYTX/YTO tracking, YTX diode bias, and Slope Generato

Página 246

1. Center Frequency Readout Accuracy Test‘lhble 2-2. Center Frequency Readout AccuracyIsynthesized (FREQUENCY SPAN] I [CENTER FREQUENCY]SweeperFrequen

Página 247 - Adjustments 3-107

2 1. Frequency Response Adjustments22. On the synthesized sweeper, press CPOWER LEVEL] and adjustthe ENTRY knob as necessary for a power meter indicat

Página 248

2 1. Frequency Response Adjustments32. On the spectrum analyzer, key in 1-1, (SHIFT] TRACE A@iXKKK] b. Set the spectrum analyzer controls as follows:S

Página 249 - to turn off the

2 1. Frequency Response Adjustmentsclockwise to increase the level of the displayed signal responsesabove 500 MHz.NoteIt might be helpful to increase

Página 250 - @ELECT/ENTER]

2 1. Frequency Response Adjustmentsset to internal leveling, which introduces minor leveling errors butpermits much faster sweep times.40. Repeat step

Página 251 - Adjustments 3-111

2 1. Frequency Response AdjustmentsBand B, 2.0 GHz to 5.846. On the spectrum analyzer, key in @?iTEiC), CFREQUENCY SPAN) 0GHzHz, (CENTER FREQUENCY) 4

Página 252 - 3-l 12 Adjustments

2 1. Frequency Response Adjustmentssweeper front panel LEVELING EXT INPUT using a BNC to SMBsnap-on test cable.POmR SENSORFigure 3-94.Frequency Respon

Página 253

21. Frequency Response Adjustmentssignal on the spectrum analyzer display. See Figure 3-90 for thelocations of A6A12R63 5.8 GHz and A6AlOR18 VB.NoteIf

Página 254

2 1. Frequency Response Adjustments70. Set the synthesized sweeper controls as follows:START FREQ . . . . . . . . . . . . . . . . . . . . . . . . . .

Página 255 - 3.500 v

2 1. Frequency Response Adjustments73. On the spectrum analyzer, key in [SWEEP TIME) 5s, LOG SCALE[ENTER dB/Divj 1 dB, TRACE B IVIEW), m 4, C-1 2s,TRA

Página 256 - TOP VIEW

81.82.83.84.85.86.87.88.2 1. Frequency Response AdjustmentsOn the spectrum analyzer, key in [=I 4, m IGHz) / anduse the DATA knob to gradually change

Página 257

2. Frequency SpanAccuracy ‘I&tRelated AdjustmentSweep, DAC, and Main Coil Driver AdjustmentsSpecificationFor spans In X 5 MHz, fl% of indicated fr

Página 258 - FREQUENCY SPAN) 260 MHz

2 1. Frequency Response Adjustmentsacceptable range of values for A6AlOR87, and Table 3-4 for HP partnumbers. See Figure 3-90 for the location of A6Al

Página 259

2 1. Frequency Response Adjustmentspeaks of these responses coarsely outline the spectrum analyzerfrequency response.I II IIII II IIIII I IIIII I I II

Página 260

2 1. Frequency Response Adjustments101.102.103.104.Readjust 22-turn (IF Offset) potentiometer A6A12R84 C asnecessary to maximize the overall level of

Página 261 - Adjustments 3-121

2 1. Frequency Response AdjustmentsSTART5PiIIIII5.80 GHZSTOP 1250GHZRES ew3M”Z“BW 3 MHZ SWP 150setFigure 3-98..cal Frequency Response (5.8 GFh - 12.5

Página 262 - Piocedure)

2 1. Frequency Response Adjustments3.40 dB. See the TRACE B reference waveform to indicate whichportions of the frequency response waveform require re

Página 263 - Adjustments 3-123

119.On the spectrum analyzer, key in LOG SCALE (ENTER dB/Div) 2dB, MARKER L@Z%Zj.120.Readjust 22-turn (IF Offset) potentiometer A6A12R83 D asnecessary

Página 264

2 1. Frequency Response Adjustments126.127.128.129.the high end of the band drop in amplitude by approximately0.75 dB.Readjust 22-turn (IF Offset) pot

Página 265 - PEAK)=

130.131.132.133.134.135.136.137.138.139.21. Frequency Response AdjustmentsOn the spectrum analyzer, key in (j-1 4, (HOLD) and repeatsteps 126 through

Página 266

2 1. Frequency Response AdjustmentsNoteIf A6AlO Miscellaneous Bias/Relay Driver Assembly is HP P/N85660-60322 (HP 85660AB RF Sections with serial num

Página 267 - VCXO Adjustments

2 1. Frequency Response AdjustmentsNoteSWEEP TIME...30 msSWEEP...

Página 268

2. Frequency Span Accuracy TestEquipmentFrequency Synthesizer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . HP 3335ASynthesi

Página 269 - 14. 100 MHz VCXO Adjustments

2 1. Frequency Response Adjustments153.154.155.156.157.158.159.160.161.162.163.marker. See Figure 3-90 for the locations of A6AlOR70 LB4and A6AlOR76 L

Página 270

21. Frequency Response Adjustments4.40 dB from 18.6 GHz to 20.0 GHz, and 6.00 dB from 20.0 GHzto 22.0 GHz. See the TRACE B reference waveform to indic

Página 271

2 1. Frequency Response AdjustmentsSTOP FREQ . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18.6 GHzRES BW . . . . . . . . . . .

Página 272

2 1. Frequency Response Adjustments177.If the Preselector DAC value difference recorded in step 176is greater than f0.5, remove the A6A12 YTX Driver A

Página 274

2 1. Frequency Response AdjustmentsLOG SCALE . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1 dB/DIV187. Press MARK

Página 275 - 16. YTO Loop Adjustments

22.Analog-To-DigitalConverterAdjustmentsReferenceA3A8 Analog-to-Digital ConverterDescriptionThe Analog-to-Digital Ramp Converter is adjusted at zero a

Página 276

22. Analog-To-Digital Converter Adjustmentsd. Connect the oscilloscope channel 1, 10: 1 probe to A3A8TPlland ground the probe ground to the A3 section

Página 277

22. Analog-To-Digital ConverterAdjustmentsA3A8ANALOG-TO-DIGITAL CONVERTER(Beneath Cover)Alternate Procedure 4.Procedure without using Low-Noise DC Sup

Página 278

23. Track and Hold Adjustments23. Track and HoldAdjustmentsReferenceA3A9 Track and HoldDescriptionThe CAL OUTPUT signal is connected to the RF INPUT.

Página 279 - Figure 3-72

2. Frequency Span Accuracy TestSPECTRUM ANALYZERSYNTHESIZED SWEEPERADAPTERPADFigure 2-4. Wide Span Test Setup10. Press ~NSTR PRESET) on HP 8340A Synth

Página 280

23. Track and Hold AdjustmentsA3A9TRACK AND HOLD(Beneath Cover)A3A9Figure 3-103. Location of Track and Hold Adjustments10. Key in [m) TRACE A (jj) b.1

Página 281 - ..-3OO.OOOmV

23. Track and Hold Adjustments25. Repeat steps 4 through 24 until no further adjustments arerequired.Adjustments 3-211

Página 282 - AllA5TPl

24. Digital StorageDisplayAdjustmentsReferenceDescriptionEquipmentProcedureA3A 1 TriggerA3A2 Intensity ControlA3A3 Line GeneratorFirst, preliminary CR

Página 283 - Figure 3-75

24. Digital Storage Display AdjustmentsPreliminary Graticule3. Press TRACE A @KiiKJAdjustments4. Adjust A3A3R4 X GAIN and A3A3R5 Y GAIN to place grati

Página 284 - (CLEAR-WRITE]

24. Digital Storage Display Adjustments11.12.Sample and Hold13.Balance Adjustments 14.15.16.17.18.Adjust A3A3R8 YSL so that the vertical graticule lin

Página 285

24. Digital Storage Display Adjustmentsi ..__...~~~... -.- _.._.._.__._...__. - ._._..._._ i ..~...-” .._...” .._...,,.,..,.

Página 286

24. Digital Storage Display AdjustmentsX and Y Offset and24.Gain Adjustments 25.26.27.28.29.30.31.32.33.34.35.36.37.38.39.40.Press (2-22].Key in (FREQ

Página 287 - Lock Loop

24. Digital Storage Display AdjustmentsFinal Graticule41. Press @??ZiZJ, TRACE A ~~~.Adjustments42. Set A3A2R12 LL THRESH fully clockwise.43. Adjust A

Página 288 - 3-148 Adjustments

Low-Noise DCSUPPlYThe Low-Noise DC Supply shown in Figure 3-108 can be constructedusing the parts listed in ‘Ihble 3-17.Figure 3-108. Low-Noise DC Sup

Página 289 - Adjustments 3-149

Crystal Filter Bypass Network ConfigurationCm&al FilterThe Crystal Filter Bypass Network Configuration shown inBypass NetworkConfigurationFigure 3

Página 290 - 3-150 Adjustments

2. Frequency Span Accuracy Test‘able 2-4. Wide Span AccuracySpectrum Analyzer Synthesized SweeperMARKER A FrequencyCENTER FREQUENCY I [FREQUENCYSPAN)

Página 291 - Loop Phase Lock Adjustments

4Option 462IntroductionThis chapter contains modified performance tests and adjustmentprocedures for Option 462 instruments. When working on Option462

Página 292 - 3-152 Adjustments

3. 6 dB ResolutionBandwidthAccuracy ‘I&tRelated AdjustmentSpecificationDescriptionEquipmentProcedure6 dB Bandwidth Adjustmentsf20%, 3 MHz bandwidt

Página 293

3. 6 dB Resolution Bandwidth Accuracy TestMKR a 3.103 MHZhPhP REF -9.0 dBmREF -9.0 dBmATTENATTEN 10 dB10dB0.00 dE0.00 dELINEARLINEARCENTER 100.00 MHzC

Página 294 - Figure 3-79. Location of

3. Impulse andResolutionBandwidthAccuracy T&tRelated AdjustmentSpecificationDescriptionSYNTHES I ZEALEVEL GENERATORImpulse Bandwidth Adjustmentsf2

Página 295

3. Impulse and Resolution Bandwidth Accuracy TestProcedure1. Set the frequency synthesizer for a 15 MHz, + 13 dBm output.Connect the output of the fre

Página 296

3. Impulse and Resolution Bandwidth Accuracy Test13.14.15.16.17.18.19.20.21.22.23.24.25.26.27.28.Press MARKER [PEAK SEARCH). Record the MARKER amplitu

Página 297 - (PEAK SEARCH) to

3. Impulse and Resolution Bandwidth Accuracy Test29. Set the frequency synthesizer (FREQUENCYI to 1 kHz. On thespectrum analyzer key in: @0.5 seconds,

Página 298 - Resistors

3. Impulse and Resolution Bandwidth Accuracy TestdB). ‘lb center the trace on screen, it may be necessary to pressSWEEP (ZGY) and adjust (CENTER FREQU

Página 299 - Adjustments 3-159

3. Impulse and Resolution Bandwidth Accuracy Test‘Ihble 4-2. Impulse Bandwidth AccuracyMarker Readouts for:1 Calculated Impulse Bandwidth-43 MHz (i)1

Página 300

4. 6 dB ResolutionBandwidthSelectivity TkstRelated AdjustmentsSpecificationDescriptionEquipmentNoteProcedure3 MHz Bandwidth Filter Adjustments21.4 MHz

Página 301

3. ResolutionBandwidthAccuracy ‘IkstRelated AdjustmentSpecificationDescriptionEquipmentProcedure(For instruments with Option 462, refer to Chapter 4.)

Página 302 - 3-162 Adjustments

4. 6 dB Resolution Bandwidth Selectivity Test7. Vary spectrum analyzer settings according to Table 4-4. PressSWEEP (SINGLE) and measure the 60 dB band

Página 303 - Tripler

4.6 dB ResolutionBandwidth Selectivity Testable 4-4. 6 dB Resolution BandwidthSelectivitySpectrum AnalyzerMeasured Measured BandwidthMaximumjZGiiF) [F

Página 304 - 3-l 64 Adjustments

4. Impulse and Resolution Bandwidth Selectivity Test4. Impulse andResolutionBandwidthSelectivity !kstRelated AdjustmentSpecificationDescriptionNoteEqu

Página 305 - Adjustments 3-165

4. Impulse and Resolution Bandwidth Selectivity Test4.5.6.7.8.9.MKR A 14.04 MHzf?PREF0.0 dBrnATTEN 10 dB-0.30 dB10 dB/CENTERSPAN 20.0 MHzIII100.0 MHZR

Página 306

4. Impulse and Resolution Bandwidth Selectivity Test‘Ihble 4-5. Impulse and Resolution Bandwidth SelectivityrSpectrum AnalyzerTResBW3 MHz (i)1 MHz (i)

Página 307 - 19. CAL Output Adjustment

5. Impulse andResolutionBandwidthSwitchingUncertainty TkstRelated AdjustmentSpecificationDescriptionEquipmentProcedure3 MHz Bandwidth Filter Adjustmen

Página 308

5. Impulse and Resolution Bandwidth Switching Uncertainty TestMKR ~3 0 Hzh!REF -8.0 dEmATTEN 10 dB0.00 dBII I III IIII ICENTERI InI I100.00 MHzRES q W

Página 309

Tkst 3. 6 dBResolutionBandwidthAccuracy ‘J&t (p/oSble 2-24,Performance TkstRecord)3 MHz1 MHz300 kHz100 kHz30 kHz10 kHz3 kHz1 kHz300 Hz100 Hz30 Hz1

Página 310 - 3-170 Adjustments

Test 3. Impulse and Resolution Bandwidth Accuracy Test (p/o ‘Ihble 2-24, Performance Test Record)T&t 3. Impulseand ResolutionBandwidthAccuracy Wst

Página 311

Test 3. Impulse and Resolution Bandwidth Accuracy Test (p/o ‘able 2-24, Performance Test Record)Steps 39 through 46. 6 dB Resolution BandwidthAccuracy

Página 312 - 310.7 MHz, [POWER LEVEL]

3. Resolution Bandwidth Accuracy TestiFigure 2-5. Resolution Bandwidth Measurement8. Vary spectrum analyzer settings according to ‘Ihble 2-5. PressSWE

Página 313 - Adjustments 3-173

Test 4. 6 dB Resolution Bandwidth Selectivity (p/o ‘Ihble 2-24, Performance Test Record)3 MHz1 MHz300 kHz100 kHz30 kHz10 kHz3 kHz1 kHz300 Hz100 Hz30 H

Página 314

Tkst 4. Impulseand ResolutionBandwidthSelectivity (p/oable 2-24,Performance T&tRecord)Steps 5 through 9. Impulse and Resolution BandwidthSelectivi

Página 315

Test 5. Impulse and Resolution Bandwidth Switching Uncertainty (p/o ‘Ihble 2-24, Performace Test Record)Tkst 5. Impulseand ResolutionBandwidthSwitchin

Página 316 - Preliminary

9. 6 dB ResolutionBandwidthAdjustmentsReferenceRelated PerformanceTestDescriptionEquipmentProcedureIF-Display SectionA4A9 IF Control6 dB Resolution Ba

Página 317 - Adjustments 3-177

9. 6 dB Resolution Bandwidth Adjustments13. Using the DATA knob, adjust the marker down one side of thedisplay signal to the 6 dB point; CRT MKR A ann

Página 318 - (POWER LEVEL) and adjust the

9. 6 dB Resolution Bandwidth Adjustments24. Press MARKER IOFF), then MARKER [nl.25. Using the DATA knob, adjust the marker down one side of thedisplay

Página 319 - Adjustments 3-179

9. Impulse Bandwidth Adjustments9. ImpulseBandwidthAdjustmentsReferenceRelated PerformanceTestDescriptionEquipmentProcedureIF-Display SectionA4A9 IF C

Página 320 - PEAK SEARCH)

9. Impulse Bandwidth Adjustments13. Using the DATA knob, adjust the marker down one side ofthe display signal to the 7.3 dB point; CRT MKR A annotatio

Página 321 - Adjustments 3-181

9. Impulse Bandwidth Adjustments[REFERENCE LEVEL_) and using the DATA knob to place the signalpeak near the top of the graticule.24. Press MARKER IOFF

Página 322 - 82 Adjustments

5Option 857IntroductionThis chapter contains the modified amplitude fidelity performancetest for Option 857 instruments. This chapter also contains th

Página 323 - HOLD] (turning it off)

4. ResolutionBandwidthSelectivity YLkstRelated AdjustmentsSpecificationDescriptionEquipmentNoteProcedure(For instruments with Option 462, refer to Cha

Página 324 - A6A12R85

8. Option 857Amplitude FidelityPerformance TkstRelated AdjustmentLog Amplifier AdjustmentsSpecification Log:Incrementalf0.1 dB/dB over 0 to 80 dB disp

Página 325 - LEVEL] and adjust the

8. Option 857 Amplitude Fidelity Performance TestEquipmentFrequency Synthesizer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . HP 3335A

Página 326 - 3-186 Adjustments

8. Option 857 Amplitude Fidelity Performance Test14. Key in the following analyzer settings:FREQUENCY SPAN) . . . . . . . . . . . . . . . . . . . . .

Página 327 - [CLEAR-WRITE)

8. Option 857 Amplitude Fidelity Performance Test‘lhble 5-2.Log Amplitude Fidelity (10 kHz RRW; Option 857)Frequency12Fidelity ErrorSynthesizerCalibra

Página 328 - 3-188 Adjustments

Performance TkstRecordHewlett-Packard CompanyModel HP 8566BSerial No.IF-Display SectionRF SectionTested byReport No.Date5-6 Option 857

Página 329 - Adjustments 3-189

Test 8. Option 857 Amplitude FidelityYkst 8. Option 857Amplitude FidelityStep9. Log Amplitude Fidelity (10 Hz RRW)Frequency12Fidelity ErrorCumulativeC

Página 330 - A6A12R84

Test 8. Option 857 Amplitude FidelityStep 26. Linear Amplitude FidelityFrequency MARKER ASynthesizer AmplitudeAmplitudeWIWm)0-10Allowable Range(f3% of

Página 331 - Adjustments 3-191

6Major Assembly and Component LocationsIF-Display SectionFigure IndexAssemblySee FigureAlAl. . . . . . . . . . . . . . . . . . . . . . . . . . . . . .

Página 332

W23...6-7W24...6-7W25...

Página 333

A23W5A24A23C4 A23C3FANA23Ul (+5V) A23Q4 W15(+2OV) A2303A23Q2A23QlA23C2/ (-4OV)A23’ MOTHERBOARD- A23W60\.--...--.-------\A6A13RF MODULEMOTHERBOARDA23W

Página 334 - A6A12R83

CertificationHewlett-Packard Company certifies that this product met itspublished specifications at the time of shipment from the factory.Hewlett-Pack

Página 335

4. Resolution Bandwidth Selectivity Test7. Vary spectrum analyzer settings according to Table 2-6. PressSWEEP [SINGLE) and measure the 60 dB bandwidth

Página 336

Figure 6-2. RF Section, Front ViewA5SWlSTANDBY/ONA6J5A6J4A6J2A6Jlld:“T O&T ::fPb? CAL OUTPUTA5A2RPGA23W7 A23W5A6RlAMPTD CALA6J3RF INPUTA5A 1KEYBOA

Página 337 - Adjustments 3-197

A23C 1(-IOV)A22Al7A23C2 A23C3 A23C4(-40V)(+20V) (+5V)A24TH;F?yGH Fd~Q#%CYSTANDARDM/N-REFEREN:;TRANSFORM;;RF MOD”?:Al 1/YToAl242\A1020 30r:SY THESIZERb

Página 338 - A6A12R82

Al AlOC2AlAlOC3AlAw7w21AlAAIAI 1W6w21AlAAIVIAlAAIAIOCIAlAlOC4AlA AlA AlAAlAFL1AITI.A4A 1A3A9A3A8A3A7A3A6A3A5A3A4A3A3A3A2‘A3AlII8IFigure 6-4. IF Sectio

Página 339

AIAIOCIAlAlOC4AlAlOC2AlAlOC3AlAAIVIAlAAlAAlAAlAFL1AITILL00000000000000Figure 6-5. IF Section, ‘Ibp View (SN 3004A and Above),A4A9,A4A8,A4A7,A4A6,A4A5,

Página 340

AIVIWiAlAl ti2W8Figure 6-6. IF Section, Front View6-8 Major Assembly and Component locations

Página 341 - Adjustments 3-201

A4AlOW8W8A3AlOAIAIOLIII\Jwi4W23W25Wi6W27Figure 6-7. IF Section, Bottom View/w29, W24‘W23‘W32(SN 3004Aand above)\AIVIMajor Assembly and Component locat

Página 342 - Preselector DAC Value

4. Resolution Bandwidth Selectivity Test‘Ihble 2-6. Resolution Bandwidth SelectivitySpectrum AnalyzerL-1 (FREQUENCY SPAN] (VIDEOJ3 MHz1 MHz300 kHz100

Página 343 - [SWEEP TIME)

5. Resolution Bandwidth Switching Uncertainty Test5. ResolutionBandwidthSwitchingUncertainty TLkstRelated AdjustmentsSpecificationDescriptionEquipment

Página 344

5. Resolution Bandwidth Switching Uncertainty TestFigure 2-7. Bandwidth Switching Uncertainty Measurementable 2-7. Bandwidth Switching UncertaintyRES)

Página 345 - (REFERENCE LEVEL)

6. Log Scale Switching Uncertainty Test6. Log ScaleSwitchingUncertainty TkstRelated AdjustmentSpecificationDescriptionEquipmentProcedureVideo Processo

Página 346 - Analog-To-Digital

6. Log Scale Switching Uncertainty TestMKR 100.001 0 Mr.rp REF -8.8d0mATTEN10aB-9.02 ah2 aw/II \,,ICENTER 100.000MHzSPAN 100 Is!42RES DW30 kHtVW100 kt

Página 347

7. IF Gain Uncertainty Test7. IF GainUncertainty TkstRelated AdjustmentsStep Gain and 18.4 MHz Local Oscillator Adjustments21.4 MHz Bandwidth Filter A

Página 348 - Alternate Procedure 4

7. IF Gain Uncertainty TestEquipmentProcedure10 dB Gain StepsNoteFrequency Synthesizer... . .HP 3335AAdapter, Type N (m

Página 349 - Procedure 1

7. IF Gain Uncertainty TestI’ 1IIII III ycENTE* 22.021 04 LHIPm 2.22 L”,PIES mu I Ill41PIES mu I Ill41van 100 Yevan 100 Yese soa -..ese soa -..eFigure

Página 350 - CCLEAR-WRITE]

7. IF Gain Uncertainty Test2 dB Gain Steps13. Press [2], ~jG?iTLT) (FJ.14. Set [REFERENCE LEVEL] to -1.9 dBm.15. Press MARKER (OFFS. Set (jVloEoj to 1

Página 351 - Adjustments 3-211

AssistanceProduct maintenance agreements and other customer omistanceagreemxmts are available for Hewlett-Rzckard products.Fbr any assistance, contact

Página 352

7. IF Gain Uncertainty Test‘lhble 2-11. IF Gain Uncertainty, 0.1 dR Steps(REFERENCE LEVEL’WW0.0-0.1-0.2-0.3-0.4-0.5-0.6-0.7-0.8-0.9-1.0-1.1-1.2-1.3-1.

Página 353 - Graticule

7. IF Gain Uncertainty Test23. Find the largest positive deviation and the largest negativedeviation for reference level settings from 0 dBm to -70 dB

Página 354 - 3-214 Adjustments

8. Amplitude Fidelity Test8. AmplitudeFidelity Test(For instruments with Option 857, refer to Chapter 5.)Related AdjustmentLog Amplifier AdjustmentsSp

Página 355 - 0.000 v

8. Amplitude Fidelity TestEquipmentFrequency Synthesizer ...HP 3335AAdapter, Type N (m) to BNC (f)...

Página 356 - [ENTER dB/DIv) 10

8. Amplitude Fidelity Test‘Ihble 2-12. Log Scale FidelityFrequency12Fidelity ErrorSynthesizer Calibrated MARKER A Amplitude (Column 2 - Column 1)Ampli

Página 357 - Adjustments 3-217

8. Amplitude Fidelity TestLinear Fidelity10. Key in analyzer settings as follows:(VIDEOj...,300 HzFREQUEN

Página 358 - Low-Noise

9. Calibrator Amplitude Accuracy Test9. CalibratorAmplitudeAccuracy TestRelated AdjustmentCAL OUTPUT AdjustmentSpecification-10 dBm f0.3 dB; 100 MHzDe

Página 359 - Adjustments 3-219

10. FrequencyResponse ‘IkstRelated AdjustmentsSpecificationsDescriptionFrequency Response Adjustments(Includes input attenuator flatness in the 10 dB

Página 360 - Introduction

10. Frequency Response TestFUNCTIONSPECTRUM ANALYZERGENERATORRFINPUT4ADAPTEROUTPUT V,p.p/Figure 2-14. Frequency Response Test Setup (100 Hz to 100 Id&

Página 361 - 4-2 Option 462

10. Frequency Response TestProcedure100Hzto 1OOkHz1. Connect CAL OUTPUT to the RF INPUT on the spectrum analyzer.2. Press C-J, (RECALL) @, MARKER (PEA

Página 362 - [FREQUENCY SPAN]

General SafetyConsiderationsWarningBefore this instrument is switched on, make sure it has beenproperly grounded through the protective conductor of t

Página 363

10. Frequency Response TestFigure 2-15.Frequency Response Measurement (1 kHz to 100 kHz)12. The closely spaced series of signal peaks on the display d

Página 364

10. Frequency Response Test18. Set [CF STEP SIZE) to 100 Hz. Step analyzer (CENTER FREQUENCY)from 100 Hz to 1 kHz with 0J and set function generatorFR

Página 365 - MHZ, SWEEP

10. Frequency Response Test26. Press START SINGLE 50 SEC SWEEP on the frequencysynthesizer. Wait for completion of the sweep.27. Activate MARKER [NORM

Página 366 - HZ. @WEEP TIME]

10. Frequency Response Test4MHzto60MHz28. Press t-1 on the spectrum analyzer. Set the spectrumanalyzer controls as follows:[CENTER FREQUENCY] ...

Página 367 - Figure 4-3. 6

10. Frequency Response Test\’ QADAPTERPDWER UETERBSENSORFigure 2-19.Frequency Response Test Setup (60 MHz to 2.5 GHz, 2 to 22 GEIz)60 MHz to 2.5 GHz36

Página 368 - Option 462 4-9

10. Frequency Response TestNotelb provide the spectrum analyzer with a 60 MHz to 22 GHz inputsignal of sufficient flatness for measuring frequency res

Página 369 - Option 462

10. Frequency Response Test48.49.50.2 to 22 GHz51.(Preselected Range)52.l~~a,“‘i -7.0, dBm , ATTiN ‘0 ,dS,0.a5 dBIIII IPOS PKSTART 60 MHzSTOP 2.50 GHz

Página 370 - Option462 4-11

10. Frequency Response Test53. On the synthesized sweeper, key in Icw) 3.0 GHz, CSTART FREQ) 2.0GHz, @7?FEZT) 3.9 GHz, [SWEEP TIME) 150 s, SWEEP [ml,S

Página 371 - (VIDEO]

10. Frequency Response Test67. On the synthesized sweeper, press [cwl and use the ENTRY knobto position the peak of the displayed TRACE A signal at th

Página 372 - VIDEO BW

10. Frequency Response TestLEVELING . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . INT78. On the synthesi

Página 373 - Bandwidth Measurement

How to Use ThisManualThis manual uses theFront-Panel Ker) This represents a key physically located on thefollowinginstrument.conventions:Screen TextTh

Página 374

10. Frequency Response Test‘Ihble 2-15. Frequency Response (Flatness)12346Frequent y Spectrum AnalyzerCdTrace LimitsRandandFrequent yFlatnessSynthesiz

Página 376 - Option 462 4-17

11. Sweep Time Accuracy TestProcedure1. Connect equipment as shown in Figure 2-21.2. Press [mj SWEEP C-1 on the analyzer.3. Key in the following setti

Página 377 - Readout of 3 dB Bandwidth

11. Sweep Time Accuracy Test‘Ihble 2-16.Sweep Time Accuracy, Sweep Times 120 msLSWEEP TIME]Sweep TimeMinMeasuredMax20ms 18 ms22 ms30ms27 ms33 ms50ms45

Página 378 - Option 462 4-19

12. Noise Sidebands Test12. NoiseSidebands ‘lkstRelated AdjustmentsSpecificationDescription100 MHz Voltage-Controlled Crystal Oscillator AdjustmentsSw

Página 379

12. Noise Sidebands TestSPECTRUM ANALYZER(SOURCE)ADAPTERADAPTERLCAUE AssElluvFigure 2-22. Noise Sidebands Test SetupEquipmentSpectrum Analyzer (1ST LO

Página 380 - [VIDEO]

12. Noise Sidebands Test5.Key in the following on the analyzer under test:(CENTER FREQUENCY]... 5.7 GHZ[FREQUENCY S

Página 381 - 4-22 Option 462

12. Noise Sidebands Test11. A correction factor of 2.5 dB must be added to the value12.13.14.15.16.17.18.19.20.21.22.23.24.25.26.measured in step 9 to

Página 382 - Option 462 4-23

13. Line-Related Sidebands Test13. Line-RelatedSidebands TestSpecificationIOffset from Carrier Center Frequency SidebandsI II<360HZ100Hz to 100 MHz

Página 383 - 4-24 Option 462

13. Line-Related Sidebands TestEquipmentSpectrum Analyzer (1ST LO OUTPUT) . . . . . . . . . . . . . . . . HP 8566A/BAC Power Source (Option 400 ONLY)

Página 384 - Option 462 4-25

Contents1. General InformationIntroduction...Instruments Covered by this Manual...Operation Verification...Option

Página 385 - 4-26 Option 462

13. Line-Related Sidebands Test9.10.11.12.13.14.15.Figure 2-25. Line-Related Sidebands MeasurementThe MARKER A amplitude for all line-related sideband

Página 386 - Bandwidth

13. Line-Related Sidebands Test16. Press CsHlFTl (SWEEP TIMEJ*, SWEEP (CONT), TRACE Af--).17. Change (CENTER FREQUENCY) of both the source and test an

Página 387 - 4-28 Option 462

13. Line-Related Sidebands Test12. Press MARKER [PEAK SEARCH), [al and position the marker at thepeaks of the line-related sidebands separated from th

Página 388

14. Average NoiseLevel TestRelated AdjustmentSpecificationDescriptionEquipmentProcedureLast Converter AdjustmentsDisplayed average noise level (0 dB i

Página 389

14. Average Noise Level Test8.9.10.11.Figure 2-26. Average Noise Level MeasurementRead the noise level from the MARKER amplitude readout.value should

Página 390

14. Average Noise Level Testlttble 2-18. Average Noise Level(CENTER FREQUENCY]2.0 MHz1.001 GHz2.499 GHz2.510 GHz5.799 GHz5.810 GHz12.499 GHz12.510 GHz

Página 391

15. Residual Responses Test15. ResidualResponses ‘IkstSpecificationDescriptionEquipmentProcedurec-100 dBm, 100 Hz to 5.8 GHzc-95 dBm, 5.8 GHz to 12.5

Página 392 - 5-4 Option 857

15. Residual Responses TestFigure 2-27. Residual Responses Measurement8. Look for any residual responses at or above the display line. If aresidual is

Página 393 - Fidelity

15. Residual Responses Test11. Follow the procedure of steps 7 through 9 to determine if thereare any residuals >-lo0 dBm in this frequency range.L

Página 394

15. Residual Responses Test20. Set the display line at -85 dBm.21. Check for residual responses x-85 dBm by using steps 7 through9.Largest Residual Le

Página 395 - A Amplitude (Column 2

Test 11. Sweep Time Accuracy...2-103Test 12. Noise Sidebands Test...2-104Test 13. Line-Related Sidebands...2-105Test 14. Aver

Página 396 - 5-R Option 857

16. Harmonic and Intermodulation Distortion Test16. Harmonic andIntermodulationDistortion TestSpecificationSecond Harmonic DistortionCenter Frequency

Página 397 - See Figure

16. Harmonic and Intermodulation Distortion TestSPECTRUM ANALYZERSYNTHESIZE0 WEEPERADAPTERLPF (PI0 WHZl------LPF 11200 MHZ)----_Figure 2-28. Harmonic

Página 398

Harmonic Distortion 1.2.3.4.5.6.7.8.9.10.11.12.16. Harmonic and Intermodulation Distortion TestSet the synthesized sweeper for an output CW frequency

Página 399 - Figure 6-1. RF Section

16. Harmonic and Intermodulation Distortion Test18.Press @ZZi%J on the analyzer. Key in the following:&ENTER FREQUENCY_)...

Página 400

SPECTRUM ANALYZER16. Harmonic and Intermodulation Distortion Test30. Set the other synthesized source RF OUTPUT switch to ON andadjust the output powe

Página 401

16. Harmonic and Intermodulation Distortion Test36. Wait for completion of the sweep, then press MARKER(PEAK SEARCH].Record the MKR A amplitude:dB.37.

Página 402 - View (SN 3001A and Below)

16. Harmonic and Intermodulation Distortion Test. - - ---------r2f1-1,‘If 2212-f,FREQUENCYFigure 2-30. Third Order Intermodulation Products41. Set one

Página 403 - View (SN 3004A and Above)

16. Harmonic and Intermodulation Distortion Test49. Press MARKER @. Activate [CENTER FREQUENCY) and press (JJonce to tune to the third order product a

Página 404

17. Image, Multiple, and Out of Rand Responses Test17. Image,Multiple, and Outof Band ResponsesTkstDescriptionImage and out-of-band responses are chec

Página 405

17. Image, Multiple, and Out of Rand Responses TestProcedure1. Connect equipment as shown in Figure 2-31 with the synthesizedsweeper RF OUTPUT connect

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