Agilent Technologies B1542A Manual do Utilizador Página 16

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Meeting the needs of advanced NBTI testing
16
100 µs timing-on-the-fly NBTI
using SMUs
The B1500A can also perform
timing-on-the-fly NBTI measure-
ment at the rate of 100 µs per
point using only SMUs. This NBTI
solution, which is provided as
part of the standard EasyEX-
PERT application tests, provides
unmatched measurement speed
and accuracy. It allows you to
obtain accurate NBTI data on
devices that do not require the
ultra-fast measurement capabili-
ties of the B1500A’s WGFMU
module
A 1
μμ
μμ
μs ultra-fast NBTI solution
Negative bias temperature insta-
bility (NBTI) testing is very
challenging, since the transistors
can recover within a few micro-
seconds after removal of the
stress condition. The WGFMU
enables ultra-fast NBTI measure-
ments starting within 1 µs after
stress removal. It can also
perform fast sweep measure-
ments, creating a 10-point IV
curve in 100 µs. The integrated
all-in-one architecture smoothly
transitions between stress and
measurement without any
glitches. This protects the DUT
from damage and ensures that
the measurement data taken is
accurate.
WGFMU supports both DC and
AC stress
Many NBTI studies show that the
measured threshold-voltage shift
depends strongly on the type of
applied stress. Variations in the
applied stress affect the magni-
tude of the threshold-voltage
degradation which, in turn, im-
pacts the device lifetime estimates.
Accordingly, accurate life-time
estimation requires the measure-
ment of not only DC stress but
also various types of AC stress.
Agilent’s SMU-based timing-on-the-fly NBTI solution maintains bias between
the stress and measure transitions to prevent device relaxation.
The WGFMU can perform complex DC/AC
stressing and transition between stress and
measurement without creating any glitches.
The WGFMU module can make
a 10 point IV sweep in 100 µs,
which captures Vth degradation
characteristics before the tran-
sistor can recover from the
applied stress.
Id
Id
Vg
IV Curve
Vg
Vd
Stress
IV Sweep
100
μμ
μμ
μs
Measure Id
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