Agilent Technologies B1542A Manual do Utilizador Página 12

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Voltage output from -40 V to +40 V (80 Vpp)
with two-level and three-level pulse capability
Feature Benefit
Highly accurate voltage forcing with
0.4 mV resolution
Two independent channels per module;
up to five modules can be installed in a B1500A
Arbitrary Linear Waveform Generation (ALWG)
Meets the needs of modern NAND flash memory test
Enables the creation of waveforms with accurate and
precise pulse levels to characterize multilevel cell (MLC)
structures and other advanced flash devices
Allows you to have up to ten independent, synchronized
pulse channels for NVM cell testing
Supports creation of customized waveforms with four or
more levels to characterize MLC structures and next-
generation flash devices using trapped-charge schemes.
Can also create small staircase pulses to prevent device
damage and to deactivate damage caused by stress during
the erase sequence of flash memory cells.
HV-SPGU provides a complete NVM cell testing solution
Fast and flexible non-volatile memory (NVM) cell evaluation
The B1500A’s high-voltage semiconductor pulse generator unit
(HV-SPGU) offers best-in-class pulse generation capability designed
to meet the NVM testing challenges posed by even the most advanced
semiconductor processes. The powerful features shown below enable
you to meet virtually any NVM cell testing need.
The B1500A’s HV-SPGUs can output three-level
waveforms at ±40V (80 V peak-to-peak), which
enables the characterization of advanced NAND
cell flash memory processes.
The B1500As GUI-based arbitrary linear waveform generation
utility makes it easy to create complex waveforms.
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