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WGFMU provides an all-in-one high-speed IV characterization solution
Powerful combination of DC/AC waveform generation and synchronized fast
measurement
The WGFMU is an innovative parametric module that integrates ALWG
capability with high-speed IV measurement. The ALWG function allows you
to generate not only DC, but also various types of AC waveforms (such as
pulses, staircase sweeps, and staircase pulsed sweeps) with 10 ns program-
mable resolution. In addition, the WGFMU also performs fast AC measure-
ment in synchronization with the applied waveforms. The combination of
these capabilities into a single, dual-channel module enables the character-
ization of complex high-speed phenomena without the need to switch
between different resources to do the DC/AC voltage forcing and the current
or voltage measurement. This makes the WGFMU a powerful solution for a
wide range of transient and time-domain phenomena.
WGFMU Features Benefits
Solves many complex test challenges without the need for
additional equipment and complicated external cabling.
A single module can do the job of a PGU and oscilloscope.
Much better measurement resolution than that
obtained using a PGU and oscilloscope.
High accuracy current measurement
(down to nanoamps) and 0.2% range
resolution without averaging
Fast and flexible DC/AC waveform generation
(ALWG) combined with accurate, high-speed
synchronized IV measurement in a single module
The remote-sense and switch units (RSUs)
that accompany each WGFMU channel
mount directly on the wafer prober
to minimize cabling and parasitic
effects and to maximize meas-
urement accuracy.
Simplified equivalent circuit
of one WGFMU channel
Arbitrary Linear
Waveform
Generator
V
V
A
Output
PG Mode
Fast IV Mode
50
Ω Ω
Ω Ω
Ω
One module meets most single-device testing needs. Multiple
devices can be tested in parallel, reducing the cost of test.
Pulsed IV, Fast NBTI, RTS noise and many other tests can be
done with the same module.
Versatile architecture supports
a wide range of applications
Up to five two-channel modules supported by the
B1500A (up to ten independent test channels)
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