Agilent Technologies EasyEXPERT Guia do Utilizador Página 265
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Agilent EasyEXPERT User’s Guide Vol. 1, Edition 1 4- 21
Function Details
C-V Sweep Measurement
Table 4-2 MFCMU Measurement Parameters
Primary Parameter Secondary Parameter
R (resistance, ) X (reactance, )
G (conductance, S) B (susceptance, S)
Z (impedance, ) (phase, radian)
Z (impedance, ) (phase, degree)
Y (admittance, S) (phase, radian)
Y (admittance, S) (phase, degree)
Cp (parallel capacitance, F) G (conductance, S)
Cp (parallel capacitance, F) D (dissipation factor)
Cp (parallel capacitance, F) Q (quality factor)
Cp (parallel capacitance, F) Rp (parallel resistance, )
Cs (series capacitance, F) Rs (series resistance, )
Cs (series capacitance, F) D (dissipation factor)
Cs (series capacitance, F) Q (quality factor)
Lp (parallel inductance, H) G (conductance, S)
Lp (parallel inductance, H) D (dissipation factor)
Lp (parallel inductance, H) Q (quality factor)
Lp (parallel inductance, H) Rp (parallel resistance, )
Ls (series inductance, H) Rs (series resistance, )
Ls (series inductance, H) D (dissipation factor)
Ls (series inductance, H) Q (quality factor)
- Agilent EasyEXPERT 1
- Manual Part Number 2
- Warranty 2
- Technology Licenses 2
- Restricted Rights Legend 2
- For B1500A Users 3
- For B1505A Users 3
- In This Manual 4
- Contents 10
- 1Main GUI 13
- Touch Screen Operation 14
- Start EasyEXPERT 16
- Workspace Configurator 17
- If there is one workspace 18
- Private workspace 22
- Main Screen 23
- Main Screen GUI 24
- Run Option 31
- Data Display Manager 32
- Data Display Properties 33
- Test Result Editor 35
- Test Results Data Filter 35
- Export in My Format 36
- Test Results Data Auto Export 38
- Automatic Data Record Output 39
- Test Results Data Properties 40
- Application Test 41
- Tracer Test 43
- Graph Setup Tool 49
- Option Tool 49
- Replay traces 51
- Select reference traces 52
- Select tracking traces 53
- Color and thickness 53
- Oscilloscope View 54
- Oscilloscope View Window GUI 55
- Sampling Setup 57
- Oscilloscope View monitors 58
- Arithmetic Operation Area 59
- Quick Test 60
- Repeat Measurement Setup 62
- Temp Condition= True? 64
- Thermo-trigger List 65
- Organize Preset Group 68
- Calibration 70
- SMU Zero Cancel 71
- CMU Calibration 72
- Configuration 76
- Switching Matrix 79
- SMU/PG Selector 81
- Module Selector 81
- Dual HCSMU Combination 83
- UHC Expander / Fixture 84
- HVSMU Current Expander 87
- UHV Expander 89
- SMU Output Setting Limits 90
- Event Log 90
- Extended Configuration 91
- Standby Channel Definition 95
- Data Display 96
- About Display Mode 97
- Updating Data Calculation 97
- Append Measurement 97
- Multi Display Function 97
- Data Display GUI 98
- EPSHPIJLIRUSQJIRUPDW 99
- &RS\WR&OLSERDUG 101
- 3DVWHWR:RUG3DG 101
- 3DVWHWR1RWHSDG 101
- Display Setup 107
- Graph Properties 108
- List Display Properties 109
- Tool Bar 109
- Data Status 112
- Setup Summary 113
- Miscellaneous Operations 114
- Keyboard 115
- Preview Window GUI 120
- Preview Settings 122
- Text File Export settings 123
- 2Classic Test Definition 127
- If You Use GNDU (Ground Unit) 129
- I/V Sweep 130
- Channel Setup 131
- Measurement Setup 132
- + Ratio VAR1 output 133
- Offset value 133
- Multi Channel I/V Sweep 135
- I/V List Sweep 139
- Grid button 144
- Define vector data 144
- Vector data entry field 144
- I/V-t Sampling 147
- C-V Sweep 152
- Direct Control 156
- Advanced Setup 160
- Primary Setup 161
- Command Setup 162
- ReadDataBuffer 163
- Function Setup 168
- Auto Analysis Setup 169
- Classic Test Definition 173
- SMU Range Setup Window 174
- Pulse Setup Window 177
- Advanced Setup Window 179
- Range Setup Window 181
- Switching Matrix Control 185
- SPGU Control 187
- SPGU Pulse Setup Window 189
- Load Z Setup Window 191
- Pulse Switch Setup Window 192
- SPGU ALWG Setup Window 193
- Define ALWG Waveform Window 194
- Waveform Pattern Editor 197
- 3 Application Test Definition 199
- Test Definition Window 201
- Test Specification 203
- 3ULPDU\(QWU\)LHOG 208
- Properties 210
- To Select Entry Fields 211
- To Move Entry Fields 211
- Test Output 212
- Analysis Parameter Definition 213
- Test Contents 214
- %UHDNSRLQW 219
- 3DXVHGSRLQW 219
- Variable Inspector 220
- External Variable Setup 221
- Local Variable Definition 222
- Program Component 224
- Auto Analysis 225
- Data Display Control 228
- Display Data Setup 229
- GPIB I/O 231
- Data Store Control 237
- Command Execution 238
- Using Command Execution 240
- Defining Format Field 243
- Setup Example 244
- 4 Function Details 245
- • “SMU CMU Unify Unit” 246
- I/V Sweep Measurement 247
- Output Range 248
- Basic Sweep Measurement 248
- Pulsed Sweep Measurement 253
- Function Details 255
- Figure 4-7 SMU Pulse 255
- Voltage or current 256
- I/V-t Sampling Measurement 257
- Time data and index 258
- Setup Parameters 259
- Time Data and Index 261
- Sampling Completion 262
- C-V Sweep Measurement 263
- Measurement Parameters 266
- Error Correction 269
- '87 270
- SPGU Module 271
- PG Operation Mode 272
- SPGU Pulse Setup Parameters 273
- Simultaneous output: 275
- Sequencial output: 275
- ALWG Operation Mode 279
- Sweep Abort Function 281
- Standby Function 282
- To Use Standby Function 284
- Bias Hold Function 285
- Current Offset Cancel 287
- SMU CMU Unify Unit 289
- Before using SCUU 290
- Atto Sense and Switch Unit 291
- To use 1 pA range 292
- Before using ASU 292
- Selector Output 295
- N1261A-002 297
- SMU Ranging Mode 299
- Auto Ranging 300
- Limited Auto Ranging 301
- Fixed Range 301
- Compliance Range 301
- Polarity and Output Area 303
- Power Compliance 304
- To Set Compliance 305
- To Set Pulse Output 306
- Pulse Setup Parameters 307
- SMU Measurement Time 309
- Overhead Time 311
- To Specify Source Output Time 311
- Wait Time 312
- Multiple Measurement Channels 313
- SMU Filter 314
- SMU Series Resistor 315
- Interlock Function 316
- Auto Power Off Function 317
- Initial Settings 318
- 5 Built-in Programming Tool 321
- Variables and Expressions 323
- Expressions 324
- Literals 325
- Built-in Functions 326
- Read-out Functions 326
- Functions for Cursor 337
- Functions for Line 337
- Script Program Statements 340
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