Agilent Technologies EasyEXPERT Guia do Utilizador Página 237
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Agilent EasyEXPERT User’s Guide Vol. 1, Edition 1 3- 39
Application Test Definition
Data Store Control
Data Store Control
This component enables or disables the test record of the application test or the
classic test used in the test definition.
Enable Creating Test Result Record
Checking this box enables the test record.
If you do not use this component, the test record is enabled.
This component cannot control the test record of the test definition. The test record
is always enabled for the test definition. For the test result output of the test
definition, see
“Test Output” on page 3-14.
- Agilent EasyEXPERT 1
- Manual Part Number 2
- Warranty 2
- Technology Licenses 2
- Restricted Rights Legend 2
- For B1500A Users 3
- For B1505A Users 3
- In This Manual 4
- Contents 10
- 1Main GUI 13
- Touch Screen Operation 14
- Start EasyEXPERT 16
- Workspace Configurator 17
- If there is one workspace 18
- Private workspace 22
- Main Screen 23
- Main Screen GUI 24
- Run Option 31
- Data Display Manager 32
- Data Display Properties 33
- Test Result Editor 35
- Test Results Data Filter 35
- Export in My Format 36
- Test Results Data Auto Export 38
- Automatic Data Record Output 39
- Test Results Data Properties 40
- Application Test 41
- Tracer Test 43
- Graph Setup Tool 49
- Option Tool 49
- Replay traces 51
- Select reference traces 52
- Select tracking traces 53
- Color and thickness 53
- Oscilloscope View 54
- Oscilloscope View Window GUI 55
- Sampling Setup 57
- Oscilloscope View monitors 58
- Arithmetic Operation Area 59
- Quick Test 60
- Repeat Measurement Setup 62
- Temp Condition= True? 64
- Thermo-trigger List 65
- Organize Preset Group 68
- Calibration 70
- SMU Zero Cancel 71
- CMU Calibration 72
- Configuration 76
- Switching Matrix 79
- SMU/PG Selector 81
- Module Selector 81
- Dual HCSMU Combination 83
- UHC Expander / Fixture 84
- HVSMU Current Expander 87
- UHV Expander 89
- SMU Output Setting Limits 90
- Event Log 90
- Extended Configuration 91
- Standby Channel Definition 95
- Data Display 96
- About Display Mode 97
- Updating Data Calculation 97
- Append Measurement 97
- Multi Display Function 97
- Data Display GUI 98
- EPSHPIJLIRUSQJIRUPDW 99
- &RS\WR&OLSERDUG 101
- 3DVWHWR:RUG3DG 101
- 3DVWHWR1RWHSDG 101
- Display Setup 107
- Graph Properties 108
- List Display Properties 109
- Tool Bar 109
- Data Status 112
- Setup Summary 113
- Miscellaneous Operations 114
- Keyboard 115
- Preview Window GUI 120
- Preview Settings 122
- Text File Export settings 123
- 2Classic Test Definition 127
- If You Use GNDU (Ground Unit) 129
- I/V Sweep 130
- Channel Setup 131
- Measurement Setup 132
- + Ratio VAR1 output 133
- Offset value 133
- Multi Channel I/V Sweep 135
- I/V List Sweep 139
- Grid button 144
- Define vector data 144
- Vector data entry field 144
- I/V-t Sampling 147
- C-V Sweep 152
- Direct Control 156
- Advanced Setup 160
- Primary Setup 161
- Command Setup 162
- ReadDataBuffer 163
- Function Setup 168
- Auto Analysis Setup 169
- Classic Test Definition 173
- SMU Range Setup Window 174
- Pulse Setup Window 177
- Advanced Setup Window 179
- Range Setup Window 181
- Switching Matrix Control 185
- SPGU Control 187
- SPGU Pulse Setup Window 189
- Load Z Setup Window 191
- Pulse Switch Setup Window 192
- SPGU ALWG Setup Window 193
- Define ALWG Waveform Window 194
- Waveform Pattern Editor 197
- 3 Application Test Definition 199
- Test Definition Window 201
- Test Specification 203
- 3ULPDU\(QWU\)LHOG 208
- Properties 210
- To Select Entry Fields 211
- To Move Entry Fields 211
- Test Output 212
- Analysis Parameter Definition 213
- Test Contents 214
- %UHDNSRLQW 219
- 3DXVHGSRLQW 219
- Variable Inspector 220
- External Variable Setup 221
- Local Variable Definition 222
- Program Component 224
- Auto Analysis 225
- Data Display Control 228
- Display Data Setup 229
- GPIB I/O 231
- Data Store Control 237
- Command Execution 238
- Using Command Execution 240
- Defining Format Field 243
- Setup Example 244
- 4 Function Details 245
- • “SMU CMU Unify Unit” 246
- I/V Sweep Measurement 247
- Output Range 248
- Basic Sweep Measurement 248
- Pulsed Sweep Measurement 253
- Function Details 255
- Figure 4-7 SMU Pulse 255
- Voltage or current 256
- I/V-t Sampling Measurement 257
- Time data and index 258
- Setup Parameters 259
- Time Data and Index 261
- Sampling Completion 262
- C-V Sweep Measurement 263
- Measurement Parameters 266
- Error Correction 269
- '87 270
- SPGU Module 271
- PG Operation Mode 272
- SPGU Pulse Setup Parameters 273
- Simultaneous output: 275
- Sequencial output: 275
- ALWG Operation Mode 279
- Sweep Abort Function 281
- Standby Function 282
- To Use Standby Function 284
- Bias Hold Function 285
- Current Offset Cancel 287
- SMU CMU Unify Unit 289
- Before using SCUU 290
- Atto Sense and Switch Unit 291
- To use 1 pA range 292
- Before using ASU 292
- Selector Output 295
- N1261A-002 297
- SMU Ranging Mode 299
- Auto Ranging 300
- Limited Auto Ranging 301
- Fixed Range 301
- Compliance Range 301
- Polarity and Output Area 303
- Power Compliance 304
- To Set Compliance 305
- To Set Pulse Output 306
- Pulse Setup Parameters 307
- SMU Measurement Time 309
- Overhead Time 311
- To Specify Source Output Time 311
- Wait Time 312
- Multiple Measurement Channels 313
- SMU Filter 314
- SMU Series Resistor 315
- Interlock Function 316
- Auto Power Off Function 317
- Initial Settings 318
- 5 Built-in Programming Tool 321
- Variables and Expressions 323
- Expressions 324
- Literals 325
- Built-in Functions 326
- Read-out Functions 326
- Functions for Cursor 337
- Functions for Line 337
- Script Program Statements 340
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