
While ideal balanced components
only respond to or produce dif-
ferential (out-of-phase) signals,
real-world devices also respond
to or produce common-mode
(in- phase) signals. Agilent’s
balanced-measurement test
systems perform a series of
single-ended stimulus/response
measurements on all measure-
ment paths of the device under
test, and then calculate and
display differential mode,
common-mode, and mode
conversion S-parameters.
Devices such as differential
filters and amplifiers, baluns,
and balanced transmission lines
that were once difficult to meas-
ure using conventional two-port
measuring systems, can now be
completely and accurately tested
with Agilent’s balanced measure-
ment solutions. With one set of
connections you can test either
single-ended or linear balanced
devices across the full RF and
microwave frequency range.
RF and microwave
design solutions
Common features:
• Full four-port vector error
correction
• Solid state switching for fast,
repeatable, and reliable switching
between measurement paths
• Displays conventional single-
ended and mixed-mode
S-parameters
• Capable of re-normalization of
test data for non 50 ohm devices
• Optional time-domain
transforms provide additional
insights
• Powerful Windows
®
based
software
1
controls system,
applies four-port error correction,
and calculates parameters
• Eliminates the use of test
baluns for complete, accurate
characterization
N4444A RF Balanced
2
Measurement System
• Featuring a PNA Series
network analyzer with
N4416A S-parameter test set
• Fully specified performance
up to 6 GHz
• Optional four-port Ecal module
makes calibration fast and easy
N4446A Microwave Balanced
Measurement System
• Featuring the 8720ES VNA with
N4418A S-parameter test set
• Fully specified performance
from 50 MHz to 20 GHz
Additional literature:
• Product Overview, 5988-2186EN
Contact your local Agilent Field Engineer for high
speed production testing of balanced devices.
4
1 Requires external PC with GPIB card.
2 Solutions based on the 8753ES family are also available. See test sets by family section for more information.
Balanced device test solutions
N4444A
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