polarization dependency. The
Agilent 86140B Optical Spectrum
Analyzer provides spectral
characteristics such as free
spectral range, channel band-
width, and isolation/crosstalk.
The Agilent 86120C Multi-
Wavelength Meter is used to
make extremely accurate
channel wavelength and chan-
nel spacing measurements.
The switch configuration pro-
vides for an 8 x 8 or multiple
1 x 8 test device configurations.
Products aimed at new tele-
communications systems require
extensive testing to industry
standards such as ITU-TS
(formerly CCITT) G.957 for
the Synchronous Digital Hier-
archy, and other standards for
SONET and ATM. Increasingly,
the performance of products
for these markets must be well
documented and supplied with
the product. Manufacturers
continue to strive to use testing
as one tool to improve process
performance and yields. Poten-
tial suppliers are carefully
evaluated to insure that their
products and components will
meet overall system performance
requirements. Environmental
tests are frequently necessary
to be certain that designs are
robust compared to the operat-
ing conditions that must be met.
Figure 12 shows a system for
performing extensive parametric
measurements, such as those
required for SDH and SONET,
on multiple transmitters. The
system provides for testing the
spectral characteristics with
the Agilent 86140B Optical Spec-
trum Analyzer. The system
performs eye-diagram measure-
ments using the Agilent 86100B
Digital Communications Analyzer
(DCA). The Agilent 8504B
Precision Reflectometer is
calibrated to remove the path
length to the transmitters, and
provides detailed measurement
of the different sources of
reflection in the transmitter.
The Agilent 71612C Bit Error
Rate Tester, together with the
Agilent 83446A Lightwave Clock/
Data Receiver, is used to mon-
itor bit error rate performance.
The system can be expanded
to construct a transceiver test
system. Additional channels
would be needed on the right
hand switch. Microwave switch-
ing can be added in front of
the Agilent 71612C BERT to
sequentially measure the bit
error rate performance of the
receivers.
Figure 12. Automated transmitter test system
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