Agilent Technologies 86062C Manual do Utilizador descarregar pdf (Página 6)

6

A well-implemented automat-

ed test system can help reduce

manufacturing costs. A wide

range of measurements can be

performed and recorded much

more rapidly, eliminating the

need to manually reset oper-

ating conditions. Automated

systems can be implemented

to reduce the necessary oper-

ator skill level and amount of

training required. They can

also reduce the time spent

recording, recovering, and

publishing test results.

Qualification testing can be

very expensive, with the addi-

tional cost of operating an

environmental chamber on

top of tying up lots of test

equipment for long periods to

test multiple devices. Figure 10

shows an automated environ-

mental test system using two

86060C Lightwave Switches

and an 8153 Lightwave Multi-

meter with the 81554SM Dual

Laser Source module and the

81532A Power Sensor module.

Multiple devices are connect-

ed for the test (for example,

isolators, patchcords, or atten-

uators). Insertion loss is mea-

sured versus temperature.

Reference channels are used

for system calibration and to

compensate for system drift.

This system could be expand-

ed to test return loss versus

temperature with the addition

of a coupler and a reflectance

standard. This test system can

also be set up using a single

86062C switch with two layers.

8153

LW Multimeter

with Dual Source

and Power Sensor

86060C

Lightwave

Switch

Environmental Test

Environmental Chamber

DUTs

Reference Channels

86060C

Lightwave

Switch

86140B Optical

Spectrum Analyzer

86120C

Multi-Wavelength Meter

1 x 12

Layer

2 x 48

Layer

Reference

8 Channel

WDM DUT #1

8 Channel

WDM DUT #2

8 Channel

WDM DUT #3

8 Channel

WDM DUT #5

8164A

Tunable Laser Source

83438A Opt. 009

Erbium ASE Source

11896A

Polarization Controller

1 x 2

Layer

86062C

3 Layer Switch

Increasing measurement

throughput by greatly reducing

time per test, a single auto-

mated test system can do the

work of several manual stations,

thereby reducing both cost

per test and the total capital

investment required for the

test.

Multi-port device testing can

complicate manufacturing

test. Flexible lightwave switch

configurations provide a ver-

satile building block for test

systems design. Figure 11 shows

an eight channel WDM/router

test setup which uses a multi-

layered 86062C switch with

three switching modules. The

Agilent 11896A Polarization

Controller allows the devices

under test to be tested for

amplitude and wavelength

Applications

Figure 10. Insertion loss as a function of temperature

Figure 11. Eight channel WDM/router test setup

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