Agilent Technologies E6640A EXM Manual do Utilizador Página 5

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Multi-format device test
GSM, W-CDMA, cdma2000
®
, TD-
SCDMA, LTE TDD/FDD, LTE-A
Bluetooth
®
, WLAN, GNSS (GPS)
MIMO, Carrier Aggregation
High-performance requirements
Higher modulation schemes: 256QAM
Wider bandwidths: 160 MHz
Lower residual EVM floor < 42 dBm
Speed test, increase throughput
Parallel device test techniques
Faster ramp from NPI to high-volume
High first-pass yield rate
Market trends
Multi-antenna multi-radio devices
Wireless devices with increasing
number of formats and bands
Universal access to cellular/WLAN
High-definition media sharing,
streaming, cloud
Higher data throughput, wider BW
LTE-Advanced carrier aggregation
Increasing device demand growth
Cellular devices expected to hit 24 billion
by 2020*
400M+ incremental WLAN devices each
year**
Test challenges
Cellular & WiCon Device Manufacturing
Market trends & test challenges
5
Data source: *GSMA, ** IHS
Agilent Restricted
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