Agilent Technologies E5500 Series Especificações

Agilent PN E5500-1Pulsed Carrier Phase NoiseMeasurements Using Agilent E5500 Series SolutionsProduct Note

105. Set up the phase noise measurement system.a) From the Define menu, choose Measurement;then define the measurement per the parame-ter data provid

11b) When the connect diagram is displayed, checkhardware and connections.1) Connect scope to monitor port of 70420Atest set.2) Set scope to monitor w

12Table 2-3. Parameter Data for CW Residual Noise Floor MeasurementStep Parameters Data1 Type and Range TabMeasurement Type Residual Phase Noise (with

13Example 2: Pulsed carrier noise floor using an Agilent 83732B as the stimulus source1. Connect the components as shown in Figure 2-9.The amplifier

145. Set up the phase noise measurement system.a) From the Define menu, choose Measurement;then define the measurement per the parame-ter data provid

15b) When the connect diagram is displayed, checkhardware and connections.1) Connect scope to monitor port of 70420Atest set.2) Set scope to monitor w

16Figures 2-11 and 2-12 show pulsed residual phasenoise measurements where the PRF is 20 kHz andthe duty cycle is 10 percent, but different low-passfi

17Table 2-4. Parameter Data for Pulsed Carrier Residual Noise Floor MeasurementStep Parameters Data1 Type and Range TabMeasurement Type Residual Phase

18Example 3: Residual measurement of an Agilent 8347Aamplifier In this configuration, the phase detector constantwill be measured with the DUT configu

196. Set up the phase noise measurement system.a) From the Define menu, choose Measurement;then define the measurement per the parame-ter data provid

342232Table of Contents1. Introduction 2. Making residual (two-port) measurements on pulsed carriersResidual measurement considerationsHardware config

20b) When the connect diagram is displayed, check hardware and connections.1) Connect scope to monitor port of 70420Atest set.2) Set scope to monitor

21Table 2-5. Parameter Data for Pulsed Carrier Amplifier Residual MeasurementStep Parameters Data1 Type and Range TabMeasurement Type Residual Phase N

22This chapter presents the recommended proce-dures and hardware configurations for makingabsolute phase noise measurements on pulsed carriers. For a

23Minimum duty cycle The duty cycle of the pulsed carrier has a directimpact on the system noise floor. This is seen as a scaled degradation of the no

24Hardware configurationThe recommended hardware configuration for making pulsed absolute measurements will provide a synchronized pulsed carrier sign

254. Set up 8663A reference source. Since the zero-beatprocess must be manually instigated, the referencesource must be operated in a manual mode onl

26If the Out-of-Lock warning message appears,verify that the voltage within the RF pulse “ON”portion is zero volts (observed on the scope). Ifphase-lo

27Table 3-3. Parameter Data for Pulsed Carrier Absolute Phase Noise MeasurementStep Parameters Data1 Type and Range TabMeasurement Type Absolute Phase

28Using a microwave downconverterFor carrier frequencies in the microwave range, the Agilent 70421A, 70422A, and 70427A microwavedownconverters are av

295. Set up the phase noise measurement system.a) From the Define menu, choose Measurement;then define the measurement per the parame-ter data provid

3The sensitivity and usefulness of many wireless RF and microwave systems is limited by the phasenoise characteristics of their system. In pulsedradar

305) Zero-beat sources to reduce beat note to <5 percent of PTR (2 Hz).(This is often accomplished in a non-pulsedcondition since it is very diffic

Table 3-4. Parameter Data for Pulsed Carrier Absolute Phase Noise Measurement with a DownconverterStep Parameters Data1 Type and Range TabMeasurement

32This chapter includes the recommended hardwareconfigurations and step-by-step measurement pro-cedures for making AM noise measurements onpulsed carr

33Table 4-1. Selecting an Internal Low-Pass Filter for AM Noise MeasurementsPRF LNA Low-Pass Filter≥40 kHz 20 kHz≥400 kHz 200 kHz≥4 MHz 2 MHz≥40 MHz 2

346. Start New Measurement. a) Select New Measurement from the Measurepulldown menu.b) At the connect diagram, check hardware andconnect the signal pa

35Table 4-2. Parameter Data for Pulsed Carrier AM Noise Measurement with Option 001 Test SetStep Parameters Data1 Type and Range TabMeasurement Type A

Agilent Technologies’ Test and Measurement Support, Services, and AssistanceAgilent Technologies aims to maximize the value you receive,while minimizi

4This chapter presents the recommended proce-dures and hardware configurations for makingresidual or two-port phase noise measurements on pulsed carri

5Source AM noise suppression For absolute phase noise measurements, AM noise contributions to the baseband signal (afterthe phase detector) are typica

6The operator can place the LNA in a “fixed” gainconfiguration and select the amount of gain to use (14 dB to 56 dB of gain in 14-dB steps), or theope

7Minimum duty cycle The duty cycle of the pulsed carrier has a directimpact on the system noise floor. This is seen as a scaled degradation of the noi

8Hardware configurationThe recommended method for making pulsedresidual measurements is to synchronously pulseboth paths to the phase detector. Using

9Step-by-step procedureThe following step-by-step procedure can be usedwhen making pulsed residual measurements withany Agilent E5500 series phase noi